US5177696A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of determination of gas properties at reference conditions
Assignee: Honeywell Inc
•
Filing: 1989-12-28
•
Granted: 1993-01-05
•
Expires: 2009-12-28
Abstract
Abstract A method of determination of gas properties at reference conditions of temperature and pressure. This determination is needed in systems including mass flow meters, combustion control systems, gas meters and the like. The system disclosed enables the determination of properties including specific heat and thermal conductivity at reference conditions.
Inventors
- 👤 Ulrich Bonne
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 21:21
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/18; G01N25/005; G01N33/00; G01N33/22; G01N33/225
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
418 words
A microsensor apparatus for determining fuel gas properties at reference conditions for a gas at unknown conditions comprising: a semiconductor microbridge structure supported by a substrate having an electrically energizable heater film element thereon and resistive sensor film element(s) located proximate to the heater film element having; a substrate temperature measuring means mounted on said substrate wherein said substrate temperature measuring means is for measuring gas-temperature-at-the-structure-substrate (T g ) from signal provided by said substrate sensor; and such that said structure and said substrate temperature measuring means are so arranged and disposed to be in contact by immersion in the gas to be sensed such that when an electrical energy pulse is applied to said heater film element of sufficient time duration and power, the pulse causes a resulting transient temperature followed by a steady-state temperature in said gas, to a degree detectable by said sensor(s) so as to produce an imbalance output corresponding to the voltage imbalance due to change in resistivity between said sensor element (s) and balance resistor elements, integral s means for measuring the transient temperature signal based on said imbalance output called s and a means for determining the integral of said measurement over time, said signal being provided by said sensor(s), dU measuring means for measuring the sensor steady-state temperature signal called dU from signal based on said imbalance output, T e measuring means for measuring ambient or electronics temperature T e from signal provided by said sensor(s), and a computing device connected to receive said signals dU, T g , and T e , and employing signal processing circuitry, data and processing components, said computing device configured to have k computing means, c computing means and k s computing means; having k computing means for computing thermal conductivity of said fuel gas, k, as a function of dU, and T g (gas temp) while compensating for ambient temperature, T e , influence on electronics receiving input from said dU, T g and T e means, c computing means for computing specific heat of said fuel gas, c p , as a function of dU, and T g while compensating for ambient temperature, T e , receiving input from said dU, T g and T e means, and k s computing means for computing from computed k and measured T g , k s of said fuel gas (k at standard conditions) and an output structure for providing an output representative of at least one of k, c, or k s .
Claim 2
Dependent Claim
418 words
A microsensor apparatus for determining fuel gas properties at reference conditions for a gas at unknown conditions comprising: a semiconductor microbridge structure supported by a substrate having an electrically energizable heater film element thereon and resistive sensor film element(s) located proximate to the heater film element having; a substrate temperature measuring means mounted on said substrate wherein said substrate temperature measuring means is for measuring gas-temperature-at-the-structure-substrate (T g ) from signal provided by said substrate sensor; and such that said structure and said substrate temperature measuring means are so arranged and disposed to be in contact by immersion in the gas to be sensed such that when an electrical energy pulse is applied to said heater film element of sufficient time duration and power, the pulse causes a resulting transient temperature followed by a steady-state temperature in said gas, to a degree detectable by said sensor(s) so as to produce an imbalance output corresponding to the voltage imbalance due to change in resistivity between said sensor element (s) and balance resistor elements, integral s means for measuring the transient temperature signal based on said imbalance output called s and a means for determining the integral of said measurement over time, said signal being provided by said sensor(s), dU measuring means for measuring the sensor steady-state temperature signal called dU from signal based on said imbalance output, T e measuring means for measuring ambient or electronics temperature T e from signal provided by said sensor(s), and a computing device connected to receive said signals dU, T g , and T e , and employing signal processing circuitry, data and processing components, said computing device configured to have k computing means, c computing means and k s computing means; having k computing means for computing thermal conductivity of said fuel gas, k, as a function of dU, and T g (gas temp) while compensating for ambient temperature, T e , influence on electronics receiving input from said dU, T g and T e means, c computing means for computing specific heat of said fuel gas, c p , as a function of dU, and T g while compensating for ambient temperature, T e , receiving input from said dU, T g and T e means, and k s computing means for computing from computed k and measured T g , k s of said fuel gas (k at standard conditions) and an output structure for providing an output representative of at least one of k, c, or k s .
Claim 3
Dependent Claim
91 words
The apparatus according to claim 1 in which the computing means for computing k and c follows the general form for 1/k s or 1/c ps or k s or C p s of: A+BT.sup.b +Ck.sup.c +Dc.sub.p d+E(kT.sup.x).sup.e +F(c.sub.p T.sup.y).sup.f +G(dk/dT).sup.g +H(dc.sub.p /dT).sup.h ( 1) where k s is thermal conductivity at standard or reference conditions c ps is specific heat at standard or reference conditions, and A, B, C, D, E, F, G, and H are coefficients, and b, c, d, e, f, g, h, x, and y are exponents.
Claim 4
Dependent Claim
32 words
The apparatus according to claim 1 in which in the microbridge structure has first and second resistive sensor film elements located on opposite sides of and proximate to the heater film element.
Claim 5
Dependent Claim
25 words
The apparatus according to claim 1 in which the electrical energy pulse to the heater film approximates in form a square wave electrical energy pulse.
Claim 6
Dependent Claim
23 words
The apparatus according to claim 4 in which the pulse width of the electrical energy pulse is on the order of 100 milliseconds.
Claim 7
Dependent Claim
24 words
The apparatus according to claim 5 in which the pulse applied to the heater film has a height on the order of 4 volts.
Claim 8
Dependent Claim
34 words
An apparatus as set forth in claim 1 and further comprising C ps deriving means for computing specific heat at standard conditions, c ps , from computed c p and measured T g .
Claim 9
Dependent Claim
115 words
The apparatus as set forth in claim 5 and further comprising: W hc means for measuring heater power, W hc , to achieve constant differential temperature, dT, above ambient temperature wherein W hc is also employed by k s computing means in the computing of thermal conductivity, k, as a function of dU, W hc and T g while compensating for the ambient temperature, T e , influence on the electronics and wherein W hc is also employed by c computing means in the computing of specific heat at standard reference conditions, called c ps , as a function of dU, W hc , and T g while compensating for ambient temperature, T e .
Claim 10
Dependent Claim
55 words
The apparatus according to claim 8 including a further step of employing said W hc means for measuring a different heater power, W hc2 , to achieve another constant dT 2 above room temperature which leads to obtaining k 2 and c p2 in order to be able to form dk/dT and dc p /dT.
Claim 11
Dependent Claim
95 words
The apparatus according to claim 9 in which the computing means for computing k or the computing means for computing c follows the general form for 1/k s or 1/c ps or k s or c ps of: A+BT.sup.b +Ck.sup.c +Dc.sub.p.sup.d +E(kT.sup.x).sup.e +F(c.sub.p T.sup.y).sup.f +G(dk/dT).sup.g +H(dc.sub.p /dT).sup.h ( 1) where k s is thermal conductivity at standard or reference conditions, c ps is specific heat at standard or reference conditions, and A, B, C, D, E, F, G, and H are coefficients, and b, c, d, e, f, g, h, x, and y are exponents.
Claim 12
Independent Claim
321 words
A method to determine fuel gas properties at reference conditions for a gas at unknown conditions in microsensor fuel flow metering apparatus including the steps: providing a semiconductor microbridge flow sensor having an electrically energized heater film element on a sensor substrate and first and second resistive sensor film elements located on opposite sides of and proximate to the heater film; locating the flow sensor in immersed contact with the fuel gas; supplying an electrical energy pulse to said heater film of sufficient time duration and power to cause a resulting transient temperature signal and a steady-state temperature signal in said sensors because of the resultant change in the temperature of the gas so as to produce an imbalance output corresponding to resultant effects on the resistivity of said sensor film elements; measuring heater power, called W hc , required to achieve constant differential temperature, dT, above room temperature; measuring the rise in temperature due to the energy pulse based on said imbalance output and determining its integral; measuring the sensor steady-state output, dU; measuring gas temperature at the sensor substrate; and then, based on these measured signals: computing thermal conductivity of said fuel gas, k, as a function of dU, W hc , and the temperature of the gas at the substrate, T g , while compensating for ambient temperature; computing specific heat of said fuel gas, c p , as a function of dU, W hc , and T g while compensating for ambient temperature; from computed k and measured T g computing a term called k s , which is k at standard conditions of said fuel gas; from computed c p and measured T g computing a term called c ps , which is specific heat of said fuel gas at standard conditions; and providing an output signal representative of at least one of said computed values k, c p , k s or c ps .
Claim 13
Independent Claim
321 words
A method to determine fuel gas properties at reference conditions for a gas at unknown conditions in microsensor fuel flow metering apparatus including the steps: providing a semiconductor microbridge flow sensor having an electrically energized heater film element on a sensor substrate and first and second resistive sensor film elements located on opposite sides of and proximate to the heater film; locating the flow sensor in immersed contact with the fuel gas; supplying an electrical energy pulse to said heater film of sufficient time duration and power to cause a resulting transient temperature signal and a steady-state temperature signal in said sensors because of the resultant change in the temperature of the gas so as to produce an imbalance output corresponding to resultant effects on the resistivity of said sensor film elements; measuring heater power, called W hc , required to achieve constant differential temperature, dT, above room temperature; measuring the rise in temperature due to the energy pulse based on said imbalance output and determining its integral; measuring the sensor steady-state output, dU; measuring gas temperature at the sensor substrate; and then, based on these measured signals: computing thermal conductivity of said fuel gas, k, as a function of dU, W hc , and the temperature of the gas at the substrate, T g , while compensating for ambient temperature; computing specific heat of said fuel gas, c p , as a function of dU, W hc , and T g while compensating for ambient temperature; from computed k and measured T g computing a term called k s , which is k at standard conditions of said fuel gas; from computed c p and measured T g computing a term called c ps , which is specific heat of said fuel gas at standard conditions; and providing an output signal representative of at least one of said computed values k, c p , k s or c ps .
Claim 14
Dependent Claim
61 words
The method according to claim 11 including a further step of measuring a different heater power, W hc2 , is measured, producing another constant, dT 2 , above room temperature which can then be used by the k and c computing means to obtain k 2 and c p2 in order to then compute the values dk/dT and dc p /dT.
References Cited (Backward Citations)
US3913379A
Cited
US4123934A
Cited
US4254654A
Cited
US4063447A
Cited
US4164862A
Cited
US4381154A
Cited
US4624137A
Cited
US4461166A
Cited
US4478076A
Cited
US4501144A
Cited
US4478077A
Cited
US4651564A
Cited
US4825693A
Cited
US4630938A
Cited
US4697165A
Cited
US4783996A
Cited
US4734641A
Cited
US4739657A
Cited
US4944035A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-01-05 | 1996-07-06 | 1997-01-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-01-05 | 2000-07-06 | 2001-01-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-01-05 | 2004-07-06 | 2005-01-05 | $7700.00 | Window Closed / Lapsed |