Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
123 words
A field-effect transistor structure including a substrate; a channel layer formed of a narrow bandgap semiconductive material over said substrate; a donor layer formed of an oxidizable wide bandgap semiconductive material over said channel layer to form a heterojunction therewith; a source, drain, and gate which are ohmically separate from each other formed over said donor layer; a single homogeneous oxidation-stop layer formed of a non-oxidizable narrow bandgap semiconductive material under said source, drain, and gate which is sealingly extending over said donor layer; and a first Schottky layer formed between said source, drain and gate and said stop layer, said Schottky layer being formed with a recess extending partially therethrough, wherein said gate is formed on a bottom surface of said recess.
Claim 2
Dependent Claim
123 words
A field-effect transistor structure including a substrate; a channel layer formed of a narrow bandgap semiconductive material over said substrate; a donor layer formed of an oxidizable wide bandgap semiconductive material over said channel layer to form a heterojunction therewith; a source, drain, and gate which are ohmically separate from each other formed over said donor layer; a single homogeneous oxidation-stop layer formed of a non-oxidizable narrow bandgap semiconductive material under said source, drain, and gate which is sealingly extending over said donor layer; and a first Schottky layer formed between said source, drain and gate and said stop layer, said Schottky layer being formed with a recess extending partially therethrough, wherein said gate is formed on a bottom surface of said recess.
Claim 3
Dependent Claim
32 words
A structure as in claim 1, further comprising a cap layer formed of said narrow bandgap semiconductive material between said source and drain; and said Schottky layer laterally external of said recess.
Claim 4
Dependent Claim
27 words
A structure as in claim 1, further comprising a second Schottky layer formed of said wide bandgap semiconductive material between said stop layer and said donor layer.
Claim 5
Dependent Claim
23 words
A structure as in claim 1, in which said wide bandgap semiconductive material is AlInAs, and said narrow bandgap semiconductive material is GaInAs.
Claim 6
Dependent Claim
23 words
A structure as in claim 1, in which said wide bandgap semiconductive material is AlGaAs, and said narrow bandgap semiconductive material is GaInAs.
Claim 7
Dependent Claim
20 words
A structure as in claim 1, in which said wide and narrow bandgap semiconductive materials are lattice-matched to each other.
Claim 8
Dependent Claim
107 words
An active transistor structure including a substrate; a first layer formed of an oxidizable wide bandgap semiconductive material over said substrate; a source drain, and gate which are ohmically separate from each other formed over said first layer; a single homogeneous oxidation-stop layer formed of a non-oxidizable narrow bandgap material under said source, drain, and gate which is sealingly extending over said first layer; a second layer formed of said oxidizable wide bandgap semiconductive material between said source, drain, and gate and said stop layer, said second layer being formed with a recess extending partially therethrough, wherein said gate is formed on the bottom of said recess.
Claim 9
Dependent Claim
107 words
An active transistor structure including a substrate; a first layer formed of an oxidizable wide bandgap semiconductive material over said substrate; a source drain, and gate which are ohmically separate from each other formed over said first layer; a single homogeneous oxidation-stop layer formed of a non-oxidizable narrow bandgap material under said source, drain, and gate which is sealingly extending over said first layer; a second layer formed of said oxidizable wide bandgap semiconductive material between said source, drain, and gate and said stop layer, said second layer being formed with a recess extending partially therethrough, wherein said gate is formed on the bottom of said recess.
Claim 10
Dependent Claim
32 words
A structure as in claim 7, further comprising a cap layer formed of said narrow bandgap non-oxidizable material between said source and drain; and said second layer laterally external of said recess.