Plural superconductive magnetoresistors for measuring distribution of magnetic field with individual biasing applied sequentially

Claim 2

A magnetic field distribution measuring apparatus for measuring an external magnetic field distribution comprising: a substrate made of nonmagnetic material and having a first surface and a second surface; a plurality of magnetoresistive elements deposited on said first surface of said substrate, each one of said plurality of magnetoresistive elements made of superconductive material having a weak coupling at the grain boundaries the magnetoresistive elements connected is series; a distinct bias magnetic field element corresponding to each magnetoresistive element for applying a bias magnetic field individually in a time sharing manner, to each one of said magnetoresistive elements; and means for detecting a distribution of voltage drop across said plurality of magnetoresistive elements.

Claim 3

A magnetic field distribution measuring apparatus of measuring an external magnetic field distribution comprising: a substrate mad of a nonmagnetic material and having a first surface and a second surface; a plurality of magnetoresistive elements deposited on said first surface of said substrate and each made of a superconductive material having a weak coupling at the grain boundaries; means for applying a bias magnetic field individually to each said magnetoresistive element; and means for detecting a distribution of voltage drop across said plurality of magnetoresistive elements; wherein said plurality of magnetoresistive elements are connected in series between a first pair of terminals connectable to current source and also between a second pair of terminals connectable to a voltage meter, and wherein said applying means applies sequentially to said magnetoresistive elements a bias magnetic field having a strength lower than a predetermined bias magnetic field threshold level at which said magnetoresistive element changes the state from a superconductive state to a magnetoresistive state.

Claim 4

A magnetic field distribution measuring apparatus of measuring an external magnetic field distribution comprising: a substrate mad of a nonmagnetic material and having a first surface and a second surface; a plurality of magnetoresistive elements deposited on said first surface of said substrate and each made of a superconductive material having a weak coupling at the grain boundaries; means for applying a bias magnetic field individually to each said magnetoresistive element; and means for detecting a distribution of voltage drop across said plurality of magnetoresistive elements; wherein said plurality of magnetoresistive elements are connected in series between a first pair of terminals connectable to current source and also between a second pair of terminals connectable to a voltage meter, and wherein said applying means applies sequentially to said magnetoresistive elements a bias magnetic field having a strength lower than a predetermined bias magnetic field threshold level at which said magnetoresistive element changes the state from a superconductive state to a magnetoresistive state.

Claim 5

A magnetic field strength measuring apparatus as claimed in claim 2, wherein said plurality of magnetoresistive elements are connected in series by a conductor formed by the same material as that used for making said magnetoresistive elements.

Claim 6

A magnetic field distribution measuring apparatus for measuring an external magnetic field distribution comprising: a substrate made of nonmagnetic material and having a first surface and a second surface; a plurality of magnetoresistive elements deposited on said first surface of said substrate and each made of a superconductive material having a weak coupling at the grain boundaries; means for applying a bias magnetic field individually to each said magnetoresistive element; and means for detecting a distribution of voltage drop across said plurality of magnetoresistive element; wherein said applying means comprises a coil means deposited on said second surface of said substrate at a position corresponding to said magnetoresistive element, and a current supplying means for supplying a predetermined bias current to said coil means, said current supplying means supplies AC current to generate AC bias magnetic field with a peak value being greater than a magnetic field threshold level at which said each magnetoresistive element changes the state from a superconductive state to a magnetoresistive state.

Claim 7

A magnetic field distribution measuring apparatus for measuring an external magnetic field distribution comprising: a substrate made of nonmagnetic material and having a first surface and a second surface; a plurality of magnetoresistive elements deposited on said first surface of said substrate and each made of a superconductive material having a weak coupling at the grain boundaries; means for applying a bias magnetic field individually to each said magnetoresistive element; and means for detecting a distribution of voltage drop across said plurality of magnetoresistive element; wherein said applying means comprises a coil means deposited on said second surface of said substrate at a position corresponding to said magnetoresistive element, and a current supplying means for supplying a predetermined bias current to said coil means, said current supplying means supplies AC current to generate AC bias magnetic field with a peak value being greater than a magnetic field threshold level at which said each magnetoresistive element changes the state from a superconductive state to a magnetoresistive state.

Claim 8

A magnetic field distribution measuring apparatus as claimed in claim 4, wherein said applying means comprises a plurality of coils deposited on said second surface of said substrate at positions corresponding to said magnetoresistive elements, and a current supplying means for supplying a predetermined bias current sequentially to said plurality of said coils.

Claim 9

A magnetic field distribution measuring apparatus as claimed in claim 5, wherein each of said coils comprises first coil element deposited on said second surface of said substrate and a second coil element deposited over said first coil element through an insulation layer.

Claim 10

A magnetic field distribution measuring apparatus as claimed in claim 6, wherein said magnetoresistive elements are aligned in a first plane, and said coils are aligned in a second plane adjacent to said first plain at positions corresponding to said magnetoresistive elements.

Claim 11

A magnetic field distribution measuring apparatus as claimed in claim 7, wherein said first coil elements aligned in a first direction are connected in series to provide a plurality of first series connections, and said second coil elements aligned in a second direction are connected in series to provide a plurality of second series connections.

Claim 12

A magnetic field distribution measuring apparatus as claimed in claim 8, wherein said current supplying means comprises a first current source coupled with a first switching means for supplying a current to a selected one of a plurality of said first series connections, and a second current source coupled with a second switching means for supplying a current to a selected one of a plurality of said second series connections, whereby a coil at an intersection between said selected first and second series connections produces a highest magnetic field among the coils.

Claim 13

A magnetic field distribution measuring apparatus as claimed in claim 9, wherein each of said first and second current supplying means supplies AC current to generate AC bias magnetic field so that a peak value of the magnetic field as produced from the coil at said intersection being greater than a magnetic field threshold level at which said magnetoresistive element changes the state from a superconductive state to a magnetoresistive state.

Claim 14

A magnetic field distribution measuring apparatus as claimed in claim 9, wherein first and second switching means is so operated as to sequentially change the coil that produces the highest magnetic field for the detection of magnetic field distribution over the alignment of said magnetoresistive element.

Claim 15

A magnetic field strength measuring apparatus as claimed in claim 1 wherein said distinct bias magnetic field element is located on said second surface.