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US5380567A Expired / Lapsed US ⏱️ 0.0 years remaining

Hermetic coatings by heating hydrogen silsesquinoxane resin in an inert atmosphere

Assignee: Dow Silicones Corp
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Filing: 1993-06-15
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Granted: 1995-01-10
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Expires: 2013-06-15
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Abstract

Abstract The present invention relates to a method of forming a coating on a substrate in the absence of oxygen. The method comprises coating the substrate with a solution comprising a solvent and hydrogen silsesquioxane resin. The solvent is evaporated and a preceramic coating thereby deposited on the substrate. The preceramic coating is then heated to a temperature of between about 500° up to about 1000° C. under an inert gas atmosphere. The process of the invention is useful for forming protective coatings on any substrate prone to oxidation. The present invention also relates to the formation of additional coatings on the coating formed above.

Inventors

  • 👤 Loren A. Haluska

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 22:22
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/40; H10W74/43; C; C09; C09D; C09D183/00; C09D183/04; H10W74/01

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 66 words
A method of forming a coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; and (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere.
Claim 2
Independent Claim 66 words
A method of forming a coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; and (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere.
Claim 3
Dependent Claim 19 words
The method of claim 1 wherein the inert gas is selected from the group consisting of argon and helium.
Claim 4
Dependent Claim 24 words
The method of claim 2 wherein the electronic device contains metals subject to oxidation when exposed to elevated temperatures in an atmosphere containing oxygen.
Claim 5
Dependent Claim 11 words
The method of claim 4 wherein the electronic device contains copper.
Claim 6
Dependent Claim 34 words
The method of claim 1 wherein the coating technique used to deposit the solution onto the electronic device is selected from the group consisting of spray coating, dip coating, flow coating and spin coating.
Claim 7
Independent Claim 149 words
A method of forming a dual layer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; and (D) applying a passivating coating over the first coating, the passivating coating applied by means of (i) coating the electronic device having the first coating with a second solution comprising a solvent and a preceramic polymer, (ii) evaporating said solvent to thereby deposit a preceramic coating; and (iii) heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, whereby a dual layer coating is obtained on the electronic device.
Claim 8
Independent Claim 149 words
A method of forming a dual layer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; and (D) applying a passivating coating over the first coating, the passivating coating applied by means of (i) coating the electronic device having the first coating with a second solution comprising a solvent and a preceramic polymer, (ii) evaporating said solvent to thereby deposit a preceramic coating; and (iii) heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, whereby a dual layer coating is obtained on the electronic device.
Claim 9
Dependent Claim 29 words
The method of claim 6 wherein the preceramic polymer in the second solution is selected from the group consisting of polycarbosilanes, polysilazanes, organopolysilanes, silsesquiazanes, carbon substituted polysilazanes, and polysilacyclobutasilazanes.
Claim 10
Independent Claim 520 words
A method of forming a dual layer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; and (D) applying a silicon containing passivating coating over the first coating, said passivating coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the first coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a dual layer coating is obtained on the substrate.
Claim 11
Independent Claim 520 words
A method of forming a dual layer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; and (D) applying a silicon containing passivating coating over the first coating, said passivating coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the first coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a dual layer coating is obtained on the substrate.
Claim 12
Independent Claim 584 words
A method of forming a multilayer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; (D) applying a passivating coating over the first coating, the passivating coating applied by means of (i) coating the electronic device having the first coating with a second solution comprising a solvent and a preceramic polymer, (ii) evaporating said solvent to thereby deposit a preceramic coating; and (iii) heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere; and (E) applying a silicon containing barrier coating to said passivating coating, said barrier coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the passivating coating with a third solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a multilayer coating is obtained on the electronic device.
Claim 13
Independent Claim 584 words
A method of forming a multilayer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; (D) applying a passivating coating over the first coating, the passivating coating applied by means of (i) coating the electronic device having the first coating with a second solution comprising a solvent and a preceramic polymer, (ii) evaporating said solvent to thereby deposit a preceramic coating; and (iii) heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere; and (E) applying a silicon containing barrier coating to said passivating coating, said barrier coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the passivating coating with a third solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a multilayer coating is obtained on the electronic device.
Claim 14
Dependent Claim 29 words
The method of claim 9 wherein the preceramic polymer in the second solution is selected from the group consisting of polycarbosilanes, polysilazanes, organopolysilanes, silsesquiazanes, carbon substituted polysilazanes, and polysilacyclobutasilazanes.
Claim 15
Independent Claim 882 words
A method of forming a multilayer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; (D) applying a silicon containing passivating coating to the first coating, said passivating coating selected from the group consisting of (i) silicon carbon-containing coatings, (ii) silicon nitrogen-containing coatings, and (iii) silicon carbon nitrogen-containing coatings, wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or all alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the first coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, to produce the silicon containing passivating coating; and (E) applying a silicon containing barrier coating to the passivating coating, the barrier coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the passivating coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a multilayer coating is obtained on the electronic device.
Claim 16
Independent Claim 882 words
A method of forming a multilayer coating on an electronic device consisting essentially of: (A) coating the electronic device with a solution consisting essentially of a solvent and hydrogen silsesquioxane resin; (B) evaporating the solvent to deposit a preceramic coating on the electronic device; (C) heating the preceramic coating to a temperature of between about 500° up to about 800° C. under an inert gas atmosphere to form the first coating; (D) applying a silicon containing passivating coating to the first coating, said passivating coating selected from the group consisting of (i) silicon carbon-containing coatings, (ii) silicon nitrogen-containing coatings, and (iii) silicon carbon nitrogen-containing coatings, wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or all alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the first coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, to produce the silicon containing passivating coating; and (E) applying a silicon containing barrier coating to the passivating coating, the barrier coating selected from the group consisting of (i) silicon coatings, (ii) silicon carbon-containing coatings, (iii) silicon nitrogen-containing coatings, and (iv) silicon carbon nitrogen-containing coatings, wherein the silicon coating is applied by a means selected from the group consisting of (a) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere, (b) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an inert gas atmosphere and (c) metal assisted chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an inert gas, and wherein the silicon carbon-containing coating is applied by a means selected from the group consisting of (1) chemical vapor deposition in an inert gas atmosphere of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane, (2) plasma enhanced chemical vapor deposition in an inert gas atmosphere of an alkylsilane, halosilane, halodisilane, halopolysilane or mixtures thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and (3) plasma enhanced chemical vapor deposition of a silacyclobutane or disilacyclobutane in an inert gas atmosphere; and wherein the silicon nitrogen-containing coating is deposited by a means selected from the group consisting of (A) chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane or mixtures thereof in an ammonia atmosphere, (B) plasma enhanced chemical vapor deposition of a silane, halosilane, halodisilane, halopolysilane, or mixtures thereof in an ammonia atmosphere and (C) coating the passivating coating with a second solution comprising a solvent and a preceramic polymer, evaporating said solvent to thereby deposit a preceramic coating and heating the preceramic coating to a temperature between 200°-900° C. under an ammonia or inert gas atmosphere, and wherein the silicon carbon nitrogen-containing coating is deposited by a means selected from the group consisting of (i) chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (ii) plasma enhanced chemical vapor deposition of hexamethyldisilazane in an ammonia or inert gas atmosphere, (iii) chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, and (iv) plasma enhanced chemical vapor deposition of a silane, alkylsilane, halosilane, halodisilane, halopolysilane or a mixture thereof in the presence of an alkane of one to six carbon atoms or an alkylsilane and further in the presence of ammonia, whereby a multilayer coating is obtained on the electronic device.

References Cited (Backward Citations)

US4460639A Cited
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