Semiconductor memory device including additional memory cell block having irregular memory cell arrangement

Claim 2

A semiconductor memory device, comprising: at least one first memory cell block having a plurality of column selection lines with a first number of bit lines connected to each column selection line; at least one second memory cell block having a plurality of column selection lines with a second number of bit lines, different from said first number of bit lines, connected to each column selection line; a first column decoder for selecting any of said plurality of column selection lines of said first memory cell block; a second column decoder for selecting any of said plurality of column selection lines of said second memory cell block; a redundant column for remedying any defective column of said first and second memory cell blocks; and means for detecting designation of a column decoder address of said defective column and substituting said redundant column for the defective column; wherein said first memory cell block and said second memory cell block share the same column decoder address.

Claim 3

A semiconductor memory device according to claim 1, wherein the relation between column selection lines and bit line pairs in each memory cell block is defined such that said first memory cell block and said second memory cell block share the same column decoder address.

Claim 4

A dynamic random access memory, comprising: at least one memory cell block for normal data having a first memory cell arrangement constituted by a plurality of rows and a plurality of columns, each column having a first plurality of bit line pairs, and including a plurality of column selection lines each provided corresponding to respective ones of said plurality of columns; at least one memory cell block for parity bits having a second memory cell arrangement constituted by a plurality of rows and columns, each column having a second plurality of bit line pairs, different from said first plurality of bit line pairs, and including a plurality of column selection lines each provided corresponding to respective ones of said plurality of columns; at least one column decoder of a first type for selecting any of said plurality of column selection lines of said at least one memory cell block for normal data; at least one column decoder of a second type for selecting any of said plurality of column selection lines of said at least one memory cell block for parity bits; at least one redundant memory cell block including a redundant column for remedying a defective column in said at least one memory cell bock for normal data or said at least one memory cell block for parity bits; and a redundant column decoder for detecting designation of a column address decoder of said defective column and substituting said redundant column for said defective column; wherein said column decoder of the first type and said column decoder of the second type share the same column decoder address.

Claim 5

A dynamic random access memory, comprising: at least one memory cell block for normal data having a first memory cell arrangement constituted by a plurality of rows and a plurality of columns, each column having a first plurality of bit line pairs, and including a plurality of column selection lines each provided corresponding to respective ones of said plurality of columns; at least one memory cell block for parity bits having a second memory cell arrangement constituted by a plurality of rows and columns, each column having a second plurality of bit line pairs, different from said first plurality of bit line pairs, and including a plurality of column selection lines each provided corresponding to respective ones of said plurality of columns; at least one column decoder of a first type for selecting any of said plurality of column selection lines of said at least one memory cell block for normal data; at least one column decoder of a second type for selecting any of said plurality of column selection lines of said at least one memory cell block for parity bits; at least one redundant memory cell block including a redundant column for remedying a defective column in said at least one memory cell bock for normal data or said at least one memory cell block for parity bits; and a redundant column decoder for detecting designation of a column address decoder of said defective column and substituting said redundant column for said defective column; wherein said column decoder of the first type and said column decoder of the second type share the same column decoder address.

Claim 6

A dynamic random access memory according to claim 3, wherein the connective relation between the bit line pairs and the column selection lines is defined in each memory cell block such that the number of said columns of aid memory cell block for normal data and the number of said columns of said memory cell bock for parity bits are equal to each other.

Claim 7

A dynamic random access memory according to claim 4, wherein said plurality of column selection lines and said column decoder of the first type are provided commonly to the plurality of said memory cell blocks for normal data arranged in the column direction, one said memory cell block for parity bits and said column decoder of the second type are provided corresponding to said plurality of memory cell blocks for normal data, said one memory cell block for parity bits has a plurality of said bits line pairs for each small block formed by dividing said memory cell block for parity bits corresponding to said plurality of memory cell block for normal data, and the connective relation between the bit line pairs and the column selection lines in each memory cell block is defined based on the relation between the number of bit line pairs in said each memory cell block for normal data and the number of bit line pairs per small block of said memory cell block for parity bits.