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US5366914A Expired / Lapsed US ⏱️ 0.0 years remaining

Vertical power MOSFET structure having reduced cell area

Assignee: Renesas Electronics Corp
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Filing: 1993-01-29
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Granted: 1994-11-22
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Expires: 2013-01-29
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Abstract

Abstract In a vertical power field effect transistor, a side surface of a gate electrode is covered with a side oxide film, and a groove is formed in self-alignment with the side oxide film to extend from a surface area of a silicon substrate between a pair of adjacent gate electrodes, to reach a base region. A tungsten film is filled into the groove thus formed, and a source electrode-is formed in contact with the tungsten film within the groove.

Inventors

  • 👤 Nobumitsu Takahashi
  • 👤 Mitsuasa Takahashi
  • 👤 Hitoshi Kubota

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 03:57
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/64; H10D30/66; H10D30/01; H10D30/021; H10D30/028; H10D30/0291; H10D30/0295; H10D30/0297; H10D30/668; H10D62/00; H10D62/80; H10D62/83; H10D64/00; H10D64/20; H10D64/23; H10D64/251; H10D64/252; H10D64/2527; H10D64/256; H10D64/60; H10D64/62

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 326 words
A method for manufacturing a vertical power field effect transistor comprising the steps of: forming a first insulating film covering on a principal surface of a semiconductor substrate of a first conductivity type; forming a conducting layer on said first insulating film; forming a first interlayer insulating film covering said conducting layer; patterning a stacked structure formed of said first insulating film, said conducting layer and said first interlayer film so as to form a patterned stacked structure and to expose a portion of said substrate uncovered by said patterned stacked structure, said first insulating film of said patterned stacked structure forming a gate insulator film, said conducting layer of said patterned stacked structure forming a gate electrode; introducing an impurity of a second conductivity type opposite to said first conductivity type into said exposed portion of said substrate by using the patterned stacked structure as a mask, so that a base region extending under said gate electrode is formed; introducing an impurity of said first conductivity type by using the patterned stacked structure as a mask, so that a source region smaller than said base region is formed in said base region and extends under said gate electrode; forming a second interlayer insulating film on said principal surface of said substrate; anisotropically etching said second interlayer insulating film so as to form a side insulating film which covers only each side surface of the gate electrode and the gate insulator film; anisotropically etching said substrate by using the side insulating films as a mask, so as to form, in a self-alignment manner, a groove which extends downward from said principal surface of said silicon substrate to pass through said source region and to reach said base region; filling said groove with a metal film; forming a metal film evaporated on the entire resulting surface; and patterning said metal film to form a source electrode which is electrically connected to said metal filled in said groove.
Claim 2
Independent Claim 326 words
A method for manufacturing a vertical power field effect transistor comprising the steps of: forming a first insulating film covering on a principal surface of a semiconductor substrate of a first conductivity type; forming a conducting layer on said first insulating film; forming a first interlayer insulating film covering said conducting layer; patterning a stacked structure formed of said first insulating film, said conducting layer and said first interlayer film so as to form a patterned stacked structure and to expose a portion of said substrate uncovered by said patterned stacked structure, said first insulating film of said patterned stacked structure forming a gate insulator film, said conducting layer of said patterned stacked structure forming a gate electrode; introducing an impurity of a second conductivity type opposite to said first conductivity type into said exposed portion of said substrate by using the patterned stacked structure as a mask, so that a base region extending under said gate electrode is formed; introducing an impurity of said first conductivity type by using the patterned stacked structure as a mask, so that a source region smaller than said base region is formed in said base region and extends under said gate electrode; forming a second interlayer insulating film on said principal surface of said substrate; anisotropically etching said second interlayer insulating film so as to form a side insulating film which covers only each side surface of the gate electrode and the gate insulator film; anisotropically etching said substrate by using the side insulating films as a mask, so as to form, in a self-alignment manner, a groove which extends downward from said principal surface of said silicon substrate to pass through said source region and to reach said base region; filling said groove with a metal film; forming a metal film evaporated on the entire resulting surface; and patterning said metal film to form a source electrode which is electrically connected to said metal filled in said groove.
Claim 3
Independent Claim 347 words
A method for manufacturing a vertical power field effect transistor comprising the steps of: forming a drain layer of a first conductivity type at an upper surface of a semiconductor substrate of said first conductivity type; forming at an upper surface of said drain layer a base layer of a second conductivity type opposite to said first conductivity type; forming a source layer of said first conductivity type at an upper surface of said base layer; forming in said substrate a plurality of vertical trenches separated from each other and passing through said source layer and said base layer to reach said drain layer; forming a gate oxide film covering said principal surface of said substrate and an inner surface of said trenches; forming a gate electrode layer covering said gate oxide film at said principal surface of said substrate and within said trenches; forming a first interlayer insulating film on said gate electrode layer at said principal surface of said substrate and within said trenches; patterning a stacked structure composed of said gate oxide film, said gate electrode layer and said first interlayer insulating film so as to form a pattern stacked structure and to expose a portion of said substrate, said gate electrode layer of said patterned stacked structure forming a gate electrode; forming a second interlayer insulating film on said principal surface of said substrate; anisotropically etching said second interlayer insulating film so as to form a side insulating film which covers only each side surface of the gate electrode, the gate insulator film and the remaining first interlayer insulating film; anisotropically etching said substrate by using the side insulating films as a mask, so as to form, in a self-alignment manner, a groove which extends downward from said principal surface of said substrate to pass through said source region and to reach said base region; filling said groove with a metal film; forming a metal film evaporated on the entire resulting surface; and patterning said metal film to form a source electrode which is electrically connected to said metal filled in said groove.
Claim 4
Independent Claim 347 words
A method for manufacturing a vertical power field effect transistor comprising the steps of: forming a drain layer of a first conductivity type at an upper surface of a semiconductor substrate of said first conductivity type; forming at an upper surface of said drain layer a base layer of a second conductivity type opposite to said first conductivity type; forming a source layer of said first conductivity type at an upper surface of said base layer; forming in said substrate a plurality of vertical trenches separated from each other and passing through said source layer and said base layer to reach said drain layer; forming a gate oxide film covering said principal surface of said substrate and an inner surface of said trenches; forming a gate electrode layer covering said gate oxide film at said principal surface of said substrate and within said trenches; forming a first interlayer insulating film on said gate electrode layer at said principal surface of said substrate and within said trenches; patterning a stacked structure composed of said gate oxide film, said gate electrode layer and said first interlayer insulating film so as to form a pattern stacked structure and to expose a portion of said substrate, said gate electrode layer of said patterned stacked structure forming a gate electrode; forming a second interlayer insulating film on said principal surface of said substrate; anisotropically etching said second interlayer insulating film so as to form a side insulating film which covers only each side surface of the gate electrode, the gate insulator film and the remaining first interlayer insulating film; anisotropically etching said substrate by using the side insulating films as a mask, so as to form, in a self-alignment manner, a groove which extends downward from said principal surface of said substrate to pass through said source region and to reach said base region; filling said groove with a metal film; forming a metal film evaporated on the entire resulting surface; and patterning said metal film to form a source electrode which is electrically connected to said metal filled in said groove.

References Cited (Backward Citations)

US5128278A Cited
US5023196A Cited
US5182222A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-11-21 1998-05-23 1998-11-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-11-21 2002-05-23 2002-11-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-11-21 2006-05-23 2006-11-22 $7700.00 Window Closed / Lapsed

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