Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
232 words
An apparatus for observing an image at a large plurality of positions on a surface of a panel under test, said positions being distinguishable by differences in capacitance or conductance, said apparatus comprising: means for producing optical energy; means for directing said optical energy into an input beam of any polarization state; an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means proportional to capacitance at points adjacent to electrically conductive regions of said panel under test, and said second face being disposed to be adjacent an area of said surface of said panel under test, said modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to impinge on said second face across a gap adjacent said area of said surface in order to cause in an output beam spatially-dependent modulation along said input beam, said modulation being evidenced as elevated transmissivity at positions of higher effective capacitance and reduced transmissivity at regions of lower effective capacitance on said surface; and means for detecting said modulation in an image across said output beam to analyze said surface.
Claim 2
Independent Claim
232 words
An apparatus for observing an image at a large plurality of positions on a surface of a panel under test, said positions being distinguishable by differences in capacitance or conductance, said apparatus comprising: means for producing optical energy; means for directing said optical energy into an input beam of any polarization state; an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means proportional to capacitance at points adjacent to electrically conductive regions of said panel under test, and said second face being disposed to be adjacent an area of said surface of said panel under test, said modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to impinge on said second face across a gap adjacent said area of said surface in order to cause in an output beam spatially-dependent modulation along said input beam, said modulation being evidenced as elevated transmissivity at positions of higher effective capacitance and reduced transmissivity at regions of lower effective capacitance on said surface; and means for detecting said modulation in an image across said output beam to analyze said surface.
Claim 3
Dependent Claim
56 words
The apparatus according to claim 1 wherein said modulator means has a light/voltage transfer characteristic with a nonlinear portion bridging a quasi-linear zone, wherein said bias reference is an rms value set to utilize said nonlinear portion of the light/voltage transfer characteristic in order to augment spatial resolution between regions of high capacitance and low capacitance.
Claim 4
Dependent Claim
48 words
The apparatus according to claim 1 wherein said second face of said electro-optic modulator means has an optically reflective coating such that said input beam and said output beam each pass through said electro-optic modulator means, further including means for separating said output beam from said input beam.
Claim 5
Dependent Claim
24 words
The apparatus according to claim 3 wherein said input beam and said output beam are collinear, and said separating means is a beam splitter.
Claim 6
Dependent Claim
41 words
The apparatus according to claim 1 wherein said modulation is power modulation and wherein said detecting means comprises: means for producing an observable map having features corresponding to capacitance across said gap between said modulator means and said panel under test.
Claim 7
Dependent Claim
14 words
The apparatus according to claim 5 wherein said map producing means is a camera.
Claim 8
Dependent Claim
15 words
The apparatus according to claim 1 wherein said electro-optic modulation means is a liquid crystal.
Claim 9
Dependent Claim
16 words
The apparatus according to claim 1 wherein said electro-optic modulation means is a polymer-dispersed liquid crystal.
Claim 10
Independent Claim
229 words
An apparatus for simultaneously observing a plurality of positions on a surface of a panel under test having positions of differing capacitance, said apparatus comprising: a light source for producing optical energy; an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means at points adjacent to higher capacitance positions of said panel under test, and said second face being disposed to be across a gap adjacent an area of said surface of said panel under test, said modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to impinge on said second face adjacent said area of said surface in order to cause in an output beam spatially-dependent change in light power along said input beam, said change in light power being evidenced as elevated transmissivity at positions of higher effective capacitance and reduced transmissivity at positions of lower capacitance; and means disposed to intercept said spatially-dependent light power modulation for producing an observable map of said surface of said panel under test having contrast features corresponding to positions of conductivity and positions of nonconductivity.
Claim 11
Independent Claim
229 words
An apparatus for simultaneously observing a plurality of positions on a surface of a panel under test having positions of differing capacitance, said apparatus comprising: a light source for producing optical energy; an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means at points adjacent to higher capacitance positions of said panel under test, and said second face being disposed to be across a gap adjacent an area of said surface of said panel under test, said modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to impinge on said second face adjacent said area of said surface in order to cause in an output beam spatially-dependent change in light power along said input beam, said change in light power being evidenced as elevated transmissivity at positions of higher effective capacitance and reduced transmissivity at positions of lower capacitance; and means disposed to intercept said spatially-dependent light power modulation for producing an observable map of said surface of said panel under test having contrast features corresponding to positions of conductivity and positions of nonconductivity.
Claim 12
Dependent Claim
56 words
The apparatus according to claim 9 wherein said modulator means has a light/voltage transfer characteristic with a nonlinear portion bridging a quasi-linear zone, wherein said bias reference is an rms value set to utilize said nonlinear portion of the light/voltage transfer characteristic in order to augment spatial resolution between positions of high capacitance and low capacitance.
Claim 13
Dependent Claim
61 words
The apparatus according to claim 9 wherein said second face of said electro-optic modulator means has an optically reflective coating such that said input beam and said output beam each pass through said electro-optic modulator means, further including means for separating said output beam from said input beam and wherein said separating means is a beam splitter for splitting optical energy.
Claim 14
Dependent Claim
72 words
The apparatus according to claim 9 further including means for biasing said conductive regions at a first bias level and subsequently at a second bias level; means for recording a first image at said first bias level and for recording a second image at a second bias level; and means for differentially comparing said first image and said second image to produce a third image, said third image being of enhanced contrast.
Claim 15
Independent Claim
203 words
A method for observing capacitance of positions on a surface of a panel under test comprising: directing an input beam of optical energy into an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means at points adjacent to electrically-connected and conductive regions of said panel under test, and said second face being disposed to be adjacent an area of said surface of said panel under test, said electro-optic modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to said second face adjacent said area of said surface of said panel under test in order to cause in an output beam a spatially-dependent modulation along said input beam, said modulation being evidenced as elevated transmissivity at positions of higher capacitance and reduced transmissivity at regions of lower capacitance on said surface; and detecting said modulation in an image across said output beam to analyze voltage differentials on said surface.
Claim 16
Independent Claim
203 words
A method for observing capacitance of positions on a surface of a panel under test comprising: directing an input beam of optical energy into an electro-optic modulator means, said electro-optic modulator means having a first face and an opposing second face in an orientation to allow longitudinal probing geometries, said first face having a conductive coating electrically coupled to a bias reference, said bias reference set to produce elevated optical transmissivity through said modulator means at points adjacent to electrically-connected and conductive regions of said panel under test, and said second face being disposed to be adjacent an area of said surface of said panel under test, said electro-optic modulator means being oriented to intercept at least a portion of said input beam directed into said modulator means through said first face to said second face adjacent said area of said surface of said panel under test in order to cause in an output beam a spatially-dependent modulation along said input beam, said modulation being evidenced as elevated transmissivity at positions of higher capacitance and reduced transmissivity at regions of lower capacitance on said surface; and detecting said modulation in an image across said output beam to analyze voltage differentials on said surface.
Claim 17
Dependent Claim
56 words
The method according to claim 13 wherein said modulator means has a light/voltage transfer characteristic with a nonlinear portion bridging a quasi-linear zone, wherein said bias reference is an rms value set to utilize said nonlinear portion of the light/voltage transfer characteristic in order to augment spatial resolution between positions of high capacitance and low capacitance.
Claim 18
Dependent Claim
41 words
The method according to claim 13 wherein said modulation is power modulation and wherein said detecting step comprises: producing from said spatially-dependent power modulation an observable map having features corresponding to capacitance between said modulation means and said panel under test.