Electronic test head positioner for test systems

Claim 2

In combination with a testing system for testing electronic devices having an electronic device handler and a substantially heavy electronic test head, a system for positioning said electronic test head through six degrees of freedom for docking and undocking with said electronic device handler comprising: a support column defining a first vertical axis; a positioner assembly including (a) a first arm unit: (i) having means for mounting said positioner assembly on said support column for vertical movement along said first vertical axis, (ii) defining a second vertical axis spaced from said first vertical axis such that said first vertical axis is always oriented vertically, and said first arm unit precludes a non-vertical orientation of said second vertical axis, and (iii) having horizontal linear motion guide means for providing horizontal linear movement of said heavy electronic test head with respect to said support column, said horizontal linear motion guide means including at least a first sliding member linearly slideably engaged within a receiving member, (b) a second arm unit: (i) having means for mounting said second arm unit to said first arm unit for pivotal movement about said second vertical axis (ii) mounted so as to preclude linear vertical movement relative to said first arm unit and (iii) defining a horizontal axis, which is precluded from not intersecting at least one of said first and second vertical axes, said second arm unit precluding a non-horizontal orientation of said horizontal axis, (c) a test head receiving unit: (i) having means for mounting said heavy electronic test head receiving unit to said second arm unit for pivotal movement of said heavy electronic test head about said horizontal axis, the test head receiving unit precluded from pivotal movement about a vertical axis other than at least one of said first vertical axis and said second vertical axis, and counterbalancing means coupled to said positioner assembly for providing a substantially weightless condition to said positioner assembly with the heavy electronic test head mounted on said test head receiving unit, the heavy electronic test head being manually rotated without the effect of gravity to permit docking and undocking of the heavy electronic test head with the electronic device handler.

Claim 3

A system according to claim 1 wherein said first arm unit is mounted on said support column for pivotal movement about said first vertical axis.

Claim 4

In combination with a testing system for testing electronic devices having an electronic device handler and a substantially heavy electronic test head, a system for positioning the heavy electronic test head for docking and undocking with the electronic device handler comprising: a support column having a part movable along a first vertical axis; a positioner assembly including (a) a first arm unit: (i) having means for mounting said positioner assembly on said support column for movement with said movable part of said support column along said first vertical axis, and (ii) defining a second vertical axis spaced from said first vertical axis such that said first vertical axis is always oriented vertically, and said first arm unit precludes a non-vertical orientation of said second vertical axis, (b) a second arm unit: (i) having means for mounting said second arm unit to said first arm unit for pivotal movement about said second vertical axis, (ii) mounted so as to preclude linear vertical movement relative to said first arm unit, and (iii) defining a horizontal axis which is precluded from not intersecting at least one of said first and second vertical axes, said second arm unit precluding a non-horizontal orientation of said horizontal axis, (c) a test head receiving unit having: (i) means for mounting said test head receiving unit to said second arm unit for pivotal movement about said horizontal axis, and (ii) means for mounting the heavy electronic test head to said test head receiving unit for pivotal movement about an axis pivotable about said horizontal axis in a plane perpendicular to said horizontal axis, and (d) horizontal linear motion guide means for providing horizontal linear movement of said heavy electronic test head with respect to said support column, said horizontal linear motion guide means having at least a first sliding member linearly slideably engaged within a receiving member; the positioner assembly structurally precluding the heavy electronic test head from pivotal movement about a vertical axis other than at least one of said first vertical axis, said second vertical axis and said axis pivotable about said horizontal axis; and counterbalancing means coupled to said positioner assembly for providing a substantially weightless condition to said positioner assembly with the heavy electronic test head being free to rotate about at least two of the first vertical axis, the second vertical axis and the horizontal axis as the heavy electronic test head is manually rotated without the effect of gravity to permit docking and undocking of the heavy electronic test head with the electronic device handler.

Claim 5

In combination with a testing system for testing electronic devices having an electronic device handler and a substantially heavy electronic test head, a system for positioning the heavy electronic test head for docking and undocking with the electronic device handler comprising: a support column having a part movable along a first vertical axis; a positioner assembly including (a) a first arm unit: (i) having means for mounting said positioner assembly on said support column for movement with said movable part of said support column along said first vertical axis, and (ii) defining a second vertical axis spaced from said first vertical axis such that said first vertical axis is always oriented vertically, and said first arm unit precludes a non-vertical orientation of said second vertical axis, (b) a second arm unit: (i) having means for mounting said second arm unit to said first arm unit for pivotal movement about said second vertical axis, (ii) mounted so as to preclude linear vertical movement relative to said first arm unit, and (iii) defining a horizontal axis which is precluded from not intersecting at least one of said first and second vertical axes, said second arm unit precluding a non-horizontal orientation of said horizontal axis, (c) a test head receiving unit having: (i) means for mounting said test head receiving unit to said second arm unit for pivotal movement about said horizontal axis, and (ii) means for mounting the heavy electronic test head to said test head receiving unit for pivotal movement about an axis pivotable about said horizontal axis in a plane perpendicular to said horizontal axis, and (d) horizontal linear motion guide means for providing horizontal linear movement of said heavy electronic test head with respect to said support column, said horizontal linear motion guide means having at least a first sliding member linearly slideably engaged within a receiving member; the positioner assembly structurally precluding the heavy electronic test head from pivotal movement about a vertical axis other than at least one of said first vertical axis, said second vertical axis and said axis pivotable about said horizontal axis; and counterbalancing means coupled to said positioner assembly for providing a substantially weightless condition to said positioner assembly with the heavy electronic test head being free to rotate about at least two of the first vertical axis, the second vertical axis and the horizontal axis as the heavy electronic test head is manually rotated without the effect of gravity to permit docking and undocking of the heavy electronic test head with the electronic device handler.

Claim 6

In the combination of claim 1, the test head and the device handler further comprising respective first and second electric contact means adapted to mate with each other upon docking of the device handler and test head.

Claim 7

In the combination of claim 1, at least first and second alignment pins rigidly secured to one of the test head and the device handler, at least first and second alignment bars having respective first and second guide openings rigidly secured to the other of the test head and the device handler, the first and second guide openings adapted for receiving the first and second alignment pins for accurate mating of the first and second contact means.

Claim 8

In combination with a testing system for testing electronic devices having an electronic device handler and a substantially heavy electronic test head, a system for positioning the heavy electronic test head through six degrees of freedom for docking and undocking with said electronic device handler comprising: a support column defining a first vertical axis; a positioner assembly including (a) a first arm unit: (i) having means for mounting said positioner assembly on said support column for vertical movement along said first vertical axis, (ii) defining a second vertical axis spaced from said first vertical axis such that said first vertical axis is always oriented vertically, and said first arm unit precludes a non-vertical orientation of said second vertical axis, and (iii) having horizontal linear motion guide means for providing horizontal linear movement of said test head with respect to said support column, said horizontal linear motion guide means having at least a first sliding member having a first horizontal longitudinal axis and linearly slideably engaged within a receiving member, (b) a second arm unit: (i) having means for mounting said second arm unit to said first arm unit for pivotal movement about said second vertical axis (ii) mounted so as to preclude linear vertical movement relative to said first arm unit and (iii) defining a second horizontal axis adjacent to the first horizontal longitudinal axis, said second arm unit precluding a non-horizontal orientation of said second horizontal axis, (c) a test head receiving unit having: means for mounting said test head receiving unit to said second arm unit for pivotal movement about said second horizontal axis, wherein the heavy electronic test head is precluded from being entirely below said first horizontal longitudinal axis and said second arm unit, means for mounting the heavy electronic test head to said test head receiving unit for pivotal movement about an axis pivotable about said second horizontal axis in a plane perpendicular to said second horizontal axis, the positioner assembly structurally precluding the test head from pivotal movement about a vertical axis other than at least one of said first vertical axis, said second vertical axis and said axis pivotable about said second horizontal axis; and counterbalancing means coupled to said positioner assembly for providing a substantially weightless condition to said positioner assembly with a test head mounted on said test head receiving unit, the heavy electronic test head being manually rotated without the effect of gravity to permit docking and undocking of the heavy electronic test head with the electronic device handler.

Claim 9

In combination with a testing system for testing electronic devices having an electronic device handler and a substantially heavy electronic test head, a system for positioning the heavy electronic test head through six degrees of freedom for docking and undocking with said electronic device handler comprising: a support column defining a first vertical axis; a positioner assembly including (a) a first arm unit: (i) having means for mounting said positioner assembly on said support column for vertical movement along said first vertical axis, (ii) defining a second vertical axis spaced from said first vertical axis such that said first vertical axis is always oriented vertically, and said first arm unit precludes a non-vertical orientation of said second vertical axis, and (iii) having horizontal linear motion guide means for providing horizontal linear movement of said test head with respect to said support column, said horizontal linear motion guide means having at least a first sliding member having a first horizontal longitudinal axis and linearly slideably engaged within a receiving member, (b) a second arm unit: (i) having means for mounting said second arm unit to said first arm unit for pivotal movement about said second vertical axis (ii) mounted so as to preclude linear vertical movement relative to said first arm unit and (iii) defining a second horizontal axis adjacent to the first horizontal longitudinal axis, said second arm unit precluding a non-horizontal orientation of said second horizontal axis, (c) a test head receiving unit having: means for mounting said test head receiving unit to said second arm unit for pivotal movement about said second horizontal axis, wherein the heavy electronic test head is precluded from being entirely below said first horizontal longitudinal axis and said second arm unit, means for mounting the heavy electronic test head to said test head receiving unit for pivotal movement about an axis pivotable about said second horizontal axis in a plane perpendicular to said second horizontal axis, the positioner assembly structurally precluding the test head from pivotal movement about a vertical axis other than at least one of said first vertical axis, said second vertical axis and said axis pivotable about said second horizontal axis; and counterbalancing means coupled to said positioner assembly for providing a substantially weightless condition to said positioner assembly with a test head mounted on said test head receiving unit, the heavy electronic test head being manually rotated without the effect of gravity to permit docking and undocking of the heavy electronic test head with the electronic device handler.

Claim 10

In the combination of claim 3, the test head and the device handler further comprising respective first and second electric contact means adapted to mate with each other upon docking of the device handler and test head.

Claim 11

In the combination of claim 3, at least first and second alignment pins rigidly secured to one of the test head and the device handler, at least first and second alignment bars having respective first and second guide openings rigidly secured to the other of the test head and the device handler, the first and second guide openings adapted for receiving the first and second alignment pins for accurate mating of the first and second contact means.