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US5260152A Expired / Lapsed US ⏱️ 0.0 years remaining

Phase shifting mask and method of manufacturing same

Assignee: Sony Corp
•
Filing: 1992-04-27
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Granted: 1993-11-09
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Expires: 2012-04-27
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Abstract

Abstract A method for manufacture of such a phase shifting mask comprises the steps of forming a light shielding layer on a substrate; forming a photoresist on the light shielding layer; patterning the photoresist to form a resist pattern; providing an opening in the light shielding layer by the use of the resist pattern as a mask, thereby forming a light shielding pattern; etching the substrate anisotropically to form a phase shifting segment; side etching the light shielding pattern to form a light shielding region; and removing the resist pattern.

Inventors

  • 👤 Hideo Shimizu
  • 👤 Hiroichi Hawahira

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 10:44
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/26; G03F1/29

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 88 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; etching said substrate anisotropically to form a phase shifting segment; side etching said light shielding pattern to form a light shielding region; and removing said resist pattern.
Claim 2
Independent Claim 88 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; etching said substrate anisotropically to form a phase shifting segment; side etching said light shielding pattern to form a light shielding region; and removing said resist pattern.
Claim 3
Independent Claim 88 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; etching said substrate anisotropically to form a phase shifting segment; removing said resist pattern; and etching said light shielding pattern isotropically to form a light shielding region.
Claim 4
Independent Claim 88 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; etching said substrate anisotropically to form a phase shifting segment; removing said resist pattern; and etching said light shielding pattern isotropically to form a light shielding region.
Claim 5
Independent Claim 112 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; side etching said light shielding pattern to form a light shielding region; depositing a phase shifting material in said opening by the use of said resist pattern as a mask; and removing said resist pattern together with the phase shifting material thereon to form a phase shifting segment in said opening.
Claim 6
Independent Claim 112 words
A method for manufacture of a phase shifting mask, comprising the steps of: forming a light shielding layer on a substrate; forming a photoresist on said light shielding layer; patterning said photoresist to form a resist pattern; forming an opening in said light shielding layer by the use of said resist pattern as a mask, thereby forming a light shielding pattern; side etching said light shielding pattern to form a light shielding region; depositing a phase shifting material in said opening by the use of said resist pattern as a mask; and removing said resist pattern together with the phase shifting material thereon to form a phase shifting segment in said opening.

References Cited (Backward Citations)

EP0234547A2 Cited
US5045417A Cited
EP0383534A2 Cited
EP0395425A2 Cited
EP0401795A2 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-11-08 1997-05-10 1997-11-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-11-08 2001-05-10 2001-11-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-11-08 2005-05-10 2005-11-09 $7700.00 Window Closed / Lapsed

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