Omnidirectional capacitive probe for gauge of having a sensing tip formed as a substantially complete sphere

Claim 2

An omnidirectional capacitive probe comprising: an electrically conductive hollow stalk; an electrically conductive spherical sensing tip disposed at one end of said hollow stalk, said spherical sensing tip formed as a substantially complete sphere; a wire coaxially disposed within said hollow stalk and electrically connected to said spherical sensing tip; a first voltage generating means for generating a first A.C. voltage between said spherical sensing tip and a workpiece; and a second voltage generating means for generating a second A.C. voltage between said hollow stalk and said workpiece, said first and second voltages being generally equal in phase and magnitude thereby to reduce the effect of stray capacitance on measurements made with said capacitive probe; said spherical sensing tip forming a capacitor with said workpiece when said spherical sensing tip is located in close proximity with the workpiece, the capacitor formed by said spherical sensing tip and the workpiece having a capacitance that is indicative of the distance between said spherical sensing tip and the workpiece, the capacitance of the capacitor formed by said spherical sensing tip and said workpiece being generally independent of the orientation of the spherical sensing tip with respect to the workpiece at distances less than the radius of said spherical tip.

Claim 3

An omnidirectional capacitive probe comprising: an electrically conductive hollow stalk; an electrically conductive spherical sensing tip disposed at one end of said hollow stalk, said spherical sensing tip formed as a substantially complete sphere; means for connecting said spherical sensing tip with said hollow stalk, said means for connecting electrically insulating said spherical sensing tip from said hollow stalk; a wire coaxially disposed within said conductive hollow stalk and electrically connected to said electrically conductive spherical sensing tip; first voltage generating means for generating a first A.C. voltage between said spherical sensing tip and a target workpiece; and second voltage generating means for generating a second A.C. voltage between said hollow stalk and said target workpiece, said first and second voltages being generally equal in phase and magnitude thereby to reduce the effect of stray capacitance on measurements made with said capacitive probe; said spherical sensing tip forming a capacitor with said target workpiece when said spherical sensing tip is located in close proximity with the workpiece, the capacitor formed by said spherical sensing tip and the workpiece having a capacitance that is indicative of the distance between said spherical sensing tip and the workpiece, the capacitance of the capacitor formed by said spherical sensing tip and said workpiece being generally independent of the orientation of the spherical sensing tip with the workpiece at distances less than the radius of said spherical tip.

Claim 4

An omnidirectional capacitive probe comprising: an electrically conductive hollow stalk; an electrically conductive spherical sensing tip disposed at one end of said hollow stalk, said spherical sensing tip formed as a substantially complete sphere; means for connecting said spherical sensing tip with said hollow stalk, said means for connecting electrically insulating said spherical sensing tip from said hollow stalk; a wire coaxially disposed within said conductive hollow stalk and electrically connected to said electrically conductive spherical sensing tip; first voltage generating means for generating a first A.C. voltage between said spherical sensing tip and a target workpiece; and second voltage generating means for generating a second A.C. voltage between said hollow stalk and said target workpiece, said first and second voltages being generally equal in phase and magnitude thereby to reduce the effect of stray capacitance on measurements made with said capacitive probe; said spherical sensing tip forming a capacitor with said target workpiece when said spherical sensing tip is located in close proximity with the workpiece, the capacitor formed by said spherical sensing tip and the workpiece having a capacitance that is indicative of the distance between said spherical sensing tip and the workpiece, the capacitance of the capacitor formed by said spherical sensing tip and said workpiece being generally independent of the orientation of the spherical sensing tip with the workpiece at distances less than the radius of said spherical tip.

Claim 5

An omnidirectional capacitive probe as claimed in claim 2 wherein said spherical sensing tip comprises: a center portion formed from an insulating material; and an electrically conductive outer shell disposed over said center portion.

Claim 6

An omnidirectional capacitive probe as claimed in claim 3 wherein said center portion is made from a ceramic material.

Claim 7

An omnidirectional capacitive probe as claimed in claim 2 wherein said spherical sensing tip is formed from a material selected from the group consisting of steel, tungsten carbide, and Inconel.

Claim 8

An omnidirectional capacitive probe as claimed in claim 2 wherein said hollow stalk is formed from brass.