Apparatus and method for measuring refractive index

Claim 2

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means of holding said object between the illuminating means and detector, and filtering means for selectively limiting the output of the detector, said filtering means being adjustable such that the detector produces a signal in response to, and in dependence upon, that portion of the transmitted beam which is the result of diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof and corresponds to the nth diffraction order, where n is preselected and is non-zero.

Claim 3

An analyser according to claim 1 wherein the filtering means is adjustable so as to selectively filter substantially in the direction parallel to the longitudinal axis of the object.

Claim 4

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, and filtering means for selectively limiting the output of the detector, said filtering means being adjustable such that the detector produces a signal in response to, and in dependence upon, those portions of the transmitted beam which correspond respectively to preselected diffraction orders, at least one of which is a non-zeroth diffraction order resulting from diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof.

Claim 5

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, and filtering means for selectively limiting the output of the detector, said filtering means being adjustable such that the detector produces a signal in response to, and in dependence upon, those portions of the transmitted beam which correspond respectively to preselected diffraction orders, at least one of which is a non-zeroth diffraction order resulting from diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof.

Claim 6

An analyser according to claim 3 further comprising processing means connected to the output of the detector for processing the output thereof.

Claim 7

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, and adjustable means for filtering the output from the detector such that only signals produced by said detector in response to, and in dependence upon, those portions of the transmitted beam which correspond respectively to preselected diffraction orders, at lest one of which is a non-zeroth diffraction order resulting from diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof, are allowed to pass.

Claim 8

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, and adjustable means for filtering the output from the detector such that only signals produced by said detector in response to, and in dependence upon, those portions of the transmitted beam which correspond respectively to preselected diffraction orders, at lest one of which is a non-zeroth diffraction order resulting from diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof, are allowed to pass.

Claim 9

An analyser according to claim 5 comprising modulation means between the object and the detector for encoding the beam in the plane of the modulation means with its own positional information for detection by the detector.

Claim 10

An analyser according to claim 6 wherein the modulation means modulates the beam temporally and the filtering means temporally filters the output of the detector.

Claim 11

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, focusing means for receiving the transmitted beam, and filtering means for selectively limiting the output of the detector, said filtering means being operable such that the detector produces a signal in response to, and in dependence upon, that portion of the transmitted beam which is the result of diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof and corresponds to the nth diffraction order, where n is preselected and is non-zero, and said focusing means being located between the object and the detector and being arranged so as to focus the transmitted beam asymmetrically in a plane in which the filtering means acts to limit the output of the detector.

Claim 12

A transverse-type analyser, for measuring optical properties in an approximately cylindrical transparent object, such as an optical fibre or optical fibre preform, which diffracts light incident upon it, the analyser comprising illuminating means for producing an illuminating beam which is incident upon said object in a direction which is transverse to the longitudinal axis of said object, a detector for sensing the beam transmitted through said object, means for holding said object between the illuminating means and the detector, focusing means for receiving the transmitted beam, and filtering means for selectively limiting the output of the detector, said filtering means being operable such that the detector produces a signal in response to, and in dependence upon, that portion of the transmitted beam which is the result of diffraction of the illuminating beam by said object in a direction parallel to the longitudinal axis thereof and corresponds to the nth diffraction order, where n is preselected and is non-zero, and said focusing means being located between the object and the detector and being arranged so as to focus the transmitted beam asymmetrically in a plane in which the filtering means acts to limit the output of the detector.

Claim 13

An analyser according to claim 8 wherein the focusing means focuses the beam less sharply in a direction parallel to the longitudinal axis of the object than in a direction perpendicular to a plane containing said axis and said illuminating beam.

Claim 14

An analyser according to claim 8 wherein the focusing means is a cylindrical lens having its longitudinal axis oriented substantially parallel to that of said object.

Claim 15

An analyser according to any of claim 8 further comprising a second focussing means located between the illuminating means and the object and arranged so as to focus the beam asymmetrically at the object.

Claim 16

An analyser according to claim 1, 3 5 or 8, wherein the filtering means is adjustable from a state in which a beam portion corresponding to one diffraction order can be discriminated, to at least one other state in which a beam portion corresponding to a different diffraction order can be discriminated.

Claim 17

An analyser according to claim 1, 3, 5 or 8, wherein the filtering means is selected such that it would just accept the whole beam if there were no diffraction, and only a portion of the beam when diffraction occurs.

Claim 18

An analyser according to any of claims 1, 3, 5 or 8 wherein the filtering means is adjustable so as to selectively discriminate beam portions of variable size.

Claim 19

An analyser according to any of claims 1, 3, 5 or 8 wherein the detector is capable of measuring intensity.

Claim 20

An analyser according to any of claims 1, 3 or 5 further comprising means for separating portions of the beam at a plane where the filtering means acts to discriminate said portions.

Claim 21

An analyser according to claim 12 further comprising interpolation and extrapolation means for calculating positional information relating to the beam portion corresponding to one diffraction order from positional information relating to the beam portions corresponding to other diffraction orders.

Claim 22

An analyser according to any of claims 1, 3, 5 or 8 further comprising measuring means coupled to the filtering means for measuring the position of a selectively discriminated beam portion.

Claim 23

An analyser according to claim 1, 3 or 8 wherein the filtering means is mechanical and is located between the object and the detector.

Claim 30

A method according to claim 22 wherein the moving and detecting steps are repeated for a plurality of selected diffraction orders.

Claim 31

A method according to claim 22 wherein said illuminating beam is narrow compared to the diameter of the object, and further comprising the step of moving the beam transversely relative to the object before the moving and detecting steps.

Claim 32

A method according to claim 22 for obtaining information concerning a selected diffraction order at a plurality of radial locations on said object, said object having an axial variation in refractive index, wherein the aperture is elongate and has its longitudinal axis aligned substantially in a direction perpendicular to a plane containing the illuminating beam and the longitudinal axis of the object, and wherein in the detecting steps a plurality of beam portions corresponding to the selected diffraction order are detected by moving said beam transversely relative to the object, whilst the aperture is kept substantially fixed.

Claim 33

A method according to claim 20 or 21, for obtaining positional information regarding a selected diffraction order exiting from the object, wherein in the moving and detecting steps a plurality of beam portions are discriminated and positional information regarding these beam portions is detected, and further comprising the step of interpolating or extrapolating from this positional information to obtain positional information regarding the selected diffraction order.

Claim 34

A method according to claim 22, for obtaining positional information regarding a beam portion corresponding to a selected diffraction order exiting from the object, wherein in the moving and detecting steps beam portions corresponding to a plurality of diffraction orders are discriminated and positional information regarding these orders is detected, and further comprising the step of interpolating or extrapolating from this positional information to obtain positional information regarding the beam portion corresponding to the selected diffraction order.

Claim 35

A method according to claim 22, suitable for determining the deposition layer surface contour of a VAD preform, the object having a structure consisting of a plurality of layers, wherein in the illuminating, moving and detecting steps positional information relating to a plurality of said beam portions is determined as a function of radial location across the object, and further comprising the steps of calculating therefrom information relating to the surface gradient of a plurality of layers as a function of said radial location, and integrating the surface gradient information to determine layer surface contour information as a function of said radial location.

Claim 36

A method according to claim 21 wherein one of the preselected diffraction orders is the zeroth order.