Automated radius measurement apparatus

Claim 2

Apparatus for automatically measuring the radius of curvature of convex or concave surfaces, said apparatus comprising: means for supporting and positioning a surface to be measured in a predetermined position with its center of curvature lying substantially along a longitudinally extending axis; means for forming an extended real image having periodic structure in an image plane and automatically moving said extended real image along said longitudinal axis in response to at least one command, toward and away from the surface, such that said surface forms a reflected image of said extended real image, the quality of focus and said periodic structure thereof varying as a function of the position of said extended real image with respect to said surface; means for automatically evaluating said quality of focus and periodic structure of said reflected image in said image plane and generating an electrical signal whose amplitude varies in accordance with variations in said quality of focus and periodic structure of said reflected image as said extended real image is automatically moved along said longitudinal axis, said electrical signal peaking as said extended real image passes through a first position along said longitudinal axis corresponding to the center of curvature of the surface and a second position along said longitudinal axis corresponding to the vertex of the surface; and means for automatically monitoring said electrical signal and determining the distance between said first and second positions where said electrical signal peaks, which distance equals the radius of curvature of the surface.

Claim 3

The apparatus of claim 1 wherein said means for supporting and positioning a surface to be measured comprises three balls.

Claim 4

The apparatus of claim 1 wherein said means for forming an extended real image in an image plane and automatically moving said extended real image along said longitudinal axis comprises: (a) an optical head that is mounted for movement as a unit along said longitudinal axis; and (b) means for selectively driving said optical head along said longitudinal axis toward and away from the surface to be measured so that, as said extended real image passes through the surface's center of curvature and vertex, it is reflected off the surface and back along said longitudinal axis with optimal contrast.

Claim 5

The apparatus of claim 3 wherein said optical head comprises: (a) a target; (b) a source for illuminating said target; (c) an objective lens for imaging said target in said image plane which is at a predetermined location from said optical head as measured along said longitudinal axis; (d) detector means; (e) means for combining the optical path between said target and said detector means so that both can view along said longitudinal axis toward the surface to be measured as said optical head moves toward and away from the surface to be measured.

Claim 6

The apparatus of claim 4 wherein said target comprises a grating oriented along a single azimuth.

Claim 7

The apparatus of claim 5 wherein said grating has a spatial frequency in the range between 1 and 400 line pairs per centimeter.

Claim 8

The apparatus of claim 5 wherein said source comprises an LED.

Claim 9

The apparatus of claim 5 wherein said detector means comprises a single photodiode and a grating associated with said photodiode and positioned upstream of said photodiode.

Claim 10

The apparatus of claim 8 wherein said target grating rotates and said grating associated with said photodiode is fixed.

Claim 11

The apparatus of claim 5 wherein said means for combining the optical paths between said target and said detector means comprises a beamsplitter located between said detector means and said location at which said real image is formed.

Claim 12

The apparatus of claim 3 wherein said extended real real image is formed by periodically interrupting a light source with a rotating grating to provide a changing pattern of illumination.

Claim 13

The apparatus of claim 3 wherein said means for selectively driving said optical head along said longitudinal axis comprises a precision lead screw coupled with said optical head and a stepper motor for rotating said lead screw in precise angular increments.

Claim 14

The apparatus of claim 1 wherein said means for supporting and locating a surface to be measured further includes means for rotating the surface so that its radius of curvature can be measured along different angular azimuths.

Claim 15

The apparatus of claim 1 wherein said means for monitoring and determining the radius of curvature comprises a general purpose computer and an input/output board configured to sample said signal as a function of the position of said image, fit a curve to it to establish said peaks, and calculate the distance between said peaks.

Claim 16

The apparatus of claim 1 further including a housing and wherein said means for supporting and positioning a surface to be measured is arranged with respect to said housing so that a surface to be measured lies external to said housing and wherein said means for forming and moving an extended real image along said longitudinal axis is arranged with respect to said housing so that said extended real image moves towards and away from the surface substantially inside of said housing.

Claim 17

The apparatus of claim 1 wherein said periodic structure of said extended real image has a predetermined spatial frequency and the measure of said quality of focus and periodic structure of said reflected image is its contrast at said predetermined spatial frequency.

Claim 18

Apparatus for measuring the flange focal length of a positive lens, said apparatus comprising: means for defining a reflective reference surface along a longitudinally extending reference axis; a retroreflector positioned a fixed distance along said reference axis with its optical axis aligned therewith; means for supporting and positioning a test lens above said reference surface at a test station between it and said retroreflector so that its optical axis is in alignment with said reference axis and its mounting flange position with respect to said reference surface is determinable; means for forming an extended real image in an image plane and automatically moving said extended real image along said longitudinal axis, toward and away from the positive lens, such that a reflected image of said extended real image is formed along said longitudinal axis, the quality of focus of which varies as a function of the position of said extended real image with respect to the positive lens; means for evaluating said quality of focus of said reflected image in said image plane and generating an electrical signal whose amplitude varies in accordance with variations in said quality of said reflected image and peaks as said extended real image passes through a first position along said longitudinal axis corresponding to the vertex of said reference surface and a second position along said longitudinal axis corresponding to the focal point of the positive lens; and means for monitoring said electrical signal and determining the distance between said first and second positions where said electrical signal peaks, which distance correlates with the flange focal length of the positive lens.

Claim 19

Apparatus for measuring the flange focal length of a positive lens, said apparatus comprising: means for defining a reflective reference surface along a longitudinally extending reference axis; a retroreflector positioned a fixed distance along said reference axis with its optical axis aligned therewith; means for supporting and positioning a test lens above said reference surface at a test station between it and said retroreflector so that its optical axis is in alignment with said reference axis and its mounting flange position with respect to said reference surface is determinable; means for forming an extended real image in an image plane and automatically moving said extended real image along said longitudinal axis, toward and away from the positive lens, such that a reflected image of said extended real image is formed along said longitudinal axis, the quality of focus of which varies as a function of the position of said extended real image with respect to the positive lens; means for evaluating said quality of focus of said reflected image in said image plane and generating an electrical signal whose amplitude varies in accordance with variations in said quality of said reflected image and peaks as said extended real image passes through a first position along said longitudinal axis corresponding to the vertex of said reference surface and a second position along said longitudinal axis corresponding to the focal point of the positive lens; and means for monitoring said electrical signal and determining the distance between said first and second positions where said electrical signal peaks, which distance correlates with the flange focal length of the positive lens.

Claim 20

The apparatus of claim 17 wherein said extended real real image is formed by periodically interrupting a light source with a rotating grating to provide a changing pattern of illumination.

Claim 21

The apparatus of claim 17 wherein said reference surface is a flat.

Claim 24

The method of claim 20 further comprising the step of measuring the radii of curvatures of additional surfaces by measuring the difference in the position of their centers of curvature from the position of the center of curvature of a first measured surface, determining the differences in their sagitta compared with that of the first measured surface, and calculating their radii of curvatures on the basis of the relationship between the radius of curvature and saggital height of a spherical surface.