US5229317A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for preventing out-diffusion of phosphorous and boron in a bpsg-buried trench
Assignee: NEC Corp
•
Filing: 1992-09-09
•
Granted: 1993-07-20
•
Expires: 2012-09-09
Abstract
Abstract According to this invention, an isolation trench is formed in a semiconductor substrate. A first insulating film is formed on a surface of the semiconductor substrate and an inner surface of the trench. A silicon oxide film containing phosphorus and boron is buried in the trench in which the first insulating film is formed. A second insulating film pattern having a width larger than that of the trench is formed on the trench and a peripheral portion of the trench. The second insulating film pattern prevents out-diffusion phosphorus and boron in the silicon oxide film. The first insulating film which is not covered with the second insulating film pattern is removed to form a first insulating film pattern. The surface of the semiconductor substrate which is not covered with the first and second insulating film patterns is thermally oxidized.
Inventors
- 👤 Nobuya Nishio
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 12:14
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0128; H10W10/014; H10W10/0145; H10W10/10; H10W10/13; H10W10/17; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/117
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
142 words
A method of manufacturing a semiconductor device, comprising the steps of: forming an isolation trench in a semiconductor substrate; forming a first insulating film on a surface of said semiconductor substrate and an inner surface of said trench; burying a silicon oxide film containing phosphorus and boron in said trench in which said first insulating film is formed; forming a second insulating film pattern having a width larger than that of said trench on said trench and a peripheral portion of said trench, the second insulating film pattern preventing out-diffusion of phosphorus and boron in said silicon oxide film; removing said first insulating film which is not covered with said second insulating film pattern to form a first insulating film pattern; and thermally oxidizing the surface of said semiconductor substrate which is not covered with said first and second insulating film patterns.
Claim 2
Independent Claim
142 words
A method of manufacturing a semiconductor device, comprising the steps of: forming an isolation trench in a semiconductor substrate; forming a first insulating film on a surface of said semiconductor substrate and an inner surface of said trench; burying a silicon oxide film containing phosphorus and boron in said trench in which said first insulating film is formed; forming a second insulating film pattern having a width larger than that of said trench on said trench and a peripheral portion of said trench, the second insulating film pattern preventing out-diffusion of phosphorus and boron in said silicon oxide film; removing said first insulating film which is not covered with said second insulating film pattern to form a first insulating film pattern; and thermally oxidizing the surface of said semiconductor substrate which is not covered with said first and second insulating film patterns.
Claim 3
Dependent Claim
16 words
A method according to claim 1, wherein said second insulating film pattern consists of silicon nitride.
Claim 4
Dependent Claim
45 words
A method according to claim 1 further comprising a step of forming a third insulating film consisting of the same material as that of the second insulating film pattern between said silicon oxide film and said first insulating film which are buried in said trench.
Claim 5
Dependent Claim
59 words
A method according to claim 3, wherein the step of forming said third insulating film comprises the steps forming a fourth insulating film on said first insulating film including said trench and removing said fourth insulating film from said semiconductor substrate after said silicon oxide film is buried in said trench in which said fourth insulating film is formed.
Claim 6
Dependent Claim
105 words
A method according to claim 3, wherein the steps of forming said third insulating film and said second insulating film pattern comprise the steps of forming said fourth insulating film on said first insulating film including said trench, forming a fifth insulating film on said fourth insulating film except for said trench and said silicon oxide film in said trench after said silicon oxide film is buried in said trench in which said fourth insulating film is formed, and etching said fourth and said fifth insulating films to leave said fourth and said fifth insulating films having a width larger than that of said trench.
References Cited (Backward Citations)
US4506435A
Cited
JPS59106133A
Cited
JPS6020530A
Cited
US4740480A
Cited
JPS6122663A
Cited
US4571819A
Cited
JPH023349A
Cited
JPH023631A
Cited
JPH0258439A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-07-19 | 1997-01-18 | 1997-07-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-07-19 | 2001-01-18 | 2001-07-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-07-19 | 2005-01-18 | 2005-07-20 | $7700.00 | Window Closed / Lapsed |