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US5256339A Expired / Lapsed US ⏱️ 0.0 years remaining

Fabrication technique for silicon microclusters using pulsed electrical power

Assignee: United States Department of the Army
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Filing: 1992-10-30
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Granted: 1993-10-26
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Expires: 2012-10-30
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Abstract

Abstract The present invention describes a method of explosively vaporizing a piecef semiconductor material in a plasma formed by a fast, high voltage current pulse. The semiconductor material may be formed from crystalline, polycrystalline, or amorphous forms of semiconductor material. After the semiconductor material is vaporized, it coalesces as the plasma begins to cool and is deposited in a collection system. The size and composition of the microparticles formed by this process can be controlled by conditioning the plasma in predetermined manners. In particular, impurities can be introduced either in the target material, in gas introduced in the plasma, or in the gas through which the coalescing microparticles travel prior to deposition.

Inventors

  • 👤 Clarence G. Thornton
  • 👤 James F. Harvey
  • 👤 Robert A. Lux
  • 👤 Robert J. Zeto
  • 👤 Hardev Singh
  • 👤 Maurice Weiner
  • 👤 Terence Burke
  • 👤 Lawrence E. Kingsley

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 19:57
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/24; C23C14/32

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 100 words
A method of forming microparticles from bulk samples of semiconductive material comprising the steps of: a. forming a pulse forming network capable of generating a fast, high voltage pulse; b. electrically connecting a target sample of bulk semiconductive material to the pulse forming network; c. irradiating the target sample with a predetermined intensity and wavelength of laser light so as to increase the conductivity of the target sample; d. explosively vaporizing the target sample into a plasma by passing the fast, high voltage pulse through the target sample; and e. collecting microparticles of the target sample as the plasma cools.
Claim 2
Independent Claim 100 words
A method of forming microparticles from bulk samples of semiconductive material comprising the steps of: a. forming a pulse forming network capable of generating a fast, high voltage pulse; b. electrically connecting a target sample of bulk semiconductive material to the pulse forming network; c. irradiating the target sample with a predetermined intensity and wavelength of laser light so as to increase the conductivity of the target sample; d. explosively vaporizing the target sample into a plasma by passing the fast, high voltage pulse through the target sample; and e. collecting microparticles of the target sample as the plasma cools.
Claim 3
Dependent Claim 16 words
The method of claim 1 wherein the target sample is explosively vaporized in a sample chamber.
Claim 4
Dependent Claim 16 words
The method of claim 2 wherein the sample chamber has an atmosphere of a predetermined composition.
Claim 5
Dependent Claim 18 words
The method of claim 1 further comprising the step of doping the target sample to a predetermined composition.

References Cited (Backward Citations)

US4610718A Cited
US4689075A Cited
US5062936A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-10-25 1997-04-26 1997-10-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-10-25 2001-04-26 2001-10-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-10-25 2005-04-26 2005-10-26 $7700.00 Window Closed / Lapsed

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