US5166885A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Non-destructive monitoring of surfaces by 3-D profilometry using a power spectra
Assignee: General Electric Co
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Filing: 1991-01-28
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Granted: 1992-11-24
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Expires: 2011-01-28
Abstract
Abstract A method for monitoring the surface treatment of substrates is disclosed. The surface treatment, preferably, is shot peening. The surface treatment is monitored through the use of a selective spectral analysis of the 3-D information relating to the 3-D profilometry of the surface treatment on the substrate.
Inventors
- 👤 Robert A. Thompson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 15:28
CPC Classifications
B; B24; B24C; B24C7/00; B24C1/00; B24C1/10
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
180 words
A method for monitoring a surface treatment operation, a system user having predetermined a desired total plastic upset depth for said surface treatment, and having predetermined an amount of surface treatment data to be omitted, said method comprising the steps of: obtaining profile data of a workpiece surface which has been surface treated such that said profile data is being obtained in a nondestructive, direct, and three-dimensional manner; selecting an area of surface treatment on said workpiece to be analyzed from the obtained profile data of the workpiece; obtaining power spectra data of said area; filtering said power spectra data to substantially filter out said predetermined amount of surface treatment data; calculating an average peak value of said surface treatment from the filtered power spectra data; calculating an actual plastic upset depth for said selected area based on at least said average peak value; and adjusting, if needed, said surface treatment operation so that the actual total plastic upset depth of a subsequently formed surface treated are should be substantially in conformance with said predetermined desired total plastic upset depth.
Claim 2
Independent Claim
180 words
A method for monitoring a surface treatment operation, a system user having predetermined a desired total plastic upset depth for said surface treatment, and having predetermined an amount of surface treatment data to be omitted, said method comprising the steps of: obtaining profile data of a workpiece surface which has been surface treated such that said profile data is being obtained in a nondestructive, direct, and three-dimensional manner; selecting an area of surface treatment on said workpiece to be analyzed from the obtained profile data of the workpiece; obtaining power spectra data of said area; filtering said power spectra data to substantially filter out said predetermined amount of surface treatment data; calculating an average peak value of said surface treatment from the filtered power spectra data; calculating an actual plastic upset depth for said selected area based on at least said average peak value; and adjusting, if needed, said surface treatment operation so that the actual total plastic upset depth of a subsequently formed surface treated are should be substantially in conformance with said predetermined desired total plastic upset depth.
Claim 3
Dependent Claim
26 words
The method for monitoring said surface treatment operation, according to claim 1, wherein said surface treatment is further comprised of a shot peening operation and/or machining.
Claim 4
Dependent Claim
43 words
The method for monitoring said surface treatment operation, according to claim 2, wherein said filtering of said power spectra data comprises the step of: filtering out said predetermined amount of surface treatment to be omitted such that said machining is substantially filtered out.
Claim 5
Dependent Claim
41 words
The method for monitoring said surface treatment, according to claim 1, wherein obtaining profile data comprises the steps of: scanning said workpiece surface with a 3-D profilometer; and representing said profile data as a function of length versus width versus depth.
Claim 6
Dependent Claim
38 words
The method for monitoring said surface treatment, according to claim 1, wherein calculating said actual plastic upset depth further comprises the step of: calculating U≅d=2(uD).sup.1/2 wherein: U=total plastic upset depth u=dimple depth, d=dimple diameter, and D=effective shot diameter
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-11-24 | 1996-05-25 | 1996-11-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-11-24 | 2000-05-25 | 2000-11-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-11-24 | 2004-05-25 | 2004-11-24 | $7700.00 | Window Closed / Lapsed |