Cantilever for a scanning probe microscope and a method of manufacturing the same

Claim 1

A cantilever for a scanning probe microscope, comprising: a lever section having a free end portion; and a probe section disposed at the free end portion of the lever section, said probe section including: a proximal portion and a distal portion which are integrally formed of a material, the proximal portion having: a first end connected to the free end portion of the lever section, a second end opposite to the first end thereof, and converging side surfaces extending from the first end to the second end; the distal portion having: a first end connected to the second end of the proximal portion, a second end opposite to the first end of the distal portion, the second end of the distal portion being shaped into a tip having a narrow point angle, and converging side surfaces extending from the first end of the distal portion to the second end of the distal portion; and convergent angles of the side surfaces of the proximal portion at the second end of the proximal portion are larger than convergent angles of the side surfaces of the distal portion at the first and second ends of the distal portion; wherein the cross-sectional shape of the second end of the proximal portion is substantially the same as the cross-sectional shape of the first end of the distal portion; wherein the convergent angles of the second end of the proximal portion change abruptly to the convergent angles of the first end of the distal portion; wherein the convergent angles of the second end of the proximal portion are smaller than 180°; wherein the proximal portion substantially has a shape selected from the group consisting of a truncated hemisphere, a truncated cone, and a truncated pyramid; and wherein the proximal and distal portions are made of a material containing silicon.