US5193104A
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US
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Method for analyzing monocrystalline parts by x-rays
Assignee: INSTITUT MAX VON LAUE - PAUL LANGEVIN
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Filing: 1991-10-22
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Granted: 1993-03-09
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Expires: 2011-10-22
Abstract
Abstract An X-ray volume analysis method of crystalline defects of a part (11), comprises the steps of positioning the part in the plane situated at equal distance from the focus of an X-ray source and a focusing plane (14); illuminating the part from a punctual X-ray source (10) by a beam of a large spectral width Δλ and of determined angular opening Δθ, the opening Δθ of the beam being fixed by Δθ≦Δλ/2d.cosθ, d being the interreticular distance for the considered reticular planes; orienting the part (11) to obtain the diffraction on a chosen family of reticular planes (30); and collecting and analyzing the X-ray beam near the focusing plane or beyond.
Inventors
- 👤 Pierre Bastie
- 👤 Bernard Hamelin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 21:52
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/207
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
106 words
An X-ray volume analysis method of detecting crystalline defects of an object, comprising the steps of: positioning the object in a plane situated equidistant from the focus of a point source of X-rays and a focusing plane; illuminating the object using said point source of X-rays using a beam having a band width Δλ and a predetermined angular opening Δθ, the opening Δθ of the beam being defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; orienting the object to obtain the diffraction on a chosen family of the reticular planes; and collecting and analyzing the X-ray beam near the focusing plane.
Claim 2
Dependent Claim
106 words
An X-ray volume analysis method of detecting crystalline defects of an object, comprising the steps of: positioning the object in a plane situated equidistant from the focus of a point source of X-rays and a focusing plane; illuminating the object using said point source of X-rays using a beam having a band width Δλ and a predetermined angular opening Δθ, the opening Δθ of the beam being defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; orienting the object to obtain the diffraction on a chosen family of the reticular planes; and collecting and analyzing the X-ray beam near the focusing plane.
Claim 3
Dependent Claim
37 words
The method as claimed in claim 1, wherein the steps of collecting and analyzing comprises the steps of isolating observed spots in the focusing plane using diaphragms; and collecting and analyzing images transmitted beyond the focusing plane.
Claim 4
Dependent Claim
38 words
The method as claimed in claim 1, wherein a diverging beam from a point focus is directed through an aperture positioned between the source of X-rays and the object so that the beam substantially illuminates the whole object.
Claim 5
Dependent Claim
22 words
The method as claimed in claim 1, wherein the source of X-rays provides a radiation of an energy greater than 100 kev.
Claim 6
Dependent Claim
13 words
The method as claimed in claim 1, wherein the object is a monocrystal.
Claim 7
Dependent Claim
23 words
The method as claimed in claim 1, wherein said illuminating step illuminates said object using a polychromatic beam having a predetermined spectral width.
Claim 8
Independent Claim
98 words
A method for detecting crystalline defects of a specimen, comprising the steps of: positioning the specimen in a plane situated substantially equidistant from the focus of an X-ray source and a focusing plane; concurrently irradiating a whole of a surface of said specimen with said X-ray source using a beam having a bandwidth Δλ and a predetermined angular divergence defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; orienting the specimen to obtain the diffraction on a chosen family of the reticular planes; and collecting and analyzing the X-ray beam proximate the focusing plane.
Claim 9
Independent Claim
98 words
A method for detecting crystalline defects of a specimen, comprising the steps of: positioning the specimen in a plane situated substantially equidistant from the focus of an X-ray source and a focusing plane; concurrently irradiating a whole of a surface of said specimen with said X-ray source using a beam having a bandwidth Δλ and a predetermined angular divergence defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; orienting the specimen to obtain the diffraction on a chosen family of the reticular planes; and collecting and analyzing the X-ray beam proximate the focusing plane.
Claim 10
Dependent Claim
28 words
The method according to claim 7, wherein said irradiating step includes irradiating the whole of the surface of said specimen with said X-ray source using a polychromatic beam.
Claim 11
Dependent Claim
36 words
The method according to claim 7, wherein the steps of collecting and analyzing comprises the steps of: isolating observed spots in the focusing plane using diaphragms; and collecting and analyzing images transmitted beyond the focusing plane.
Claim 12
Dependent Claim
44 words
The method according to claim 7, wherein said X-ray source comprises a point source of X-rays which are directed through an aperture positioned between the X-ray source and the specimen whereby the X-ray beam substantially illuminates the whole of said surface of said specimen.
Claim 13
Dependent Claim
19 words
The method according to claim 7, wherein the X-ray source emits X-rays having an energy greater than 100 kev.
Claim 14
Independent Claim
91 words
An apparatus for detecting crystalline defects of a specimen, comprising: a source of a beam of X-rays having a bandwidth Δλ and a predetermined angular divergence defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; means for positioning the specimen in a plane situated substantially equidistant from the focus of the polychromatic source and a focusing plane; means for orienting the specimen to obtain the diffraction on a chosen family of the reticular planes; and means for collecting and analyzing the X-ray beam proximate the focusing plane.
Claim 15
Independent Claim
91 words
An apparatus for detecting crystalline defects of a specimen, comprising: a source of a beam of X-rays having a bandwidth Δλ and a predetermined angular divergence defined by Δθ≦Δλ/2d·cos θ, d being an interreticular distance for predetermined reticular planes; means for positioning the specimen in a plane situated substantially equidistant from the focus of the polychromatic source and a focusing plane; means for orienting the specimen to obtain the diffraction on a chosen family of the reticular planes; and means for collecting and analyzing the X-ray beam proximate the focusing plane.
Claim 16
Dependent Claim
20 words
The apparatus according to claim 12, wherein said source of a beam of X-rays is a polychromatic source of x-rays.
Claim 17
Dependent Claim
37 words
The apparatus according to claim 12, wherein the means for collecting and analyzing comprises: means for isolating observed spots in the focusing plane using diaphragms; and means for collecting and analyzing images transmitted beyond the focusing plane.
Claim 18
Dependent Claim
40 words
The apparatus of claim 12, wherein said source comprises: a point source of X-rays; and an aperture positioned between the source of X-ray and the specimen whereby the X-ray beam substantially illuminates the whole of said surface of said specimen.
Claim 19
Dependent Claim
21 words
The apparatus according to claim 14 wherein said point source of X-rays generates X-rays having an energy greater than 100 kev.
Claim 20
Dependent Claim
32 words
The apparatus according to claim 12 wherein said means for positioning the specimen includes means for positioning a turbine blade substantially equidistant from the focus of the source and said focusing plane.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-03-08 | 1996-09-07 | 1997-03-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-03-08 | 2000-09-07 | 2001-03-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-03-08 | 2004-09-07 | 2005-03-09 | $7700.00 | Window Closed / Lapsed |