US5136162A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Measuring device in a scanning probe microscope
Assignee: Olympus Corp
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Filing: 1991-07-16
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Granted: 1992-08-04
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Expires: 2011-07-16
Abstract
Abstract A probe for scanning a sample is attached to a probe electrode supported by a cylindrical piezoelectric actuator. The actuator has four drive electrodes on its periphery, and deforms in the three axial directions in accordance with the voltage applied to the drive electrodes. A girdling electrode is provided between the actuator and the probe electrode. The girdling electrode is insulated from the probe electrode and the drive electrodes by insulator members provided on its upper and lower surfaces. A bias voltage signal S1 is input to an operational amplifier of which the output is connected to the girdling electrode. The amplifier is a voltage follower for equalizing the potential of the girdling electrode to that of the bias voltage signal S1. An operational amplifier has a non-inversion input to which the bias voltage signal S1 is input, and an inversion input connected to the probe electrode. While equalizing the potential of the probe electrode to that of the bias input voltage S1, the amplifier converts a tunnel current flowing between the probe and the sample to a voltage signal S2. An operational amplifier subtracts a bias voltage component from the voltage signal S2, and outputs a tunnel current signal S3.
Inventors
- 👤 Hirofumi Miyamoto
- 👤 Tsugiko Takase
- 👤 Hiroshi Kajimura
- 👤 Akitoshi Toda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 13:01
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/10; G01Q60/16; B; B82; B82Y; B82Y35/00; G01Q10/00; G01Q10/04; G01Q20/00; G01Q20/04; Y; Y10; Y10S; Y10S977/00; Y10S977/84; Y10S977/849; Y10S977/86
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
82 words
A measuring device in a scanning probe microscope, comprising: an electrically conductive probe; a probe electrode, connected to said probe, for taking out a tunnel current; scanning means having drive electrodes and controlled electrically to scan the probe; a girdling electrode provided between said drive electrodes of the scanning means and the probe electrode and electrically insulated from these electrodes; and voltage application means for applying a voltage, which is equal to the voltage applied to the probe, to the girdling electrode.
Claim 2
Dependent Claim
82 words
A measuring device in a scanning probe microscope, comprising: an electrically conductive probe; a probe electrode, connected to said probe, for taking out a tunnel current; scanning means having drive electrodes and controlled electrically to scan the probe; a girdling electrode provided between said drive electrodes of the scanning means and the probe electrode and electrically insulated from these electrodes; and voltage application means for applying a voltage, which is equal to the voltage applied to the probe, to the girdling electrode.
Claim 3
Dependent Claim
37 words
The device according to claim 1, wherein said scanning means compress a cylindrical piezoelectric actuator including a cylindrical piezoelectric element, a common electrode provided within said piezoelectric element, and four drive electrodes provided around said piezoelectric element.
Claim 4
Dependent Claim
38 words
The device according to claim 1, wherein said scanning means comprises a cantilever including two plate-like piezoelectric elements, a plate-like common electrode interposed between the two piezoelectric elements, and two strip-like drive electrodes provided on each piezoelectric element.
Claim 5
Dependent Claim
104 words
A measuring device in a scanning probe microscope, comprising: a probe with a pointed tip; a lever member having said probe at its free end portion, and being elastically deformable upon receiving a force acting between the tip of the probe and the surface of a sample; support means for fixing and supporting the other end portion of the lever member; an electrode formed integral with the support means and situated so as to face the lever member; an electrically conductive support substrate for supporting the sample; an a power source for applying a voltage between said electrode and said electrically conductive support substrate.
Claim 6
Dependent Claim
104 words
A measuring device in a scanning probe microscope, comprising: a probe with a pointed tip; a lever member having said probe at its free end portion, and being elastically deformable upon receiving a force acting between the tip of the probe and the surface of a sample; support means for fixing and supporting the other end portion of the lever member; an electrode formed integral with the support means and situated so as to face the lever member; an electrically conductive support substrate for supporting the sample; an a power source for applying a voltage between said electrode and said electrically conductive support substrate.
Claim 7
Dependent Claim
76 words
The device according to claim 4, wherein a polarizing member is provided on that side of the electrode, which faces the sample, so as to face the lever member, and wherein said power source comprises a controllable power source capable of displacing the lever member by exerting a coulomb force between the charge generated on the surface of the polarizing member by the applied voltage, and the charge generated on the lever member or the probe.
Claim 8
Dependent Claim
22 words
The device according to claim 4, wherein said electrode comprises two or more independent electrodes, each having an independently controllable power source.
Claim 9
Dependent Claim
29 words
The device according to claim 4, wherein said probe and the sample have electrical conductivity, and the power source comprises a control power source controlled to polarize the sample.
Claim 10
Dependent Claim
16 words
The device according to claim 7, wherein said control power source generates a rectangular pulse voltage.
Claim 11
Dependent Claim
31 words
The device according to claim 4, wherein said power source is controlled to control an electric field between the electrode and the electrically conductive support substrate and to polarize the sample.
Claim 12
Dependent Claim
23 words
The device according to claim 4, wherein said electrically conductive substrate is formed to support the sample with a polarizable film interposed therebetween.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-08-04 | 1996-02-03 | 1996-08-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-08-04 | 2000-02-03 | 2000-08-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-08-04 | 2004-02-03 | 2004-08-04 | $7700.00 | Window Closed / Lapsed |