US5166099A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Manufacturing method for semiconductor device
Assignee: Mitsubishi Electric Corp
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Filing: 1991-09-13
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Granted: 1992-11-24
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Expires: 2011-09-13
Abstract
Abstract A manufacturing method for a semiconductor device in which an electrode of a semiconductor chip is electrically connected to an inner lead of a carrier tape. The electrodes of the semiconductor chip are brought into contact with the inner lead of the carrier tape. Bonding is performed with inner lead droop controlled to no more than 80 μm.
Inventors
- 👤 Tetsuya Ueda
- 👤 Osami Nakagawa
- 👤 Haruo Shimamoto
- 👤 Yasuhiro Teraoka
- 👤 Seiji Takemura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 16:44
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/071; H10W72/077; H10W70/00; H10W70/40; H10W70/453; H10W74/00; H10W74/01; H10W74/016; H10W72/0711; H10W72/07173; H10W72/50; H10W72/541; H10W72/5449; H10W72/701; H10W72/851; H10W72/874; H10W72/884; H10W90/00; H10W90/701; H10W90/721; H10W90/726; H10W90/751; H10W90/756; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
107 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape comprising: bringing electrodes of a semiconductor chip into contact with respective inner leads supported by a carrier tape; and while urging the semiconductor chip and the carrier tape in opposite directions, thereby urging the inner leads supported by the carrier tape away from the carrier tape, bonding the electrodes to the respective inner leads whereby droop of the inner leads at the electrodes relative to the positions of the leads on the supporting carrier tape is no more than 80 μm.
Claim 2
Independent Claim
107 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape comprising: bringing electrodes of a semiconductor chip into contact with respective inner leads supported by a carrier tape; and while urging the semiconductor chip and the carrier tape in opposite directions, thereby urging the inner leads supported by the carrier tape away from the carrier tape, bonding the electrodes to the respective inner leads whereby droop of the inner leads at the electrodes relative to the positions of the leads on the supporting carrier tape is no more than 80 μm.
Claim 3
Dependent Claim
28 words
The method claimed in claim 1 including resin encapsulating the semiconductor chip and carrier tape after bonding the respective electrodes and inner leads to protect the semiconductor chip.
Claim 4
Dependent Claim
111 words
The method claimed in claim 1 wherein the carrier tape is supported by and guided to the semiconductor chip by a tape guide comprising, before bringing the electrodes of the semiconductor chip into contact with respective inner leads supported by the carrier tape, adjusting the tilt of the tape guide supporting the carrier tape so that the carrier tape is parallel to the surface of the semiconductor chip on which the electrodes are present whereby, after bonding the electrodes to the respective inner leads, the droop of the inner leads at the electrodes relative to the positions of the leads on the supporting carrier tape is no more than 30 μm.
Claim 5
Independent Claim
100 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape comprising: bringing electrodes of a semiconductor chip into contact with respective inner leads supported by a carrier tape; electrically connecting the electrodes of the semiconductor chip to respective inner leads supported by the carrier tape; and encapsulating the semiconductor chip and the carrier tape with a resin to protect the semiconductor chip by injection molding with a resin having a minimum melted viscosity of not more than 200 P at the injection molding temperature.
Claim 6
Independent Claim
100 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape comprising: bringing electrodes of a semiconductor chip into contact with respective inner leads supported by a carrier tape; electrically connecting the electrodes of the semiconductor chip to respective inner leads supported by the carrier tape; and encapsulating the semiconductor chip and the carrier tape with a resin to protect the semiconductor chip by injection molding with a resin having a minimum melted viscosity of not more than 200 P at the injection molding temperature.
Claim 7
Independent Claim
147 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape and the semiconductor chip and the carrier tape are encapsulated in a resin by injection molding to protect the semiconductor chip comprising: forming a flow passage in a lead support portion of a carrier tape so that encapsulating resin can flow between both sides of the carrier tape; bringing electrodes of a semiconductor chip into contact with respective inner leads mounted on a carrier tape; electrically connecting the electrodes of the semiconductor chip to respective inner leads supported by the carrier tape; and encapsulating the semiconductor chip and the carrier tape with a resin to protect the semiconductor chip by injection molding with a resin having a minimum melted viscosity of not more than 200 P at the injection molding temperature.
Claim 8
Independent Claim
147 words
A method of manufacturing a semiconductor device in which electrodes of a semiconductor chip are electrically connected to respective inner leads supported by a carrier tape and the semiconductor chip and the carrier tape are encapsulated in a resin by injection molding to protect the semiconductor chip comprising: forming a flow passage in a lead support portion of a carrier tape so that encapsulating resin can flow between both sides of the carrier tape; bringing electrodes of a semiconductor chip into contact with respective inner leads mounted on a carrier tape; electrically connecting the electrodes of the semiconductor chip to respective inner leads supported by the carrier tape; and encapsulating the semiconductor chip and the carrier tape with a resin to protect the semiconductor chip by injection molding with a resin having a minimum melted viscosity of not more than 200 P at the injection molding temperature.
Claim 9
Dependent Claim
30 words
The method claimed in claim 5 including clamping no more than 30% of the thickness of the carrier tape during resin encapsulation of the semiconductor chip and the carrier tape.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-11-24 | 1996-05-25 | 1996-11-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-11-24 | 2000-05-25 | 2000-11-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-11-24 | 2004-05-25 | 2004-11-24 | $7700.00 | Window Closed / Lapsed |