US5268645A
Expired / Lapsed
US
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Method of and apparatus for testing circuit boards and the like with an inhomogeneous electric field
Assignee: atg electronic GmbH
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Filing: 1992-04-10
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Granted: 1993-12-07
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Expires: 2012-04-10
Abstract
Abstract Selected test points of conductors on the substrate of a printed circuit board are tested by positioning the circuit board adjacent an array of electrodes or by utilizing a set of conductors in or on the substrate as an array of electrodes. An electric potential is set up by applying an inhomogeneous electric field to the array of electrodes or to the conductors to be tested, and signals denoting the characteristics of the electric potential are generated. Such signals are evaluated by a suitable circuit, for example, by comparing them with reference signals which are indicative of passable or non-defective conductors, i.e., of conductors which are devoid of open and/or short circuits, or by comparing the generated signals with each other. Test probes are utilized to apply an electric field to the conductors to be tested and/or to transmit signals to the evaluating circuit.
Inventors
- 👤 Manfred Prokoff
- 👤 Alexandr C. Schen
- 👤 Andrey J. Poskatscheev
- 👤 Evgeniy O. Janenko
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 17:38
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2801; G01R31/2805
Claims Analysis
Total Claims: 40
Claim 1
Independent Claim
75 words
Apparatus for testing electric conductors on a substrate for defects including open and short circuits, comprising means for producing an electric field of non-uniform field strength which can induce unequal electric potentials in electric conductors located in different parts of the field; means for generating signals representative of the induced electric potentials; and means for evaluating said signals to establish whether an induced electric potential is indicative of a defect in one of said conductors.
Claim 2
Dependent Claim
75 words
Apparatus for testing electric conductors on a substrate for defects including open and short circuits, comprising means for producing an electric field of non-uniform field strength which can induce unequal electric potentials in electric conductors located in different parts of the field; means for generating signals representative of the induced electric potentials; and means for evaluating said signals to establish whether an induced electric potential is indicative of a defect in one of said conductors.
Claim 3
Dependent Claim
16 words
The apparatus of claim 1, wherein said signal generating means includes at least one test probe.
Claim 4
Dependent Claim
14 words
The apparatus of claim 1, wherein said producing means includes an array of electrodes.
Claim 5
Dependent Claim
34 words
The apparatus of claim 3, wherein said array includes a plurality of electrodes and said producing means further comprises a voltage generator and means for connecting said generator with selected electrodes of said array.
Claim 6
Dependent Claim
39 words
The apparatus of claim 1, wherein one of said producing means and signal generating means comprises an array of electrodes which are disposed in a plane adjacent a testing station receiving a substrate for electric conductors to be tested.
Claim 7
Dependent Claim
29 words
The apparatus of claim 1, wherein one of said producing means and signal generating means comprises a deformable sheet-like carrier, and an array of electrodes mounted on said carrier.
Claim 8
Dependent Claim
13 words
The apparatus of claim 6, wherein said electrodes include strips of conductive material.
Claim 9
Dependent Claim
43 words
The apparatus of claim 6, further comprising a support for a substrate carrying electric conductors to be tested, and means for pneumatically urging said carrier against the substrate when the substrate is on said support and said carrier is juxtaposed with the substrate.
Claim 10
Dependent Claim
14 words
The apparatus of claim 8, wherein said urging means includes a suction generating device.
Claim 11
Dependent Claim
41 words
The apparatus of claim 6, wherein at least one of said producing means and signal generating means comprises at least one test probe for effecting penetration of said carrier so as to contact at least one test point of a conductor.
Claim 12
Dependent Claim
41 words
The apparatus of claim 1, wherein at least one of said producing means and signal generating means comprises at least one probe and means for moving said at least one probe in three directions which are inclined relative to each other.
Claim 13
Dependent Claim
51 words
The apparatus of claim 11, wherein said moving means includes means for moving said at least one test probe in a predetermined plane in two of said directions and in the third of said directions, substantially at right angles to said plane, toward and away from the conductors to be tested.
Claim 14
Dependent Claim
36 words
The apparatus of claim 1, wherein one of said producing means signal generating means comprises an array of electrodes, a voltage generator and a multiplexer arranged to connect said generator with selected electrodes of said array.
Claim 15
Dependent Claim
22 words
The apparatus of claim 13, wherein said multiplexer is connected with and is arranged to receive control signals from said evaluating means.
Claim 16
Dependent Claim
39 words
The apparatus of claim 1 for testing a first set of electric conductors on a substrate which further carries a second set of conductors, one of said producing means and signal generating means including said second set of conductors.
Claim 17
Dependent Claim
29 words
The apparatus of claim 1, wherein one of said producing means and signal generating means comprises an array of electrodes on a substrate for the conductors to be tested.
Claim 18
Dependent Claim
48 words
The apparatus of claim 1 for testing electric conductors which form at least one first layer which is carried by a substrate, one of said producing means and signal generating means comprising an array of electrodes forming at least one second layer which is carried by the substrate.
Claim 19
Independent Claim
80 words
A method of testing electrical conductors on a substrate for electric defects including open and short circuits, comprising the steps of producing a non-uniform electric field to induce unequal electric potentials in selected conductors; generating signals representative of the electric potentials; and evaluating said signals to establish whether an induced electric potential is indicative of a defect in one of said selected conductors, said evaluating step including comparing the generated signals with one another, with reference signals or with both.
Claim 20
Independent Claim
80 words
A method of testing electrical conductors on a substrate for electric defects including open and short circuits, comprising the steps of producing a non-uniform electric field to induce unequal electric potentials in selected conductors; generating signals representative of the electric potentials; and evaluating said signals to establish whether an induced electric potential is indicative of a defect in one of said selected conductors, said evaluating step including comparing the generated signals with one another, with reference signals or with both.
Claim 21
Dependent Claim
24 words
The method of claim 18, wherein said producing step includes exposing the selected conductors to an electric field produced by an array of electrodes.
Claim 22
Dependent Claim
36 words
The method of claim 18, wherein the selected conductors define an array of electrodes and said producing step includes supplying voltage impulses to additional conductors and positioning the array of electrodes in the resulting electric field.
Claim 23
Dependent Claim
24 words
The method of claim 18, wherein said signal generating step includes contacting selected test points of the conductors with at least one conductive element.
Claim 24
Dependent Claim
16 words
The method of claim 21, wherein the at least one conductive element is a test probe.
Claim 25
Dependent Claim
26 words
The method of claim 22, wherein the test probe is a twin test probe having two current conducting sections which are electrically insulated from each other.
Claim 26
Dependent Claim
19 words
The method of claim 23, wherein the sections are separated from each other by a layer of insulating material.
Claim 27
Dependent Claim
23 words
The method of claim 23, wherein said signal generating step includes carrying out a guarding step with a plurality of twin test probes.
Claim 28
Dependent Claim
79 words
The method of claim 23, further comprising the step of moving a substrate carrying the selected conductors to a predetermined position prior to said producing step, including contacting at least one conductor with the twin probe, connecting the probe with a source of testing current, and changing the positions of the at least one conductor and the probe relative to each other until the testing current flows through the at least one conductor between the sections of the probe.
Claim 29
Dependent Claim
27 words
The method of claim 26, further comprising the step of generating a defect signal in the absence of current flow between the sections of the test probe.
Claim 30
Dependent Claim
29 words
The method of claim 26, further comprising the steps of repeating said contacting, connecting and position changing steps in connection with at least one additional conductor on the substrate.
Claim 31
Dependent Claim
46 words
The method of claim 18, further comprising the step of moving a substrate carrying the selected conductors to a predetermined position prior to said producing step, including optically detecting the position of the substrate and comparing the detected position with the position of a reference substrate.
Claim 32
Dependent Claim
14 words
The method of claim 29, wherein the reference substrate has a light transmitting board.
Claim 33
Dependent Claim
53 words
The method of claim 18 of testing a plurality of the selected conductors which should be electrically insulated from each other, wherein said producing step includes applying an electric field to each of said plurality of conductors and said evaluating step includes comparing the signals for said plurality of conductors with each other.
Claim 34
Dependent Claim
27 words
The method of claim 31, wherein said comparing of the signals for said plurality of conductors includes ascertaining the identity or lack of identity of the signals.
Claim 35
Dependent Claim
27 words
The method of claim 31, wherein said comparing of the signals for said plurality of conductors includes ascertaining the differences or lack of differences between the signals.
Claim 36
Dependent Claim
57 words
The method of claim 18, wherein said producing step includes exposing the selected conductors to an electric field produced by a group of electrodes which define capacitors with the selected conductors, said signal generating step comprising ascertaining the capacitances of said capacitors, and said ascertaining including supplying to the conductors an electric current and monitoring the current.
Claim 37
Dependent Claim
25 words
The method of claim 34, wherein said evaluating step comprises comparing an ascertained capacitance with a reference capacitance for determination of open and/or short circuits.
Claim 38
Dependent Claim
45 words
The method of claim 18, further comprising the steps of positioning a substrate carrying the selected conductors adjacent an array of electrodes and alternatingly utilizing the array to apply an electric field to the conductors on the thus positioned substrate and to generate said signals.
Claim 39
Dependent Claim
54 words
The method of claim 18 of testing printed circuit boards of the type having at least two sets of conductors carried by an insulating substrate, said producing step including utilizing one of said at least two sets to apply an electric field to the conductors of the other of said at least two sets.
Claim 40
Dependent Claim
33 words
The method of claim 18, wherein said producing step comprises utilizing a first group of conductors on a substrate to apply an electric field to a second group of conductors on the substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-12-06 | 1997-06-07 | 1997-12-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-12-06 | 2001-06-07 | 2001-12-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-12-06 | 2005-06-07 | 2005-12-07 | $7700.00 | Window Closed / Lapsed |