US5135886A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuit fabrication utilizing amorphous layers
Assignee: Agere Systems LLC
•
Filing: 1990-12-06
•
Granted: 1992-08-04
•
Expires: 2010-12-06
Abstract
Abstract A process for the formation of material layers such as amorphous silicon is disclosed. When a precursor gas such as silane is utilized to form amorphous silicon, silicon crystals are often formed on top of the amorphous silicon layer. The crystals are created by the presence of low pressure silane in the reactor at the end of the deposition cycle. Formation of crystals is inhibited by lowering the temperature before silane flow is terminated.
Inventors
- 👤 Ajit S. Manocha
- 👤 Arun K. Nanda
- 👤 Virendra V. S. Rana
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:09
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C23C16/24; H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/60; H10P14/61
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
129 words
A method of semiconductor fabrication comprising: forming a layer of silicon material, said silicon material being capable of existence in at least a desired amorphous and undesired crystalline phase; said formation occurring in a reactor utilizing a precursor gas flowing at a first temperature and a first pressure associated with said desired phase of said material; terminating said formation process by shutting of the flow of said precursor gas, thereby reducing the pressure of said precursor gas in said reactor to a pressure sufficient to cause formation of additional material in said undesired phase, characterized by prior to said terminating step, changing the temperature to a second temperature whereby said precursor gas at said reduced pressure forms silicon material in said desired phase rather than in said undesired phase.
Claim 2
Independent Claim
129 words
A method of semiconductor fabrication comprising: forming a layer of silicon material, said silicon material being capable of existence in at least a desired amorphous and undesired crystalline phase; said formation occurring in a reactor utilizing a precursor gas flowing at a first temperature and a first pressure associated with said desired phase of said material; terminating said formation process by shutting of the flow of said precursor gas, thereby reducing the pressure of said precursor gas in said reactor to a pressure sufficient to cause formation of additional material in said undesired phase, characterized by prior to said terminating step, changing the temperature to a second temperature whereby said precursor gas at said reduced pressure forms silicon material in said desired phase rather than in said undesired phase.
Claim 3
Dependent Claim
14 words
The method of claim 1 in which said first temperature is approximately 530°-570° C.
Claim 4
Dependent Claim
15 words
The method of claim 1 in which said first pressure is 1 Torr or less.
Claim 5
Dependent Claim
15 words
The method of claim 1 in which said second temperature is 500° C. or lower.
Claim 6
Dependent Claim
28 words
The method of claim 1 in which said precursor gas is chosen from the group consisting of silane, SiHCl 3 , SiH 2 SiH 3 Cl and disilane.
Claim 7
Independent Claim
57 words
A method of semiconductor fabrication comprising: forming a layer of amorphous silicon in a reactor utilizing flowing silane at a pressure of approximately 280 mTorr±10%, and a temperature of approximately 530°-570° C. reducing the temperature to substantially less than 530° C., and then terminating said silane flow, thereby inhibiting the formation of undesired particles of crystalline silicon.
Claim 8
Independent Claim
57 words
A method of semiconductor fabrication comprising: forming a layer of amorphous silicon in a reactor utilizing flowing silane at a pressure of approximately 280 mTorr±10%, and a temperature of approximately 530°-570° C. reducing the temperature to substantially less than 530° C., and then terminating said silane flow, thereby inhibiting the formation of undesired particles of crystalline silicon.
References Cited (Backward Citations)
US4317844A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-08-04 | 1996-02-03 | 1996-08-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-08-04 | 2000-02-03 | 2000-08-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-08-04 | 2004-02-03 | 2004-08-04 | $7700.00 | Window Closed / Lapsed |