Contactor with elastomer encapsulated probes

Claim 2

An electrical probe contactor for making a plurality of electrical connections to contact pads on a device to be tested in which an array of individual probes is moved against a corresponding array of contact pads on the device and the probes are allowed to buckle transversely to the longitudinal axis of the probes in order to accommodate locational differences in the pads, comprising, in combination: an array of generally parallel, electrically conductive, probe wires disposed in a pattern corresponding to the pattern of the contact pads to be electrically engaged, each coupling wire having a first end and a second end; an elastic probe material disposed in a housing and encapsulating said probe wires to form an integrated elastic system so as axial force is applied to the ends of the probe wires, the force causes each wire to buckle with a plurality of transverse deflections and thereby induce other adjacent probe wires to buckle with a set of similar transverse deflections so that all probe wires bend and buckle in identical, parallel congruent wave forms, wherein said ends of the probe wires extending outwardly from top to bottom of the elastic coupling material for passing through plate means.

Claim 3

The probe contactor of claim 1 wherein said housing surrounds at least some portions of the encapsulated probes wires so as to restrain said elastic coupling material in those portions.

Claim 4

The probe contactor of claim 1 including guide plate means with holes therein through which said probe wires extend, the pattern of holes corresponding to the pattern of the contact pads.

Claim 5

The probe contactor of claim 2 including guide plate means mounted on said housing, said probe wires passing through holes in said guide plate means.

Claim 6

The probe contactor of claim 1 in which said coupling material comprises a castable dielectric elastomer.

Claim 7

The contactor of claim 5 in which said elastomer is formulated to be stiff enough to induce multiple inflections in the probe wires.

Claim 8

The contactor of claim 4 in which said coupling material comprises a castable dielectric elastomer.

Claim 9

The contactor of claim 7 in which said elastomer is stiff so as to generate a desired plurality of bends along the length of the probe wires.

Claim 10

The probe contactor of claim 7 in which the housing has an opening to eliminate restraint on the elastomer and induce deflection of the probe wires toward said opening.

Claim 11

The probe contactor of claim 7 in which additional volumes of elastomer are incorporated within said housing to induce buckling of said probe wires toward said volumes.

Claim 12

The probe contactor of claim 7 with voids in the elastomer to encourage bending of the probe wires toward said voids.

Claim 13

The probe contactor of claim 7 including inserts within said housing, said inserts being harder than said elastomer so as to decrease compressibility at selected locations and induce deflections of said probe wires away from said selected locations.

Claim 14

The probe contactor of claim 1 in which the ends of the probe wires extend past the top and bottom surfaces of the contactor.

Claim 15

An electrical probe contactor for making a plurality of electrical connections to contact pads on a device to be tested in which an array of individual probes is moved against a corresponding array of pads on the device and allowed to buckle transversely to the probes in order to accommodate locational differences in the pads, comprising, in combination: an array of generally parallel, electrically conductive, probe wires disposed in a pattern corresponding to the pattern of the contact pads to be electrically engaged; a hollow housing surrounding and enclosing the sides of said array Of probe wires; perforated plates attached to the top and bottom of said housing, with ends of said probe wires passing through the holes in the perforated plates so as to align with the contact pads; and an elastic, electrically insulating, castable elastomer compound disposed in said housing and surrounding said probe wires so as to form a composite elastic system in which the probe wires buckle only in matching, parallel, congruent wave forms, wherein said ends of the probe wires extend outwardly from top and bottom of the elastic, castable elastomer compound.

Claim 16

An electrical probe contactor for making a plurality of electrical connections to contact pads on a device to be tested in which an array of individual probes is moved against a corresponding array of pads on the device and allowed to buckle transversely to the probes in order to accommodate locational differences in the pads, comprising, in combination: an array of generally parallel, electrically conductive, probe wires disposed in a pattern corresponding to the pattern of the contact pads to be electrically engaged; a hollow housing surrounding and enclosing the sides of said array Of probe wires; perforated plates attached to the top and bottom of said housing, with ends of said probe wires passing through the holes in the perforated plates so as to align with the contact pads; and an elastic, electrically insulating, castable elastomer compound disposed in said housing and surrounding said probe wires so as to form a composite elastic system in which the probe wires buckle only in matching, parallel, congruent wave forms, wherein said ends of the probe wires extend outwardly from top and bottom of the elastic, castable elastomer compound.

Claim 17

The contactor of claim 14 in which said elastomer compound comprises a silicone compound.

Claim 18

The contactor of claim 14 in which the elastomer compound is a urethane compound.

Claim 19

An electrical probe contactor for making a plurality of electrical connections to contact pads on a device to be tested in which an array of individual probes is moved against a corresponding array of contact pads on the device and allowed to buckle transversely to the longitudinal axis of the probes in order to accommodate locational differences in the pads, comprising, in combination: an array of generally parallel, electrically conductive, probe wires disposed in a pattern corresponding to the pattern of the contact pads to be electrically engaged; an elastic coupling material disposed in a housing and encapsulating said probe wires so as to transmit forces caused by transverse deflections of the probe wires to other probe wires and thereby induce other probe wires to buckle with a set of similar multiple transverse deflections so as to maintain separation between the probe wires, wherein ends of the probe wires extending outwardly from top and bottom of the elastic coupling material; said housing surrounding at least some portions of the encapsulated probes wire ends so as to restrain said elastic coupling material in those portions; and guide plate means mounted on said housing, said probe wires passing through holes in said guide plate means.

Claim 20

An electrical probe contactor for making a plurality of electrical connections to contact pads on a device to be tested in which an array of individual probes is moved against a corresponding array of contact pads on the device and allowed to buckle transversely to the longitudinal axis of the probes in order to accommodate locational differences in the pads, comprising, in combination: an array of generally parallel, electrically conductive, probe wires disposed in a pattern corresponding to the pattern of the contact pads to be electrically engaged; an elastic coupling material disposed in a housing and encapsulating said probe wires so as to transmit forces caused by transverse deflections of the probe wires to other probe wires and thereby induce other probe wires to buckle with a set of similar multiple transverse deflections so as to maintain separation between the probe wires, wherein ends of the probe wires extending outwardly from top and bottom of the elastic coupling material; said housing surrounding at least some portions of the encapsulated probes wire ends so as to restrain said elastic coupling material in those portions; and guide plate means mounted on said housing, said probe wires passing through holes in said guide plate means.

Claim 21

The probe contactor of claim 17 in which said coupling material comprises a castable dielectric elastomer.

Claim 22

The contactor of claim 18 in which said elastomer is formulated to be stiff enough to induce multiple inflections in the probe wires.