US5280236A
Expired / Lapsed
US
⏱️ 0.0 years remaining
IC test instrument
Assignee: Seiko Electronic Components Ltd
•
Filing: 1992-01-22
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Granted: 1994-01-18
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Expires: 2012-01-22
Abstract
Abstract An IC test instrument has an IC test circuit for an integrated semiconductor chip. A probe card is coupled to the IC test circuit. Probe needles are disposed on the probe card. The probe needles comprise a cobalt-based alloy containing at least 10 weight-percent of chromium. A passive-state film comprised of chromium oxide is formed on one end of the probe needles, and a solder-enhancing metallic layer is formed on the other end of the probe needles. The passive-state film may be formed by electrolytic polishing or chemical solution immersion. The passive-state film prevents a contaminating substance, such as aluminum oxide, from adhering to the needle. The probe needle substrate may be bent and may be formed by wiredrawing a cobalt-based alloy.
Inventors
- 👤 Osamu Takahashi
- 👤 Kazuo Yoshida
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 07:26
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06711
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
75 words
An IC test instrument, comprising: an IC test circuit for an integrated semiconductor chip; a probe card coupled to the IC test circuit; and probe needles disposed on the probe card, the probe needles comprising a cobalt-based alloy containing at least 10 weight-percent of chromium, a passive-state film comprised mainly of chromium oxide formed on one end of the probe needles, and a solder-enhancing metallic layer formed on the other end of the probe needles.
Claim 2
Dependent Claim
75 words
An IC test instrument, comprising: an IC test circuit for an integrated semiconductor chip; a probe card coupled to the IC test circuit; and probe needles disposed on the probe card, the probe needles comprising a cobalt-based alloy containing at least 10 weight-percent of chromium, a passive-state film comprised mainly of chromium oxide formed on one end of the probe needles, and a solder-enhancing metallic layer formed on the other end of the probe needles.
Claim 3
Dependent Claim
26 words
An IC test instrument according to claim 1; wherein the passive-state film is formed by at least one of an electrolytic polishing and chemical solution immersion.
Claim 4
Dependent Claim
44 words
A probe needle comprising: a cobalt-based alloy containing at least 10 weight-percent of chromium, a passive-state film comprised mainly of chromium oxide formed on one end of the probe needle, and a solder-enhancing metallic layer formed on the other end of the probe needle.
Claim 5
Dependent Claim
44 words
A probe needle comprising: a cobalt-based alloy containing at least 10 weight-percent of chromium, a passive-state film comprised mainly of chromium oxide formed on one end of the probe needle, and a solder-enhancing metallic layer formed on the other end of the probe needle.
Claim 6
Dependent Claim
25 words
A probe needle according to claim 3, wherein the passive-state film is formed by at least one of an electrolytic polishing and chemical solution immersion.
Claim 7
Dependent Claim
16 words
A probe needle according to claim 3, wherein the passive-state film comprises an electrolytically polished film.
Claim 8
Dependent Claim
18 words
A probe needle according to claim 3, wherein the passive-state film is formed by immersion in a solution.
Claim 9
Dependent Claim
15 words
A probe needle according to claim 3, wherein the probe needle has a bent shape.
References Cited (Backward Citations)
US3818163A
Cited
US4067379A
Cited
US4777335A
Cited
US4891480A
Cited
US5084672A
Cited
US4983908A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-01-17 | 1997-07-19 | 1998-01-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-01-17 | 2001-07-19 | 2002-01-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-01-17 | 2005-07-19 | 2006-01-18 | $7700.00 | Window Closed / Lapsed |