US5287290A
Expired / Lapsed
US
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Method and apparatus for checking a mask pattern
Assignee: Fujitsu Semiconductor Ltd
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Filing: 1992-12-10
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Granted: 1994-02-15
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Expires: 2012-12-10
Abstract
Abstract A method and an apparatus for checking a mask pattern including a plurality of mask pattern regions formed based on different design pattern rules. The method includes the steps of: defining each of the mask pattern regions as a check object region; setting a defect detection reference corresponding to a respective design pattern rule of the mask pattern regions for each of the check object regions; and detecting presence or absence of defects in the mask pattern based on the respective defect detection reference for each of the check object regions. By these steps, it is possible to realize reduction in check time of the mask pattern and improvement in throughput of the checking apparatus, without necessitating discrimination processing of pseudo defects in the mask pattern.
Inventors
- 👤 Katsuji Tabara
- 👤 Satoshi Akutagawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 13:18
CPC Classifications
G; G06; G06T; G06T7/00; G06T7/0002; G06T7/0004; G06T7/0006; G06F; G06F30/00; G06F30/30; G06F30/39; G06F30/398; G06T2207/00; G06T2207/30; G06T2207/30108; G06T2207/30148
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
155 words
A method of checking a mask pattern having a plurality of contiguous mask pattern regions, each of the mask pattern regions formed based on different design pattern rules, said method comprising the steps of: (a) respectively assigning the contiguous mask pattern regions to different contiguous check object regions; (b) setting a different defect detection reference for each of the different contiguous check object regions which correspond to respective ones of the different design pattern rules; (c) individually detecting presence or absence of defects in a relatively large one of the check object regions based on a relatively coarse defect detection reference corresponding to the relatively large check object region; and (d) based on the results of the detecting of said step (c), individually detecting presence or absence of defects in a relatively small one of the check object regions based on a relatively fine defect detection reference corresponding to the relatively small check object region.
Claim 2
Independent Claim
155 words
A method of checking a mask pattern having a plurality of contiguous mask pattern regions, each of the mask pattern regions formed based on different design pattern rules, said method comprising the steps of: (a) respectively assigning the contiguous mask pattern regions to different contiguous check object regions; (b) setting a different defect detection reference for each of the different contiguous check object regions which correspond to respective ones of the different design pattern rules; (c) individually detecting presence or absence of defects in a relatively large one of the check object regions based on a relatively coarse defect detection reference corresponding to the relatively large check object region; and (d) based on the results of the detecting of said step (c), individually detecting presence or absence of defects in a relatively small one of the check object regions based on a relatively fine defect detection reference corresponding to the relatively small check object region.
Claim 3
Dependent Claim
44 words
A method as set forth in claim 1, wherein said detecting steps (c) and (d) each comprise detecting substeps, a sum of a number of the detecting substeps of both steps (b) and (c) being equal to a number of the check object regions.
Claim 4
Dependent Claim
71 words
A method as set forth in claim 1, further comprising the steps of: (e) scanning the entire mask pattern to input an image before said step (c); (f) judging whether or not a scanning point enters a check object region corresponding to a different defect detection reference; and (g) changing a current defect detection reference to a defect detection reference corresponding to the check object region which the scanning point enters.
Claim 5
Independent Claim
181 words
An apparatus for checking a mask pattern including a plurality of contiguous mask pattern regions formed based on different design pattern rules, said apparatus comprising: first means for storing a defect detection reference corresponding to each of the design pattern rules; second means for determining a resolution of features in each of a plurality of contiguous check object regions based on the defect detection reference for each of the design pattern rules stored in said first means; third means for acquiring an image of a mask pattern to be checked; and fourth means for individually comparing a relatively large one of the check object regions of the image acquired by said third means with a relatively coarse defect detection reference corresponding to the relatively large check object region set by the second means, judging a result of the comparing and, depending on a result of the judging, individually comparing a relatively small one of the check object regions of the image acquired by said third means with a relatively fine defect detection reference corresponding to the relatively small check object region.
Claim 6
Independent Claim
181 words
An apparatus for checking a mask pattern including a plurality of contiguous mask pattern regions formed based on different design pattern rules, said apparatus comprising: first means for storing a defect detection reference corresponding to each of the design pattern rules; second means for determining a resolution of features in each of a plurality of contiguous check object regions based on the defect detection reference for each of the design pattern rules stored in said first means; third means for acquiring an image of a mask pattern to be checked; and fourth means for individually comparing a relatively large one of the check object regions of the image acquired by said third means with a relatively coarse defect detection reference corresponding to the relatively large check object region set by the second means, judging a result of the comparing and, depending on a result of the judging, individually comparing a relatively small one of the check object regions of the image acquired by said third means with a relatively fine defect detection reference corresponding to the relatively small check object region.
Claim 7
Dependent Claim
43 words
An apparatus as set forth in claim 4, wherein said second means comprises means for judging a check object region based on information concerning coordinates and positions, and means for determining a corresponding defect detection reference according to the judged check object region.
References Cited (Backward Citations)
US4600996A
Cited
US4559603A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-02-14 | 1997-08-16 | 1998-02-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-02-14 | 2001-08-16 | 2002-02-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-02-14 | 2005-08-16 | 2006-02-15 | $7700.00 | Window Closed / Lapsed |