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US5336367A Expired / Lapsed US ⏱️ 0.0 years remaining

Solid-state imaging device and method of manufacturing the same

Assignee: Panasonic Holdings Corp
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Filing: 1993-05-24
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Granted: 1994-08-09
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Expires: 2013-05-24
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Abstract

Abstract A solid-state imaging device comprises a color filter formed of a colored transparent material having intended spectral transmissivity characteristics. The color filter possesses plural spectral transmissivity characteristics in one layer. In this constitution, the distance from the color filter to the light sensing part is not extended, and flicker and other image characteristic defects are eliminated- Being not of laminate structure, cracks of color filter due to thermal impact are eliminated, and the reliability is enhanced. In the manufacturing method, by dry-etching of the colored transparent material, the solid-state imaging-device having a color filter is realized. Accordingly, the color filter my be formed without exposure accompanied by pattern formation, development and dyeing process, so that an efficient manufacturing method is realized.

Inventors

  • 👤 Toru Nomura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:50
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/80; H10F39/805; H10F39/8053; H10F39/806; H10F39/011; H10F39/024; H10F39/8063

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 75 words
A method of manufacturing a solid-state imaging device comprising: a step of forming a colored transparent material layer above a solid-state imaging device substrate, a step of forming an etching resistant material layer selectively on the colored transparent material layer, a step of forming a color filter by etching the colored material layer using the etching resistant material layer as a mask, and a step of forming a microlens on the etching resistant material layer.
Claim 2
Independent Claim 75 words
A method of manufacturing a solid-state imaging device comprising: a step of forming a colored transparent material layer above a solid-state imaging device substrate, a step of forming an etching resistant material layer selectively on the colored transparent material layer, a step of forming a color filter by etching the colored material layer using the etching resistant material layer as a mask, and a step of forming a microlens on the etching resistant material layer.
Claim 3
Dependent Claim 96 words
A method of manufacturing a solid-state imaging device of claim 3, wherein the step of forming the color filter includes a step of forming a single-layer color filter possessing partially different spectral transmissivity characteristics by repeating, a step of forming a colored transparent material layer, a step of selectively forming an etching resistant material layer on the colored transparent material layer, and a step of etching the colored material layer by using the etching resistant material layer as a mask, and by varying the spectral transmissivity characteristics of the colored transparent material a plurality of times.
Claim 4
Dependent Claim 26 words
A method of manufacturing a solid-state imaging device according to claim 3, wherein the colored transparent material layer is an organic high molecular transparent material layer.
Claim 5
Dependent Claim 26 words
A method of manufacturing a solid-state imaging device according to claim 4, wherein the colored transparent material layer is an organic high molecular transparent material layer.

References Cited (Backward Citations)

JPS63204486A Cited
JPS63250316A Cited
JPS63290802A Cited
JPS63304675A Cited
JPH0296372A Cited
US5239412A Cited
US5238856A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-08-08 1998-02-07 1998-08-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-08-08 2002-02-07 2002-08-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-08-08 2006-02-07 2006-08-09 $7700.00 Window Closed / Lapsed

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