US5310453A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Plasma process method using an electrostatic chuck
Assignee: Tokyo Electron Ltd
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Filing: 1993-02-12
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Granted: 1994-05-10
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Expires: 2013-02-12
Abstract
Abstract Prior to plasma etching, a wafer is placed on conductive support pins which extend through an electrostatic chuck. The electrostatic chuck is disposed on a susceptor incorporating a cooling jacket. A potential for electrostatic attraction is applied to the electrostatic chuck. The support pins are lowered while they are grounded, thus placing the wafer on the electrostatic chuck. Subsequently, the support pins are retracted into the electrostatic chuck to release contact between the wafer and themselves. A heat medium gas is then supplied between the wafer and the electrostatic chuck to improve the heat transfer rate therebetween. A plasma is then generated in a process chamber, and the wafer is etched by using the plasma. Since the heat transfer rate between the wafer and the electrostatic chuck is improved before the generation of the plasma, damage to the wafer due to heat can be prevented, and the starting time required to start an etching process is shortened.
Inventors
- 👤 Kazuo Fukasawa
- 👤 Ryo Nonaka
- 👤 Kousuke Imafuku
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 12:30
CPC Classifications
H; H10; H10P; H10P50/00; H10P72/00; H10P72/04; H10P72/0431; H10P72/70; H10P72/72; H10P72/722; H01; H01J; H01J2237/00; H01J2237/20; H01J2237/2001; H01J2237/32; H01J2237/33; H01J2237/334
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
187 words
A plasma process method using a plasma process apparatus including: a process chamber capable of attaining vacuum; a support table for supporting a substrate to be processed in said process chamber; an electrostatic chuck arranged on said support table, said electrostatic chuck including a conductive layer and an insulating layer formed on the conductive layer and constituting a substrate support surface; conductive support means, arranged in said chamber, for transferring the substrate onto said electrostatic chuck; plasma generating means for generating a plasma in said process chamber; and means for supplying a heat medium gas between the substrate and said electrostatic chuck, the method comprising the steps of: placing the substrate on said support means in said process chamber; applying a potential for electrostatic attraction to said electrostatic chuck; transferring the substrate onto the insulating layer of said electrostatic chuck by using said support means while said support means is grounded; releasing contact between the substrate and said support means; supplying the heat medium gas between the substrate and said electrostatic chuck; generating a plasma in said process chamber; and processing the substrate by using the plasma.
Claim 2
Dependent Claim
187 words
A plasma process method using a plasma process apparatus including: a process chamber capable of attaining vacuum; a support table for supporting a substrate to be processed in said process chamber; an electrostatic chuck arranged on said support table, said electrostatic chuck including a conductive layer and an insulating layer formed on the conductive layer and constituting a substrate support surface; conductive support means, arranged in said chamber, for transferring the substrate onto said electrostatic chuck; plasma generating means for generating a plasma in said process chamber; and means for supplying a heat medium gas between the substrate and said electrostatic chuck, the method comprising the steps of: placing the substrate on said support means in said process chamber; applying a potential for electrostatic attraction to said electrostatic chuck; transferring the substrate onto the insulating layer of said electrostatic chuck by using said support means while said support means is grounded; releasing contact between the substrate and said support means; supplying the heat medium gas between the substrate and said electrostatic chuck; generating a plasma in said process chamber; and processing the substrate by using the plasma.
Claim 3
Dependent Claim
28 words
A method according to claim 1, further comprising the step of setting said process chamber in a vacuum state before the potential is applied to said electrostatic chuck.
Claim 4
Dependent Claim
26 words
A method according to claim 1, wherein said support means is grounded through a switch, and said switch is turned off when the plasma is generated.
Claim 5
Dependent Claim
42 words
A method according to claim 1, wherein said support means includes a plurality of conductive support pins which vertically move to extend through said electrostatic chuck, said support pin retracting into said electrostatic chuck to be released from contact with the substrate.
Claim 6
Dependent Claim
35 words
A method according to claim 3, wherein said support means is connected to a driving portion therefor through an insulating member, and is electrically set in a floating state when said switch is turned off.
Claim 7
Dependent Claim
37 words
A method according to claim 1, wherein said support table and said process chamber form an electrode pair to generate the plasma, an RF power is applied to said support table, and said process chamber is grounded.
Claim 8
Dependent Claim
24 words
A method according to claim 1, wherein the potential for electrostatic attraction is a negative or positive potential supplied by a DC power source.
Claim 9
Dependent Claim
143 words
A plasma process method using a plasma process apparatus including: a process chamber capable of attaining vacuum; a support table for supporting a substrate to be processed in said process chamber; an electrostatic chuck arranged on said support table, said electrostatic chuck including a conductive layer and an insulating layer formed on the conductive layer and constituting a substrate support surface; and plasma generating means for generating a plasma in said process chamber, the method comprising the steps of: processing the substrate by using the plasma in said process chamber in which the plasma is generated, while the substrate is held by said electrostatic chuck; removing the substrate from said electrostatic chuck upon completion of the process; and removing charges from the substrate support surface when or after contact between the substrate and the substrate support surface of said electrostatic chuck is released.
Claim 10
Dependent Claim
143 words
A plasma process method using a plasma process apparatus including: a process chamber capable of attaining vacuum; a support table for supporting a substrate to be processed in said process chamber; an electrostatic chuck arranged on said support table, said electrostatic chuck including a conductive layer and an insulating layer formed on the conductive layer and constituting a substrate support surface; and plasma generating means for generating a plasma in said process chamber, the method comprising the steps of: processing the substrate by using the plasma in said process chamber in which the plasma is generated, while the substrate is held by said electrostatic chuck; removing the substrate from said electrostatic chuck upon completion of the process; and removing charges from the substrate support surface when or after contact between the substrate and the substrate support surface of said electrostatic chuck is released.
Claim 11
Dependent Claim
45 words
A method according to claim 8, wherein the step of removing the charges from the substrate support surface is performed by generating another plasma in said process chamber after the substrate is unloaded therefrom, and bringing a grounded conductor into contact with said other plasma.
Claim 12
Dependent Claim
37 words
A method according to claim 8, wherein an electron density of said other plasma used in the step of removing the charges is lower than that of the plasma used in the step of processing the substrate.
Claim 13
Dependent Claim
37 words
A method according to claim 8, wherein the step of removing the charges is performed by bringing the substrate support surface into direct contact with a grounded conductor after the substrate is unloaded from said process chamber.
Claim 14
Dependent Claim
30 words
A method according to claim 8, wherein the step of removing the charges is performed by causing a grounded conductive support means to remove the substrate from said electrostatic chuck.
Claim 15
Dependent Claim
45 words
A method according to claim 12, wherein said support means includes a plurality of conductive support pins which vertically move to extend through said electrostatic chuck, said support pins protruding from said electrostatic chuck to release contact between the substrate and the substrate support surface.
Claim 16
Dependent Claim
26 words
A method according to claim 13, wherein contact between the substrate on the substrate support surface and said support pins is held for a few seconds.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-05-09 | 1997-11-08 | 1998-05-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-05-09 | 2001-11-08 | 2002-05-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-05-09 | 2005-11-08 | 2006-05-10 | $7700.00 | Window Closed / Lapsed |