Ion beam processing apparatus and specimen replacing method for the same

Claim 2

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from said vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed, said specimen holder being supported on a slide table; and raising/lowering means for raising and lowering said specimen holder at the time of specimen replacement by rotational movement of said slide table.

Claim 3

An ion beam processing apparatus as claimed in claim 1, further comprising a locking means for locking specimens on said specimen holder.

Claim 4

An ion beam processing apparatus as claimed in claim 2, wherein said locking means locks specimens on said specimen holder by a biasing force of springs.

Claim 5

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from said vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed; and a raising/lowering means for raising and lowering said specimen holder at the time of specimen replacement including a spiral groove formed on an outer peripheral surface of a slide table supporting said specimen holder and a pin fastened to a body of said specimen holder and engaged with said groove, said raising/lowering means being raised and lowered by turning said slide table.

Claim 6

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from said vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed; and a raising/lowering means for raising and lowering said specimen holder at the time of specimen replacement including a spiral groove formed on an outer peripheral surface of a slide table supporting said specimen holder and a pin fastened to a body of said specimen holder and engaged with said groove, said raising/lowering means being raised and lowered by turning said slide table.

Claim 7

An ion beam processing apparatus as claimed in claim 4, wherein a stepping motor is provided for turning said slide table.

Claim 8

An ion beam processing apparatus as claimed in claim 4, wherein said slide table is manually turned.

Claim 9

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from said vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed, said specimen holder being supported on a slide table; a specimen turning mechanism for turning said specimen holder around a central axis; a specimen tipping mechanism for tipping said specimen holder; and a raising/lowering means for raising and lowering said specimen holder at the time of specimen replacement by rotational movement of said slide table.

Claim 10

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from said vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed, said specimen holder being supported on a slide table; a specimen turning mechanism for turning said specimen holder around a central axis; a specimen tipping mechanism for tipping said specimen holder; and a raising/lowering means for raising and lowering said specimen holder at the time of specimen replacement by rotational movement of said slide table.

Claim 11

An ion beam processing apparatus as claimed in claim 7, further comprising a locking means for locking specimens on said specimen holder.

Claim 12

An ion beam processing apparatus as claimed in claim 8, wherein said locking means locks specimens on said specimen holder by a biasing force of springs.

Claim 13

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from aid vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed; a specimen turning mechanism for turning said specimen holder around its central axis; a specimen tipping mechanism for tipping said specimen holder; and a raising/lowering means including a spiral groove formed on an outer peripheral surface of a slide table supporting said specimen holder and a pin fastened to a body of said specimen holder and engaged with said groove, said raising/lowering means being raised and lowered by turning said slide table.

Claim 14

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum vessel which extracts ions from said ion source to process specimens; a conveying mechanism which feeds and extracts specimens to and from aid vacuum vessel to effect specimen replacement; a specimen holder provided in said vacuum vessel for holding a specimen while the specimen is processed; a specimen turning mechanism for turning said specimen holder around its central axis; a specimen tipping mechanism for tipping said specimen holder; and a raising/lowering means including a spiral groove formed on an outer peripheral surface of a slide table supporting said specimen holder and a pin fastened to a body of said specimen holder and engaged with said groove, said raising/lowering means being raised and lowered by turning said slide table.

Claim 15

An ion beam processing apparatus as claimed in claim 10, wherein a stepping motor is provided for turning said slide table.

Claim 16

An ion beam processing apparatus as claimed in claim 10, wherein means are provided for enabling a manual turning of said slide table.

Claim 17

A specimen replacement method for an ion beam processing apparatus, the method comprising the steps of: moving a specimen, mounted on a specimen stage and processed by an ion beam, to an upper position above the specimen stage; transferring the processed specimen to a conveying mechanism at said upper position; receiving an unprocessed specimen conveyed to said upper position by said conveying mechanism; and moving the unprocessed specimen in a downward direction to place the unprocessed specimen on said specimen stage.

Claim 18

A specimen replacement method for an ion beam processing apparatus, the method comprising the steps of: moving a specimen, mounted on a specimen stage and processed by an ion beam, to an upper position above the specimen stage; transferring the processed specimen to a conveying mechanism at said upper position; receiving an unprocessed specimen conveyed to said upper position by said conveying mechanism; and moving the unprocessed specimen in a downward direction to place the unprocessed specimen on said specimen stage.

Claim 19

A specimen replacement method for an ion beam processing apparatus, the method comprising the steps of: raising at least one catch rod supporting a peripheral portion of a specimen, processed on a specimen stage by an ion beam, so as to raise the specimen above the specimen stage; inserting an arm of a conveying mechanism below the specimen thus raised; lowering said at least one catch rod to transfer the processed specimen to said arm; driving said conveying mechanism to move said arm with an unprocessed specimen to a position above said at least one catch rod; raising said at least one catch rod to raise the unprocessed specimen; causing said arm to withdraw; and lowering said at least one catch rod to place the unprocessed specimen on said specimen stage.

Claim 20

A specimen replacement method for an ion beam processing apparatus, the method comprising the steps of: raising at least one catch rod supporting a peripheral portion of a specimen, processed on a specimen stage by an ion beam, so as to raise the specimen above the specimen stage; inserting an arm of a conveying mechanism below the specimen thus raised; lowering said at least one catch rod to transfer the processed specimen to said arm; driving said conveying mechanism to move said arm with an unprocessed specimen to a position above said at least one catch rod; raising said at least one catch rod to raise the unprocessed specimen; causing said arm to withdraw; and lowering said at least one catch rod to place the unprocessed specimen on said specimen stage.

Claim 21

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum container into which ions are introduced from said ion source; a first transfer means for removing a processed specimen out of said vacuum container; a specimen stage provided in said vacuum container for accommodating the specimen during processing by applying ions thereto; a second transfer means movable in a vertical direction by converting a rotary movement into a linear movement to place an unprocessed specimen received from said first transfer means on said specimen stage and deliver the processed specimen received from said specimen stage to said first transfer means; and a specimen locking means adapted to operate with the movement of the second transfer means so as to directly lock the specimen on said specimen stage and release the locking thereof.

Claim 22

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum container into which ions are introduced from said ion source; a first transfer means for removing a processed specimen out of said vacuum container; a specimen stage provided in said vacuum container for accommodating the specimen during processing by applying ions thereto; a second transfer means movable in a vertical direction by converting a rotary movement into a linear movement to place an unprocessed specimen received from said first transfer means on said specimen stage and deliver the processed specimen received from said specimen stage to said first transfer means; and a specimen locking means adapted to operate with the movement of the second transfer means so as to directly lock the specimen on said specimen stage and release the locking thereof.

Claim 23

An ion beam processing apparatus according to claim 15, wherein said specimen locking means locks the specimen by pressing peripheral portions of the specimen from above through a biasing force of a spring.

Claim 24

An ion beam processing apparatus according to claim 15, wherein said second transfer means includes a spiral groove formed on an outer peripheral surface thereof, a slide table slidable only in the vertical direction along an outer periphery of said specimen stage, a pin adapted to engage with said groove, and a sleeve rotatable around said slide table, and wherein said second transfer means is movable in the vertical direction by rotating said sleeve.

Claim 25

An ion beam processing apparatus according to claim 17, wherein a stepping motor is provided for rotating said sleeve.

Claim 26

An ion beam processing apparatus according to claim 17, wherein means are provided for enabling a manual rotation of said sleeve.

Claim 27

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum container into which ions are introduced from said ion source; a first transfer means for removing a processed specimen from said vacuum container; a specimen stage provided in said vacuum container for accommodating the specimen during processing by applying the ions thereto; a second transfer means movable in a vertical direction by converting a rotary movement into a linear movement to place an unprocessed specimen received from said first transfer means on said specimen stage and deliver the processed specimen received from said specimen stage to said first transfer means; a specimen locking means adapted to operate with the movement of the second transfer means so as to directly lock the specimen on said specimen stage and release the locking thereof; a specimen rotating mechanism for rotating said specimen stage around a central axis thereof; and a specimen tilting mechanism for tilting said specimen stage.

Claim 28

An ion beam processing apparatus comprising: an ion source for generating ions; a vacuum container into which ions are introduced from said ion source; a first transfer means for removing a processed specimen from said vacuum container; a specimen stage provided in said vacuum container for accommodating the specimen during processing by applying the ions thereto; a second transfer means movable in a vertical direction by converting a rotary movement into a linear movement to place an unprocessed specimen received from said first transfer means on said specimen stage and deliver the processed specimen received from said specimen stage to said first transfer means; a specimen locking means adapted to operate with the movement of the second transfer means so as to directly lock the specimen on said specimen stage and release the locking thereof; a specimen rotating mechanism for rotating said specimen stage around a central axis thereof; and a specimen tilting mechanism for tilting said specimen stage.

Claim 29

An ion beam processing apparatus according to claim 20, wherein said specimen locking mean locks the specimen by pressing peripheral portions of the specimen from above through a biasing force of a spring.

Claim 30

An ion beam processing apparatus according to claim 20, wherein said second transfer means includes a spiral groove formed on an outer peripheral surface thereof, a slide table slidable only in the vertical direction along an outer periphery of said specimen stage, a pin adapted to engage said groove, and a sleeve rotatable around said slide table, and wherein said second transfer means is movable along the vertical direction by rotating said sleeve.

Claim 31

An ion beam processing apparatus according to claim 22, wherein a stepping motor is provided for rotating said sleeve.

Claim 32

An ion beam processing apparatus according to claim 22, wherein means are provided for enabling a manual rotation of said sleeve.