← Back to Patent Explorer
US5229230A Expired / Lapsed US ⏱️ 0.0 years remaining

Photomask

Assignee: Mitsubishi Electric Corp
•
Filing: 1991-06-18
•
Granted: 1993-07-20
•
Expires: 2011-06-18
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract In a photomask, a rectangular pattern to be transferred to a resist film and a plurality of auxiliary patterns are provided in a light shielding layer which is formed on a transparent plate. The auxiliary patterns are spaced from the rectangular light-transmission pattern so that the Fresnel diffraction light from the auxiliary patterns and the zero-order diffraction light from the rectangular light-transmission pattern intensify each other at a position where a pattern corresponding to the rectangular light-transmission pattern is formed on the resist film. Thus, the light intensity of the pattern on the resist film is increased.

Inventors

  • 👤 Kazuya Kamon

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 03:52
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/26; G03F1/30; G03F1/36; G03F7/00; G03F7/70; G03F7/70216; G03F7/70283; G03F1/32

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 117 words
A photomask for use within transferring a predetermined rectangular pattern to a resist film through a lithography technique; said photomask comprising: a transparent plate; and a light shielding layer formed on said transparent plate, said light shielding layer being provided with a rectangular light-transmission pattern corresponding to a rectangular pattern to be transferred to a resist film and a plurality of auxiliary patterns, wherein said auxiliary patterns are spaced from said rectangular light-transmission pattern so that the Fresnel diffraction light from said auxiliary patterns and the zero-order diffraction light from said rectangular light-transmission pattern are added to each other at a position where a pattern corresponding to said rectangular light-transmission pattern is formed on said resist film.
Claim 2
Dependent Claim 117 words
A photomask for use within transferring a predetermined rectangular pattern to a resist film through a lithography technique; said photomask comprising: a transparent plate; and a light shielding layer formed on said transparent plate, said light shielding layer being provided with a rectangular light-transmission pattern corresponding to a rectangular pattern to be transferred to a resist film and a plurality of auxiliary patterns, wherein said auxiliary patterns are spaced from said rectangular light-transmission pattern so that the Fresnel diffraction light from said auxiliary patterns and the zero-order diffraction light from said rectangular light-transmission pattern are added to each other at a position where a pattern corresponding to said rectangular light-transmission pattern is formed on said resist film.
Claim 3
Dependent Claim 21 words
A photomask in accordance with claim 1, wherein said auxiliary patterns are located symmetrically with respect to said rectangular light-transmission pattern.
Claim 4
Dependent Claim 33 words
A photomask in accordance with claim 2, wherein a phase shift member is filled in each of said auxiliary patterns, said phase shift member shifting the phase of light transmitted said auxiliary patterns.
Claim 5
Dependent Claim 22 words
A photomask in accordance with claim 3, wherein each of said auxiliary patterns is smaller than said rectangular light-transmission pattern in size.
Claim 6
Dependent Claim 24 words
A photomask in accordance with claim 1, wherein said auxiliary patterns are located on a normal line of sides of said rectangular light-transmission pattern.
Claim 7
Dependent Claim 81 words
A photomask for use within transferring a predetermined rectangular pattern to a resist film through a lithography technique; said photomask comprising: a transparent plate; and a light shielding layer formed on said transparent plate, said light shielding layer being provided with a rectangular light-transmission pattern corresponding to a rectangular pattern to be transferred to a resist film, a first auxiliary pattern, and a second auxiliary pattern, wherein said first and second auxiliary patterns are located serially from said rectangular light-transmission pattern.
Claim 8
Dependent Claim 81 words
A photomask for use within transferring a predetermined rectangular pattern to a resist film through a lithography technique; said photomask comprising: a transparent plate; and a light shielding layer formed on said transparent plate, said light shielding layer being provided with a rectangular light-transmission pattern corresponding to a rectangular pattern to be transferred to a resist film, a first auxiliary pattern, and a second auxiliary pattern, wherein said first and second auxiliary patterns are located serially from said rectangular light-transmission pattern.
Claim 9
Dependent Claim 27 words
A photomask in accordance with claim 6, wherein said first and second auxiliary patterns are located on a normal line of sides of said rectangular light-transmission pattern.
Claim 10
Dependent Claim 55 words
A photomask in accordance with claim 6, wherein said first auxiliary pattern is located so that the first-order diffraction light from said first auxiliary pattern is added to the zero-order diffraction light from said rectangular light-transmission pattern at a position where a pattern corresponding to said rectangular light-transmission pattern is formed on said resist film.
Claim 11
Dependent Claim 40 words
A photomask in accordance with claim 8, wherein said second auxiliary pattern is located so that the second-order diffraction light from said second auxiliary pattern is added to the zero-order diffraction light from said rectangular light-transmission pattern at said position.
Claim 12
Dependent Claim 33 words
A photomask in accordance with claim 9, wherein a phase shift member is filled in said first auxiliary pattern, said phase shift member shifting the phase of light transmitted said first auxiliary pattern.

References Cited (Backward Citations)

CA1190082A Cited
JPS6267514A Cited
US4777116A Cited
US4764441A Cited
US5045417A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-07-19 1997-01-18 1997-07-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-07-19 2001-01-18 2001-07-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-07-19 2005-01-18 2005-07-20 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag