Method of manufacturing MDS memory device having a LDD structure and a visor-like insulating layer

Claim 2

A process for producing a MOS transistor having a dual gate structure, comprising the steps of: forming a first gate insulating layer on a major surface of a semiconductor substrate, forming a first electrically conductive layer on said first gate insulating layer, forming a second gate insulating layer on said first electrically conductive layer, forming a third insulating layer on the major surface of a semiconductor substrate said third insulating layer having a main surface, forming an etching mask of a predetermined shape on the main surface of said third insulating layer, patterning said third insulating layer and the second insulating layer by a first etching method by using said etching mask, patterning said first electrically conductive layer by using a second etching method having an etching selectivity different from that in the first etching method to form a first gate electrode narrower than the patterned third insulating layer, implanting impurity ions diagonally into the major surface of said semiconductor substrate by utilizing said patterned third insulating layer and said first gate electrode as masks to form an impurity region of lower concentration in said semiconductor substrate, implanting impurity ions substantially vertically into the major surface of said semiconductor substrate by utilizing the patterned third insulating layer as a mask, and forming a second gate electrode on said second gate insulating layer.

Claim 3

The process according to claim 1, wherein said first etching method employed for said third insulating layer and said second insulating layer and said second etching method employed for said first electrically conductive layer are performed by plasma etching employing different etching gases.

Claim 4

The process according to claim 2, wherein the step of forming the impurity region of lower concentration by utilizing the patterned third insulating layer further comprises the steps of: forming a thermally oxidized film on a lateral surface of said first gate electrode and on the main surface of said third insulating layer by a thermal oxidization method, and implanting impurity ions substantially vertically into said semiconductor substrate using said thermally oxidized film and said third insulating layer covered by said thermally oxidized film as masks.

Claim 5

The process according to claim 2, further comprising said step of forming an impurity region of higher concentration by utilizing the patterned third insulating layer including the substep of: implanting impurity ions substantially vertically into said semiconductor substrate using the patterned third insulating layer as a mask to form an impurity region of a higher concentration, and forming a thermally oxidized film on a lateral surface of said first gate electrode and the main surface of said third insulating layer.

Claim 6

A process for producing a memory transistor of a dual gate structure of a non-volatile semiconductor memory device, comprising the steps of: forming a first gate insulating layer on a major surface of a semiconductor substrate, forming a first electrically conductive layer on said first gate insulating layer, forming a second gate insulating layer on said first electrically conductive layer, forming a nitride layer on the major surface of a semiconductor substrate said nitride layer having a main surface, forming an etching mask of a predetermined shape on the main surface of said nitride layer, patterning said nitride layer and the second insulating layer by a first etching method by using said etching mask, patterning said first electrically conductive layer by using a second etching method having an etching selectivity different from that in the first etching method and using said mask to form a first gate electrode narrower than the patterned nitride layer, implanting impurity ions obliquely into the major surface of said semiconductor substrate, using the patterned nitride layer and the first gate electrode as masks to form an impurity region of lower concentration in said semiconductor substrate, forming a thermally oxidized film on a lateral surface of said first gate electrode and the main surface of said nitride layer by using a thermal oxidation method, and implanting impurity ions substantially vertically into the major surface of said semiconductor substrate by utilizing the patterned nitride film layer as a mask, and forming a second gate electrode on the main surface of the nitride layer covered by said thermally oxidized layer.

Claim 7

A process for producing a memory transistor of a dual gate structure of a non-volatile semiconductor memory device, comprising the steps of: forming a first gate insulating layer on a major surface of a semiconductor substrate, forming a first electrically conductive layer on said first gate insulating layer, forming a second gate insulating layer on said first electrically conductive layer, forming a nitride layer on the major surface of a semiconductor substrate said nitride layer having a main surface, forming an etching mask of a predetermined shape on the main surface of said nitride layer, patterning said nitride layer and the second insulating layer by a first etching method by using said etching mask, patterning said first electrically conductive layer by using a second etching method having an etching selectivity different from that in the first etching method and using said mask to form a first gate electrode narrower than the patterned nitride layer, implanting impurity ions obliquely into the major surface of said semiconductor substrate, using the patterned nitride layer and the first gate electrode as masks to form an impurity region of lower concentration in said semiconductor substrate, forming a thermally oxidized film on a lateral surface of said first gate electrode and the main surface of said nitride layer by using a thermal oxidation method, and implanting impurity ions substantially vertically into the major surface of said semiconductor substrate by utilizing the patterned nitride film layer as a mask, and forming a second gate electrode on the main surface of the nitride layer covered by said thermally oxidized layer.

Claim 8

The process according to claim 5, wherein said first etching method employed for said nitride layer and said second insulating layer and said second etching employed for said first electrically conductive layer are performed by plasma etching employing different etching gases.