Method of manufacturing a highly integrated semiconductor device

Claim 1

A method of manufacturing a highly integrated semiconductor device comprising the steps of: forming a field oxide layer on part of a silicon substrate; forming a word line, a mask oxide layer, and a spacer oxide layer on said silicon substrate and on said field oxide layer; depositing a first polysilicon layer over the entire surface of said semiconductor device; forming on said first polysilicon layer a photoresist pattern having a cylinder-shaped window; forming a first oxide layer over the entire surface of said semiconductor device; etching said first oxide layer through an etchback process until said photoresist pattern is exposed; removing the exposed photoresist pattern entirely so that a cylinder-shaped oxide layer remains and a portion of the first polysilicon layer is exposed; forming a polysilicon layer of hemisphere grain structures on the surface of said cylinder-shaped oxide layer and on the exposed first polysilicon layer, the hemisphere grain structures of said layer of hemisphere grain structures being separated from each other so as to leave exposed openings on the surface of said cylinder-shaped oxide layer; etching the exposed part of said cylinder-shaped oxide layer through the openings formed by said polysilicon layer of the hemisphere grain structures so as to form several cylinder-shaped oxide layer patterns; removing said polysilicon layer of the hemisphere grain structures; depositing a second polysilicon layer on said cylinder-shaped oxide layer patterns and on the exposed surface of said first polysilicon layer; and etching said first polysilicon layer and said second polysilicon layer using a mask for forming a storage electrode made up of said first polysilicon layer and the second polysilicon layer formed on said cylinder-shaped oxide layer patterns.

Claim 2

A method of manufacturing a highly integrated semiconductor device comprising the steps of: forming a field oxide layer on part of a silicon substrate; forming a word line, a mask oxide layer, and a spacer oxide layer on said silicon substrate and on said field oxide layer; depositing a first polysilicon layer over the entire surface of said semiconductor device; forming on said first polysilicon layer a photoresist pattern having a cylinder-shaped window; forming a first oxide layer over the entire surface of said semiconductor device; etching said first oxide layer through an etchback process until said photoresist pattern is exposed; removing the exposed photoresist pattern entirely so that a cylinder-shaped oxide layer remains and a portion of the first polysilicon layer is exposed; forming a polysilicon layer of hemisphere grain structures on the surface of said cylinder-shaped oxide layer and on the exposed first polysilicon layer, the hemisphere grain structures of said layer of hemisphere grain structures being separated from each other so as to leave exposed openings on the surface of said cylinder-shaped oxide layer; etching the exposed part of said cylinder-shaped oxide layer through the openings formed by said polysilicon layer of the hemisphere grain structures so as to form several cylinder-shaped oxide layer patterns; removing said polysilicon layer of the hemisphere grain structures; depositing a second polysilicon layer on said cylinder-shaped oxide layer patterns and on the exposed surface of said first polysilicon layer; and etching said first polysilicon layer and said second polysilicon layer using a mask for forming a storage electrode made up of said first polysilicon layer and the second polysilicon layer formed on said cylinder-shaped oxide layer patterns.

Claim 5

A method of manufacturing a highly integrated semiconductor device comprising the steps of; forming a field oxide layer on part of a silicon substrate; forming a word line, a mask oxide layer, and a spacer oxide layer on said silicon substrate and on said field oxide layer; depositing a first polysilicon layer over the entire surface of said semiconductor device; forming on said first polysilicon layer a photoresist pattern having a cylinder-shaped window; forming a first oxide layer over the entire surface of said semiconductor device; etching said first oxide layer through an etchback process until said photoresist pattern is exposed; removing the exposed photoresist pattern entirely so that a cylinder-shaped oxide layer remains and a portion of the first polysilicon layer is exposed; forming a polysilicon layer of hemisphere grain structures on the surface of said cylinder-shaped oxide layer and on the exposed first polysilicon layer, the hemisphere grain structures of said layer of hemisphere grain structures being separated from each other so as to leave exposed openings on the surface of said cylinder-shaped oxide layer; etching the exposed part of said cylinder-shaped oxide layer through the openings formed by said polysilicon layer of the hemisphere grain structures so as to form several cylinder-shaped oxide layer patterns; removing said polysilicon layer of the hemisphere grain structures; depositing a second polysilicon layer on said cylinder-shaped oxide layer patterns and the exposed portion of said first polysilicon layer; coating a photoresist layer on said second polysilicon layer; etching said first polysilicon layer and said second polysilicon layer on top of said cylinder-shaped oxide layer patterns is exposed; etching said exposed second polysilicon layer formed on top of said cylinder-shaped oxide layer patterns; removing the remaining photoresist layer; etching away said cylinder-shaped oxide layer patterns; and etching said first polysilicon layer and said second polysilicon layer using a mask for forming a storage electrode made up of said first polysilicon layer and the second polysilicon layer formed on said cylinder-shaped oxide layer patterns.

Claim 6

A method of manufacturing a highly integrated semiconductor device comprising the steps of; forming a field oxide layer on part of a silicon substrate; forming a word line, a mask oxide layer, and a spacer oxide layer on said silicon substrate and on said field oxide layer; depositing a first polysilicon layer over the entire surface of said semiconductor device; forming on said first polysilicon layer a photoresist pattern having a cylinder-shaped window; forming a first oxide layer over the entire surface of said semiconductor device; etching said first oxide layer through an etchback process until said photoresist pattern is exposed; removing the exposed photoresist pattern entirely so that a cylinder-shaped oxide layer remains and a portion of the first polysilicon layer is exposed; forming a polysilicon layer of hemisphere grain structures on the surface of said cylinder-shaped oxide layer and on the exposed first polysilicon layer, the hemisphere grain structures of said layer of hemisphere grain structures being separated from each other so as to leave exposed openings on the surface of said cylinder-shaped oxide layer; etching the exposed part of said cylinder-shaped oxide layer through the openings formed by said polysilicon layer of the hemisphere grain structures so as to form several cylinder-shaped oxide layer patterns; removing said polysilicon layer of the hemisphere grain structures; depositing a second polysilicon layer on said cylinder-shaped oxide layer patterns and the exposed portion of said first polysilicon layer; coating a photoresist layer on said second polysilicon layer; etching said first polysilicon layer and said second polysilicon layer on top of said cylinder-shaped oxide layer patterns is exposed; etching said exposed second polysilicon layer formed on top of said cylinder-shaped oxide layer patterns; removing the remaining photoresist layer; etching away said cylinder-shaped oxide layer patterns; and etching said first polysilicon layer and said second polysilicon layer using a mask for forming a storage electrode made up of said first polysilicon layer and the second polysilicon layer formed on said cylinder-shaped oxide layer patterns.