US5337278A
Expired / Lapsed
US
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Low-power decoder for selecting redundant memory cells
Assignee: Lapis Semiconductor Co Ltd
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Filing: 1993-02-17
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Granted: 1994-08-09
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Expires: 2013-02-17
Abstract
Abstract To avoid unnecessary power dissipation, a decoder for selecting redundant memory cells in a memory device provides, for each section of the memory device, a first node and a second node that are coupled through a fuse-programmable ROM. If a defective memory cell is found in a section of the memory device, the fuse-programmable ROM of that section is programmed so as to decouple the first node from the second node when the defective memory cell is addressed. Prior to every access cycle, the first and second nodes of all sections are precharged. When address signals are received, the second node of the addressed section is discharged, other second nodes remaining charged. Normal or redundant memory cells are selected by performing a logic operation on the potentials of the first nodes.
Inventors
- 👤 Shizuo Cho
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 17:05
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/70; G11C29/78; G11C29/83; G11C29/84
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
227 words
A method of selecting redundant memory cells disposed in different sections of a memory device, comprising the steps of: (a) providing, for each of said sections, a separate pair of nodes consisting of a first node and a second node, and a fuse-programmable ROM for electrically coupling said first node to said second node; (b) testing each of said sections of said memory device for defective memory cells; (c) if a defective memory cell is found in a section of said memory device, programming the fuse-programmable ROM provided for that section so that said fuse-programmable ROM will not couple the first node provided for that section to the second node provided for that section when said defective memory cell is addressed; (d) precharging the pair of nodes provided for each of said sections to a first potential; (e) addressing a memory cell in one section from among said sections; (f) discharging the second node provided for said one section to a second potential different from said first potential; (g) inputting electrical potentials from the first node provided for each of said sections to a logic gate, thereby generating an output signal; (h) accessing the memory cell addressed in said one section if said output signal is in one state; (i) accessing a redundant memory cell in said one section if said output signal is in another state.
Claim 2
Independent Claim
227 words
A method of selecting redundant memory cells disposed in different sections of a memory device, comprising the steps of: (a) providing, for each of said sections, a separate pair of nodes consisting of a first node and a second node, and a fuse-programmable ROM for electrically coupling said first node to said second node; (b) testing each of said sections of said memory device for defective memory cells; (c) if a defective memory cell is found in a section of said memory device, programming the fuse-programmable ROM provided for that section so that said fuse-programmable ROM will not couple the first node provided for that section to the second node provided for that section when said defective memory cell is addressed; (d) precharging the pair of nodes provided for each of said sections to a first potential; (e) addressing a memory cell in one section from among said sections; (f) discharging the second node provided for said one section to a second potential different from said first potential; (g) inputting electrical potentials from the first node provided for each of said sections to a logic gate, thereby generating an output signal; (h) accessing the memory cell addressed in said one section if said output signal is in one state; (i) accessing a redundant memory cell in said one section if said output signal is in another state.
Claim 3
Dependent Claim
15 words
The method of claim 1, wherein said first potential is higher than said second potential.
Claim 4
Dependent Claim
13 words
The method of claim 1, wherein said logic gate is a NAND gate.
Claim 5
Dependent Claim
28 words
The method of claim 1, wherein said step (e) of addressing a memory cell in one section comprises a further step of generating pairs of complementary address signals.
Claim 6
Dependent Claim
81 words
The method of claim 4, wherein the fuse-programmable ROM provided for each section comprises a plurality of fusible links and a like plurality of field-effect transistors having source electrodes, drain electrodes, and gate electrodes, said gate electrodes being coupled to receive said complementary address signals, said source electrodes being coupled to the second node provided for said section, said drain electrodes being coupled to respective fusible links, and said fusible links being coupled to the first node provided for said section.
Claim 7
Dependent Claim
24 words
The method of claim 5, wherein said step (c) of programming the fuse-programmable ROM is carried out by cutting certain of said fusible links.
Claim 8
Dependent Claim
132 words
A fuse-programmable decoder powered by a first potential and a second potential, for receiving address signals designating memory cells in a selectable section of a memory device, comparing the address signals with stored information, and detecting whether the address signals match the stored information, comprising: a first node that is coupled to said first potential when said section is not selected, and decoupled from said first potential when said section is selected; a second node that is coupled to said first potential when said section is not selected, and coupled to said second potential when said section is selected; and a fuse-programmable ROM coupled to receive said address signals, for storing address information, and coupling said first node to said second node when said address signals do not match said address information.
Claim 9
Dependent Claim
132 words
A fuse-programmable decoder powered by a first potential and a second potential, for receiving address signals designating memory cells in a selectable section of a memory device, comparing the address signals with stored information, and detecting whether the address signals match the stored information, comprising: a first node that is coupled to said first potential when said section is not selected, and decoupled from said first potential when said section is selected; a second node that is coupled to said first potential when said section is not selected, and coupled to said second potential when said section is selected; and a fuse-programmable ROM coupled to receive said address signals, for storing address information, and coupling said first node to said second node when said address signals do not match said address information.
Claim 10
Dependent Claim
51 words
The decoder of claim 7, wherein said fuse-programmable ROM comprises: a plurality of fusible links coupled to said first node; and a like plurality of field-effect transistors having source electrodes coupled to said second node, drain electrodes coupled to respective fusible links, and gate electrodes coupled to receive respective address signals.
Claim 11
Dependent Claim
15 words
The decoder of claim 8, wherein said first potential is higher than said second potential.
Claim 12
Dependent Claim
14 words
The decoder of claim 9, wherein said field-effect transistors are n-channel field effect transistors.
Claim 13
Dependent Claim
44 words
The decoder of claim 7, further comprising: a first transistor for coupling said first node to said first potential; a second transistor for coupling said second node to said first potential; and a third transistor for coupling said second node to said second potential.
Claim 14
Dependent Claim
26 words
The decoder of claim 11, wherein said first transistor and said second transistor are p-channel field-effect transistors, and said third transistor is an n-channel field-effect transistor.
Claim 15
Dependent Claim
22 words
The decoder of claim 12, wherein said first transistor, said second transistor, and said third transistor are driven by a single signal.
Claim 16
Dependent Claim
208 words
A fuse-programmable decoder powered by a first potential and a second potential for a memory having, for each integer i from one to a certain integer N greater than one, an i-th section with memory cells selected by address signals for storing data and redundant memory cells for replacing defective memory cells, comprising: for each integer i from one to N, an i-th first node that is coupled to said first potential when said i-th section is not selected, and decoupled from said first potential when said i-th section is selected; and for each integer i from one to N, an i-th second node that is coupled to said first potential when said i-th section is not selected, and coupled to said second potential when said i-th section is selected; for each integer i from one to N, an i-th fuse-programmable ROM for storing address information, receiving address signals, electrically coupling said i-th first node to said i-th second node when said address signals do not match said address information; and a logic gate coupled to receive an electrical potential from each i-th first node, where i ranges from one to N, for performing a logic operation and producing an output signal to select said redundant memory cells.
Claim 17
Dependent Claim
208 words
A fuse-programmable decoder powered by a first potential and a second potential for a memory having, for each integer i from one to a certain integer N greater than one, an i-th section with memory cells selected by address signals for storing data and redundant memory cells for replacing defective memory cells, comprising: for each integer i from one to N, an i-th first node that is coupled to said first potential when said i-th section is not selected, and decoupled from said first potential when said i-th section is selected; and for each integer i from one to N, an i-th second node that is coupled to said first potential when said i-th section is not selected, and coupled to said second potential when said i-th section is selected; for each integer i from one to N, an i-th fuse-programmable ROM for storing address information, receiving address signals, electrically coupling said i-th first node to said i-th second node when said address signals do not match said address information; and a logic gate coupled to receive an electrical potential from each i-th first node, where i ranges from one to N, for performing a logic operation and producing an output signal to select said redundant memory cells.
Claim 18
Dependent Claim
62 words
The decoder of claim 14, wherein for each integer i from one to N, said i-th fuse-programmable ROM comprises: a plurality of fusible links coupled to said i-th first node; and a like plurality of field-effect transistors having source electrodes coupled to said i-th second node, drain electrodes coupled to respective fusible links, and gate electrodes coupled to receive respective address signals.
Claim 19
Dependent Claim
15 words
The decoder of claim 15, wherein said first potential is higher than said second potential.
Claim 20
Dependent Claim
14 words
The decoder of claim 16, wherein said field-effect transistors are n-channel field effect transistors.
Claim 21
Dependent Claim
13 words
The decoder of claim 17, wherein said logic gate is a NAND gate.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-08-08 | 1998-02-07 | 1998-08-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-08-08 | 2002-02-07 | 2002-08-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-08-08 | 2006-02-07 | 2006-08-09 | $7700.00 | Window Closed / Lapsed |