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US5278726A Expired / Lapsed US ⏱️ 0.0 years remaining

Method and apparatus for partially overmolded integrated circuit package

Assignee: NXP USA Inc
•
Filing: 1992-01-22
•
Granted: 1994-01-11
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Expires: 2012-01-22
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Abstract

Abstract A partially overmolded integrated circuit package (10) comprises a substrate (14) having circuit traces (11) and a semiconductor die receiving area (15) for attachment of a semiconductor die to the semiconductor die receiving area. Conductive bumps (18) are then applied to a plurality of contact pads on the semiconductor die. Then overmolding compound (16) is applied over the semiconductor die and a portion of the conductive bumps, leaving a portion of the conductive bumps partially exposed (19). Finally, interconnections (13) between the exposed portion of the conductive bumps and the circuit traces of the substrate are formed.

Inventors

  • 👤 Lonnie L. Bernardoni
  • 👤 Thomas J. Swirbel
  • 👤 John K. Arledge

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 08:58
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/111; H10W74/114; H10W74/01; H10W72/00; H10W72/20; H10W72/251; H10W72/252; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/551; H10W72/552; H10W72/5522; H10W72/555; H10W90/00; H10W90/701; H10W90/751; H10W90/754

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 103 words
A method for forming a partially overmolded integrated circuit package, comprising the steps of: (a) providing a substrate having conductive circuit runners; (b) attaching a semiconductor die having contact pads to the substrate; (c) applying conductive bumps to the contact pads of the semiconductor die; (d) transfer molding a resin over the semiconductor die and a first lower portion of each conductive bump, so as to leave a second upper portion of each conductive bump exposed and elevated above the uppermost surface of the transfer molded resin; (e) electrically interconnecting the second upper portion of each conductive bump to the conductive circuit runners.
Claim 2
Independent Claim 103 words
A method for forming a partially overmolded integrated circuit package, comprising the steps of: (a) providing a substrate having conductive circuit runners; (b) attaching a semiconductor die having contact pads to the substrate; (c) applying conductive bumps to the contact pads of the semiconductor die; (d) transfer molding a resin over the semiconductor die and a first lower portion of each conductive bump, so as to leave a second upper portion of each conductive bump exposed and elevated above the uppermost surface of the transfer molded resin; (e) electrically interconnecting the second upper portion of each conductive bump to the conductive circuit runners.
Claim 3
Dependent Claim 13 words
The method of claim 1, wherein said conductive bumps are comprised of gold.
Claim 4
Dependent Claim 16 words
The method of claim 1, wherein said transfer molded resin is a thermoset epoxy molding compound.
Claim 5
Dependent Claim 17 words
The method of claim 1, wherein said transfer molded resin has sloped sides to allow for photolithography.
Claim 6
Dependent Claim 22 words
The method of claim 1, wherein said conductive bumps are coupled to the circuit runners of the substrate using thin film photolithography.
Claim 7
Dependent Claim 17 words
The method of claim 1, wherein said method further comprises the step of flattening the conductive bump.
Claim 8
Dependent Claim 107 words
A partially overmolded integrated circuit package, comprising: a substrate having circuit traces and a semiconductor die receiving area; a semiconductor die having contact pads, for placement on the semiconductor die receiving area; means for attaching the semiconductor die to the substrate; conductive bumps applied to the contact pads of the semiconductor die; transfer molded resin over the semiconductor die and a first lower portion of the conductive bumps, leaving a second upper portion of the conductive bumps partially exposed and elevated above the uppermost surface of the transfer molded resin; interconnections between the second upper portion of the conductive bumps and the circuit traces of the substrate.
Claim 9
Dependent Claim 107 words
A partially overmolded integrated circuit package, comprising: a substrate having circuit traces and a semiconductor die receiving area; a semiconductor die having contact pads, for placement on the semiconductor die receiving area; means for attaching the semiconductor die to the substrate; conductive bumps applied to the contact pads of the semiconductor die; transfer molded resin over the semiconductor die and a first lower portion of the conductive bumps, leaving a second upper portion of the conductive bumps partially exposed and elevated above the uppermost surface of the transfer molded resin; interconnections between the second upper portion of the conductive bumps and the circuit traces of the substrate.
Claim 10
Dependent Claim 13 words
The package of claim 7, wherein said conductive bumps are comprised of gold.
Claim 11
Dependent Claim 15 words
The package of claim 7 wherein said overmolding compound comprises a thermoset epoxy molding compound.
Claim 12
Dependent Claim 20 words
The package of claim 7, wherein said transfer molded resin is formed to have sloped sides to allow for photolithography.
Claim 13
Dependent Claim 22 words
The package of claim 7, wherein said conductive bumps are coupled to the circuit traces of the substrate with thin film metallization.
Claim 14
Dependent Claim 11 words
The package of claim 7, wherein said conductive bumps are flattened.
Claim 15
Dependent Claim 117 words
A partially overmolded integrated circuit package, comprising: a printed circuit board having conductive circuit traces and a semiconductor die receiving area; a semiconductor die attached to the semiconductor die receiving area, said semiconductor die having contact pads; conductive bumps applied to the contact pads of the semiconductor die; transfer molded resin over the semiconductor die and a first lower portion of the conductive bumps, leaving a second upper portion of the conductive bumps partially exposed and elevated above the uppermost surface of the transfer molded resin, and the transfer molded resin not covering the substrate conductive circuit traces; and thin film interconnections between the second upper portion of the conductive bumps and the substrate conductive circuit traces.
Claim 16
Dependent Claim 117 words
A partially overmolded integrated circuit package, comprising: a printed circuit board having conductive circuit traces and a semiconductor die receiving area; a semiconductor die attached to the semiconductor die receiving area, said semiconductor die having contact pads; conductive bumps applied to the contact pads of the semiconductor die; transfer molded resin over the semiconductor die and a first lower portion of the conductive bumps, leaving a second upper portion of the conductive bumps partially exposed and elevated above the uppermost surface of the transfer molded resin, and the transfer molded resin not covering the substrate conductive circuit traces; and thin film interconnections between the second upper portion of the conductive bumps and the substrate conductive circuit traces.
Claim 17
Dependent Claim 13 words
The package of claim 13, wherein said conductive bumps are comprised of gold.
Claim 18
Dependent Claim 16 words
The package of claim 13 wherein said transfer molded resin comprises a thermoset epoxy molding compound.
Claim 19
Dependent Claim 20 words
The package of claim 13, wherein said transfer molded resin is formed to have sloped sides to allow for photolithography.
Claim 20
Dependent Claim 22 words
The package of claim 13, wherein said conductive bumps are coupled to the circuit traces of the substrate with thin film metallization.
Claim 21
Dependent Claim 11 words
The package of claim 13, wherein said conductive bumps are flattened.

References Cited (Backward Citations)

US3903590A Cited
US4199777A Cited
US5091769A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-01-10 1997-07-12 1998-01-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-01-10 2001-07-12 2002-01-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-01-10 2005-07-12 2006-01-11 $7700.00 Window Closed / Lapsed

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