Abstract A semiconductor measuring apparatus having a measuring test head having a connection portion to which a circuit to be measured may be connected, a monitoring test head for connection to the connection portion of the measuring test head during a debugging operation, a measuring power source connected to the measuring test head, a monitor power source connected to the monitoring test head, an electrical signal measuring device connected to both the measuring test head and the monitoring test head, and a control unit for controlling the measuring power source, the monitor power source, and the electrical signal measuring device, causing the electrical signal measuring device to measure an output signal from the measuring test head during measurement of a circuit and causing the electrical signal measuring device to measure an output signal from the monitoring test head during a debugging operation.
A method of preparing a debugging program for debugging a semiconductor measuring apparatus comprising: reading a test program for measuring a circuit connected to a semiconductor measuring apparatus; defining an extraction key for extracting a set condition from the test program during a measurement of a circuit, the measurement of the circuit being made under control of the test program; defining a confirmation condition for confirming whether the set condition extracted from the test program is satisfactory; preparing a monitor program for determining whether the set condition is satisfactory in accordance with the confirmation condition; adding to the test program a branch command for branching to the monitor program; adding to the monitor program a return command for returning to the test program; and transmitting a debugging program comprising the test program to which the branch command is added and the monitor program to which the return command is added.
Claim 2
Independent Claim
150 words
A method of preparing a debugging program for debugging a semiconductor measuring apparatus comprising: reading a test program for measuring a circuit connected to a semiconductor measuring apparatus; defining an extraction key for extracting a set condition from the test program during a measurement of a circuit, the measurement of the circuit being made under control of the test program; defining a confirmation condition for confirming whether the set condition extracted from the test program is satisfactory; preparing a monitor program for determining whether the set condition is satisfactory in accordance with the confirmation condition; adding to the test program a branch command for branching to the monitor program; adding to the monitor program a return command for returning to the test program; and transmitting a debugging program comprising the test program to which the branch command is added and the monitor program to which the return command is added.
Claim 3
Dependent Claim
24 words
A method according to claim 1 comprising adding a mode selecting description program for selecting a debugging program execution mode to the test program.