US5126660A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Optical probing method and apparatus
Assignee: Nokia Bell Labs
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Filing: 1991-01-02
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Granted: 1992-06-30
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Expires: 2011-01-02
Abstract
Abstract An integrated circuit device (11) is tested by directing a laser beam (19) onto an electrochromic member (17) in close proximity to a conductor (13) of the integrated circuit. Reflected laser light is directed to a detector (21) which converts it to an electrical signal for display by a lock-in amplifier (25). The display characterizes the voltage on the conductor (17) and thereby permits diagnosis of the operation of the integrated circuit (11).
Inventors
- 👤 George T. Harvey
- 👤 Michael S. Heutmaker
- 👤 Mark G. Kuzyk
- 👤 Kenneth D. Singer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 03:54
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/308
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
165 words
A method for diagnosing a semiconductor integrated circuit comprising the steps of: locating an electrochromic material in proximity to a conductor of the integrated circuit; causing a first high frequency electrical signal to be transmitted by the conductor such that electric fields of the signal extend into the electrochromic material forming and projecting a laser light beam; directing at least part of the laser beam through at least part of the electrochromic material such that the material modulates the laser beam in accordance with the first electrical signal; the light directed through the electrochromic material being unpolarized or of arbitrary or unspecified polarization; the electrochromic material being coated on a first end of an optical fiber; the first end of the optical fiber being abutted against the conductor; the laser beam being projected into a second end of the optical fiber; converting the modulated laser beam to a second electrical signal; and using the second electrical signal as an aid in diagnosing the integrated circuit.
Claim 2
Independent Claim
165 words
A method for diagnosing a semiconductor integrated circuit comprising the steps of: locating an electrochromic material in proximity to a conductor of the integrated circuit; causing a first high frequency electrical signal to be transmitted by the conductor such that electric fields of the signal extend into the electrochromic material forming and projecting a laser light beam; directing at least part of the laser beam through at least part of the electrochromic material such that the material modulates the laser beam in accordance with the first electrical signal; the light directed through the electrochromic material being unpolarized or of arbitrary or unspecified polarization; the electrochromic material being coated on a first end of an optical fiber; the first end of the optical fiber being abutted against the conductor; the laser beam being projected into a second end of the optical fiber; converting the modulated laser beam to a second electrical signal; and using the second electrical signal as an aid in diagnosing the integrated circuit.
Claim 3
Dependent Claim
15 words
The method of claim 1 wherein: the electrochromic material comprises dye contained in a polymer.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-06-30 | 1995-12-30 | 1996-06-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-06-30 | 1999-12-30 | 2000-06-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-06-30 | 2003-12-30 | 2004-06-30 | $7700.00 | Window Closed / Lapsed |