US5404037A
Expired / Lapsed
US
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EEPROM cell with the drain diffusion region self-aligned to the tunnel oxide region
Assignee: National Semiconductor Corp
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Filing: 1994-03-17
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Granted: 1995-04-04
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Expires: 2014-03-17
Abstract
Abstract A method of semiconductor fabrication, in which a single aperture is used to define both a thin oxide tunneling region and a drain diffusion region in a self-aligned fashion, produces a device structure suitable for use in an electrically-erasableread-only memory (EEPROM) cell. A gate oxide is grown, then a photoresist mask is formed having a slit for ion implantation into the drain diffusion region. The oxide within the slit is etched away, and ion implantation forms a drain diffusion region. After the mask is stripped away, a healing furnace cycle removes the implant damage. A thin tunnel oxide layer is grown over the drain diffusion region, and then a polysilicon floating gate is formed so that one edge of this gate intersects a portion of the area of tunnel oxidation so as to form a small region of tunnel oxide under the floating gate. The process sequence then reverts to a conventional MOS flow. The self-aligned drain diffusion region and tunnel oxide region can be used in a variety of EEPROM cell designs. One embodiment involves a double-polysilicon, single-metal process in which three diffusion regions are used to form the EEPROM cell. The second layer of polysilicon overlies the floating gate and forms a control gate word line. The control gate and the floating gate overly the channel between the drain diffusion region and a common source diffusion region. The first layer of polysilicon is also used to form a select gate overlying the channel between the drain diffusion region and a select drain diffusion region. The metal layer provides contact to the select drain diffusion region and forms the bit line.
Inventors
- 👤 Martin H. Manley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 06:04
CPC Classifications
H; H10; H10B; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/683
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
215 words
A drain structure that includes a N+ drain diffusion region formed in a semiconductor substrate of P-type conductivity and an electrically conductive floating gate for use in an electrically-erasable programmable read-only memory (EEPROM) cell, the drain diffusion region being self-aligned to a tunnel dielectric region, the drain structure comprising: (a) a layer of gate dielectric material formed on the substrate over a portion of the drain diffusion region and a substrate channel region between the drain diffusion region and a N+ source diffusion region formed in the substrate; (b) a layer of tunnel dielectric material formed adjacent to the layer of gate dielectric and over a portion of the drain diffusion region such that the thickness of the tunnel dielectric material is less than the thickness of the gate dielectric material, the layer of tunnel dielectric material surrounded by the layer of gate dielectric material on three sides; and (c) a layer of conductive material formed over the layer of tunnel dielectric material and an adjacent portion of the gate dielectric material, the layer of conductive material forming the floating gate of the EEPROM cell, and wherein lateral edges of the drain diffusion region terminate in the substrate not only under the floating gate of the EEPROM cell, but also under the gate dielectric material.
Claim 2
Dependent Claim
215 words
A drain structure that includes a N+ drain diffusion region formed in a semiconductor substrate of P-type conductivity and an electrically conductive floating gate for use in an electrically-erasable programmable read-only memory (EEPROM) cell, the drain diffusion region being self-aligned to a tunnel dielectric region, the drain structure comprising: (a) a layer of gate dielectric material formed on the substrate over a portion of the drain diffusion region and a substrate channel region between the drain diffusion region and a N+ source diffusion region formed in the substrate; (b) a layer of tunnel dielectric material formed adjacent to the layer of gate dielectric and over a portion of the drain diffusion region such that the thickness of the tunnel dielectric material is less than the thickness of the gate dielectric material, the layer of tunnel dielectric material surrounded by the layer of gate dielectric material on three sides; and (c) a layer of conductive material formed over the layer of tunnel dielectric material and an adjacent portion of the gate dielectric material, the layer of conductive material forming the floating gate of the EEPROM cell, and wherein lateral edges of the drain diffusion region terminate in the substrate not only under the floating gate of the EEPROM cell, but also under the gate dielectric material.
Claim 3
Dependent Claim
20 words
A drain structure as in claim 1 wherein the gate dielectric material and the tunnel dielectric material comprise silicon dioxide.
Claim 4
Dependent Claim
14 words
A drain structure as in claim 2 wherein the conductive material comprises poly silicon.
Claim 5
Dependent Claim
19 words
A drain structure as in claim 3 wherein the drain diffusion region is doped with either Arsenic or Phosphorus.
Claim 6
Dependent Claim
342 words
An electrically-erasable programmable read-only memory (EEPROM) cell fabricated in a P-type substrate, the EEPROM cell comprising: a N+ drain diffusion region formed in the substrate; a common N+ source diffusion region formed in the substrate, the drain diffusion region and the source diffusion defining a first substrate channel region therebetween; a select N+ drain diffusion region formed in the substrate, the drain diffusion region and the select N+ drain diffusion region defining a second substrate channel region therebetween; a layer of gate oxide formed on the substrate, the layer of gate oxide including: a first gate oxide region overlying a first portion of the drain diffusion region and the first substrate channel region, and a second gate oxide region overlying the second substrate channel region; a layer of tunnel oxide formed adjacent to the first gate oxide region and over a second portion of the drain diffusion region such that the thickness of the layer of tunnel oxide is less than the thickness of the layer of gate oxide, the layer of tunnel oxide and the second gate oxide region defining a third portion of the drain diffusion region therebetween; a layer of first polysilicon including: a first polysilicon region overlying the first gate oxide region and the layer of tunnel oxide so that only the first portion of the drain diffusion region and the second portion of the drain diffusion region are covered by the first polysilicon region, the first polysilicon region forming the floating gate of the EEPROM cell, and a second polysilicon region overlying the second gate oxide region; a layer of intermediate dielectric material overlying the floating gate; a layer of second polysilicon overlying the layer of intermediate dielectric material; a layer of insulating material overlying all layers previously described, having a contact window opening above a portion of the third portion of the drain diffusion region; and a layer of conductive material overlying a portion of said layer of insulating material, which occupies the contact window opening, and which forms a select line for the EEPROM cell.
Claim 7
Dependent Claim
342 words
An electrically-erasable programmable read-only memory (EEPROM) cell fabricated in a P-type substrate, the EEPROM cell comprising: a N+ drain diffusion region formed in the substrate; a common N+ source diffusion region formed in the substrate, the drain diffusion region and the source diffusion defining a first substrate channel region therebetween; a select N+ drain diffusion region formed in the substrate, the drain diffusion region and the select N+ drain diffusion region defining a second substrate channel region therebetween; a layer of gate oxide formed on the substrate, the layer of gate oxide including: a first gate oxide region overlying a first portion of the drain diffusion region and the first substrate channel region, and a second gate oxide region overlying the second substrate channel region; a layer of tunnel oxide formed adjacent to the first gate oxide region and over a second portion of the drain diffusion region such that the thickness of the layer of tunnel oxide is less than the thickness of the layer of gate oxide, the layer of tunnel oxide and the second gate oxide region defining a third portion of the drain diffusion region therebetween; a layer of first polysilicon including: a first polysilicon region overlying the first gate oxide region and the layer of tunnel oxide so that only the first portion of the drain diffusion region and the second portion of the drain diffusion region are covered by the first polysilicon region, the first polysilicon region forming the floating gate of the EEPROM cell, and a second polysilicon region overlying the second gate oxide region; a layer of intermediate dielectric material overlying the floating gate; a layer of second polysilicon overlying the layer of intermediate dielectric material; a layer of insulating material overlying all layers previously described, having a contact window opening above a portion of the third portion of the drain diffusion region; and a layer of conductive material overlying a portion of said layer of insulating material, which occupies the contact window opening, and which forms a select line for the EEPROM cell.
Claim 8
Dependent Claim
15 words
An EEPROM cell as in claim 5 wherein the intermediate dielectric material comprises oxide/nitride/oxide composite.
Claim 9
Dependent Claim
14 words
An EEPROM cell as in claim 6 wherein the insulating material comprises silicon dioxide.
Claim 10
Dependent Claim
14 words
An EEPROM cell as in claim 7 wherein the third conductive material comprises aluminum.
References Cited (Backward Citations)
JPS6437877A
Cited
US5273923A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-04-03 | 1998-10-03 | 1999-04-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-04-03 | 2002-10-03 | 2003-04-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-04-03 | 2006-10-03 | 2007-04-04 | $7700.00 | Window Closed / Lapsed |