Test fixture with diaphragm board with one or more internal grounded layers

Claim 2

In an electrical test system for testing circuit boards comprising a non-conducting probe board with upper and lower extended flat surfaces, multiple feed through holes therein, conductive probe means passing through the holes, a vacuum environment chamber defined as the volume formed between the board under test and the probe board, means for vacuum drawing and release in each test cycle.

Claim 3

System in accordance with claim 1 wherein the conductive layer is within 0.01 inches of the surface layer in said region.

Claim 4

System in accordance with claim 1 wherein the holes in such region are expanded to avoid probe means, conductive layer contact.

Claim 5

The system of claim 3 wherein the expansions are countersinks.

Claim 6

System in accordance with claim 1 wherein the said region is substantially the entirety of one of said flat surfaces.

Claim 7

System in accordance with claim 5 wherein the said region is substantially the entirety of both flat surfaces.

Claim 8

System in accordance with claim 1 wherein the probe means for testing comprises assemblies, each being a pin within a tube, (of the diaphragm board) extended from the probe board through holes in the diaphragm board and towards test points of the circuit board, each said pin being spring loaded within said tube, and further comprising a conductive lateral member passing through the diaphragm board and contacting each conductive layer therein and extending to a bottom face of the diaphragm board, and a further pin within a tube probe assembly, that extends to and contacts a lower end of the conductive lateral member, said further probe assembly being grounded.

Claim 9

An electrical test system for circuit boards comprising, in combination: (a) means defining at least one bed of nails test probe array with a base and test probes extending therefrom: (b) means for supporting a board to be tested in opposing escalation to each test probe array; (c) means for relatively moving the board and array towards each other for engagement and disengagement of the test points on the board with probe ends, said region between said board and said array defining planar regions; (d) means for draining to ground static charge from at least one said planar region between the test probe array base and circuit board under test without grounding circuitry or electrical test points of the circuit board or the probes and essentially without any direct physical contact with the base, probes or circuit board.

Claim 10

An electrical test system for circuit boards comprising, in combination: (a) means defining at least one bed of nails test probe array with a base and test probes extending therefrom: (b) means for supporting a board to be tested in opposing escalation to each test probe array; (c) means for relatively moving the board and array towards each other for engagement and disengagement of the test points on the board with probe ends, said region between said board and said array defining planar regions; (d) means for draining to ground static charge from at least one said planar region between the test probe array base and circuit board under test without grounding circuitry or electrical test points of the circuit board or the probes and essentially without any direct physical contact with the base, probes or circuit board.

Claim 11

System in accordance with claim 8 wherein each means for draining to ground comprises a diaphragm board with holes for clear passage of probes, dispersing means for floating the diaphragm board between its surrounding circuit board and probe array base, the diaphragm board being non-conductive except for at least one conductive sub-surface layer thereof close to but not at its surface, and conductive member means for connecting each such conductive layer to ground.