US5285082A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated test circuits having pads provided along scribe lines
Assignee: US Philips Corp
•
Filing: 1993-01-22
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Granted: 1994-02-08
•
Expires: 2013-01-22
Abstract
Abstract Integrated circuits sometimes include, in addition to the connection surfaces provided for normal operation, additional test pads through which test signals can be put in or read out during testing on the wafer. These connection pads require additional space on the semiconductor slice, so that fewer circuits can be accommodated on a semiconductor slice of a given size. It is proposed to provide the test pads in a row at one or two sides of the circuit and connect them with two adjoining circuits. The cut for separating the chips after manufacture and the test can then take place through these test pads, so that the latter require only little extra space. Advantageously, adjoining circuits will have layouts which are one another's mirrored images.
Inventors
- 👤 Klaus Axer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 22:09
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/2205; G06F11/2236; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318505; G01R31/318511; H; H10; H10P; H10P74/00; H10P74/27; H10P74/273
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
174 words
An integrated circuit which is manufactured on a semiconductor slice jointly with a number of similar adjoining circuits and then separated from these by cutting, each circuit being provided at its rim with a plurality of connection pads, a selected number of which are used exclusively for testing at least the first-mentioned circuit before it is separated from the adjoining circuits, wherein all connection pads used only for testing are arranged at and in physical contact with at least one side of said first-mentioned circuit, are shared with and in physical contact with another circuit adjoining said at least one side on the semiconductor slice during manufacture and are connected to both circuits adjoining said at least one side, said first-mentioned circuit and said another circuit have arrangements which are the mirror images of each other about an axis extending along the side at which the connection pads which are shared are arranged, and the cut for separating the first-mentioned circuit from the adjoining circuits runs through said connection pads used only for testing.
Claim 2
Dependent Claim
174 words
An integrated circuit which is manufactured on a semiconductor slice jointly with a number of similar adjoining circuits and then separated from these by cutting, each circuit being provided at its rim with a plurality of connection pads, a selected number of which are used exclusively for testing at least the first-mentioned circuit before it is separated from the adjoining circuits, wherein all connection pads used only for testing are arranged at and in physical contact with at least one side of said first-mentioned circuit, are shared with and in physical contact with another circuit adjoining said at least one side on the semiconductor slice during manufacture and are connected to both circuits adjoining said at least one side, said first-mentioned circuit and said another circuit have arrangements which are the mirror images of each other about an axis extending along the side at which the connection pads which are shared are arranged, and the cut for separating the first-mentioned circuit from the adjoining circuits runs through said connection pads used only for testing.
Claim 3
Dependent Claim
48 words
An integrated circuit as claimed in claim 1, wherein a plurality of connection pads provided for the operation of the first-mentioned circuit are provided in twofold in a mirror-imaged sequence with respect to the centerline of the first-mentioned circuit parallel to the side having the shared connection pads.
Claim 4
Dependent Claim
56 words
An integrated circuit as claimed in claim 1, wherein at least those of said connection pads which are common to said first-mentioned circuit and said another circuit before separation of the circuits and which represent inputs, are each connected to a pole of the operating voltage by a conducting element while the operating voltage is applied.
References Cited (Backward Citations)
JPS5952860A
Cited
JPS61187354A
Cited
JPS6231148A
Cited
JPS6281724A
Cited
US5051807A
Cited
JPH01276735A
Cited
US5003374A
Cited
JPH0211648A
Cited
JPH0235356A
Cited
US5047711A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-02-07 | 1997-08-09 | 1998-02-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-02-07 | 2001-08-09 | 2002-02-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-02-07 | 2005-08-09 | 2006-02-08 | $7700.00 | Window Closed / Lapsed |