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US5126550A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for assessing the optical quality of an imaging device

Assignee: ITT Manufacturing Enterprises LLC
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Filing: 1991-03-27
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Granted: 1992-06-30
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Expires: 2011-03-27
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Abstract

Abstract A method for assessing the optical quality of an imaging device. The method is suitable for use in an optical system comprising a source of radiation that can output a radiation beam; and, an imaging device to be tested, which imaging device can image the radiation beam to produce an imaged beam. The steps of the method comprise: sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask; and, computing an optical transfer function (OTF) for the localized wavefront errors transmitted through the sampling apertures. The method has an advantage of expanding the applicability of the optical transfer function, heretofore a measure only of global imaging device performance, so that it can provide information for correcting an imaging device defect in terms of local area modifications.

Inventors

  • 👤 Jerold B. Lisson
  • 👤 Darryl I. Mounts
  • 👤 Dale K. Mack

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 23:56
CPC Classifications
G; G01; G01M; G01M11/00; G01M11/02; G01M11/0292

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 102 words
A method which is suitable for use in an optical system comprising a source of radiation that can output a radiation beam; and, an imaging device to be tested for its global imaging performance, which imaging device can image the radiation beam to produce an image beam, the steps of the method comprising: a) sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask; and b) computing a localized optical transfer function (OTF) for the localized wavefront errors transmitted through the sampling apertures.
Claim 2
Independent Claim 102 words
A method which is suitable for use in an optical system comprising a source of radiation that can output a radiation beam; and, an imaging device to be tested for its global imaging performance, which imaging device can image the radiation beam to produce an image beam, the steps of the method comprising: a) sampling the imaged beam by an opaque mask defining at least two apertures, for generating local wavefront errors at a pupil position defined by a location of the mask; and b) computing a localized optical transfer function (OTF) for the localized wavefront errors transmitted through the sampling apertures.
Claim 3
Dependent Claim 21 words
The method according to claim 1, comprising the step of prioritizing maximally offensive local wavefront errors with respect to imaging performance.
Claim 4
Dependent Claim 30 words
The method according to claim 1, comprising computing a phase transfer function part of the localized optical transfer function, for determining a localized amount and direction of wavefront error modification.

References Cited (Backward Citations)

US3930732A Cited
US4772120A Cited
US4950878A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-06-30 1995-12-30 1996-06-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-06-30 1999-12-30 2000-06-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-06-30 2003-12-30 2004-06-30 $7700.00 Window Closed / Lapsed

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