US5120571A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Floating-gate memory array with silicided buried bitlines and with single-step-defined floating gates
Assignee: Texas Instruments Inc
•
Filing: 1991-01-07
•
Granted: 1992-06-09
•
Expires: 2011-01-07
Abstract
Abstract A contact-free floating-gate non-volatile memory cell array and process with silicided NSAG bitlines and with source/drain regions buried beneath relatively thick silicon oxide. The bitlines have a relatively small resistance, eliminating the need for parallel metallic conductors with numerous bitline contacts. The array has relatively small bitline capacitance and may be constructed having relatively small dimensions. Isolation between wordlines and between bitlines is by thick field oxide regions. A thick field oxide strip separates each ground conductor/bitline pair. Wordlines may be formed from silicided polycrystalline or other material with low resistivity. Coupling of programming and erasing voltages to the floating gate is improved by extending the gates over the thick field oxide and perhaps by using an insulator with relatively high dielectric constant between the control gate and the floating gate. The four sides of the floating gates are defined with a single patterning step. The resulting structure is a dense cross-point array of programmable memory cells.
Inventors
- 👤 Manzur Gill
- 👤 Howard L. Tigelaar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 08:38
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10B; H10B69/00; H10D30/683; H10D30/684; H10D30/686; Y; Y10; Y10S; Y10S438/00; Y10S438/981
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
266 words
A method for making a non-volatile memory cell array including bitlines and wordlines in a face of a semiconductor substrate of first conductivity type, comprising the steps of: forming thick field oxide regions and thick field oxide strips, both with underlying channel stop regions in said face; growing a gate oxide layer on said face; applying a first conductive layer on said face; applying a second conductive layer on said face overlying and insulated from said first conductive layer by an inter-level dielectric layer; forming a protective layer over said second conductive layer; patterning said protective layer and forming control-and floating-gates such that said gates are substantially centered between said thick field oxide regions and such that said gates extend over a part of adjacent said thick field oxide regions; forming a single-step, thermally grown oxide layer on at least the sides of said floating gates; implanting an impurity material of second conductivity type to form conductors parallel to and adjacent to said control-and floating-gates, with three of said conductors between said thick field oxide strips; siliciding said conductors; forming an insulating oxide region in the space between said control- and floating-gates and over said conductors and said thick field oxide regions; removing a part of said insulating oxide region and substantially all of said protective layer to form a surface substantially planar including the upper surface of said second control gates; applying a third conductive layer to said substantially planar surface; and patterning said third conductive layer and etching through said third conductive layer to form wordlines over and in contact with said control gates.
Claim 2
Independent Claim
266 words
A method for making a non-volatile memory cell array including bitlines and wordlines in a face of a semiconductor substrate of first conductivity type, comprising the steps of: forming thick field oxide regions and thick field oxide strips, both with underlying channel stop regions in said face; growing a gate oxide layer on said face; applying a first conductive layer on said face; applying a second conductive layer on said face overlying and insulated from said first conductive layer by an inter-level dielectric layer; forming a protective layer over said second conductive layer; patterning said protective layer and forming control-and floating-gates such that said gates are substantially centered between said thick field oxide regions and such that said gates extend over a part of adjacent said thick field oxide regions; forming a single-step, thermally grown oxide layer on at least the sides of said floating gates; implanting an impurity material of second conductivity type to form conductors parallel to and adjacent to said control-and floating-gates, with three of said conductors between said thick field oxide strips; siliciding said conductors; forming an insulating oxide region in the space between said control- and floating-gates and over said conductors and said thick field oxide regions; removing a part of said insulating oxide region and substantially all of said protective layer to form a surface substantially planar including the upper surface of said second control gates; applying a third conductive layer to said substantially planar surface; and patterning said third conductive layer and etching through said third conductive layer to form wordlines over and in contact with said control gates.
Claim 3
Dependent Claim
26 words
A method according to claim 1 including forming second insulating oxide strips on said face between said wordlines and over portions of said insulating oxide region.
Claim 4
Dependent Claim
18 words
A method according to claim 1 wherein said first impurity-type is P-type and said second impurity-type is N-type.
Claim 5
Dependent Claim
15 words
A method according to claim 20 wherein said first and second layers are polycrystalline silicon.
Claim 6
Dependent Claim
27 words
A method according to claim 1 wherein sidewall oxide spacers are formed adjacent said control-gate strips and said floating-gate strips after said implanting of an impurity material.
Claim 7
Dependent Claim
27 words
A method according to claim 1 wherein sidewall oxide spacers are formed adjacent said control-gate strips and said floating-gate strips before said implanting of an impurity material.
Claim 8
Dependent Claim
26 words
A method according to claim 1 wherein the capacitance associated with said gate oxide layer is less than the capacitance associated with said inter-level dielectric layer.
Claim 9
Dependent Claim
14 words
A method according to claim 1 wherein said interlevel dielectric layer includes silicon oxide.
Claim 10
Dependent Claim
13 words
A method according to claim 1 wherein said interlevel dielectric layer includes oxide-nitride-oxide.
Claim 11
Dependent Claim
14 words
A method according to claim 1 wherein said interlevel dielectric layer includes aluminum oxide.
Claim 12
Dependent Claim
14 words
A method according to claim 1 wherein said interlevel dielectric layer includes aluminum nitride
Claim 13
Dependent Claim
14 words
A method according to claim 1 wherein said interlevel dielectric layer includes tantalum pentaoxide.
Claim 14
Dependent Claim
25 words
A method according to claim 1 wherein two impurities are implanted to form graded junctions in at least the middle conductor of said three conductors.
Claim 15
Dependent Claim
44 words
A method according to claim 1 wherein two impurities are implanted to form graded junctions in at least the middle conductor of said three conductors, wherein said implantation is made after formation of sidewall oxide spacers adjacent said control-gate strips and said floating-gate strips.
Claim 16
Dependent Claim
14 words
A method according to claim 1 wherein said third conductive layer is polycrystalline silicon.
Claim 17
Dependent Claim
15 words
A method according to claim 1 wherein said third conductive layer is silicided polycrystalline silicon.
Claim 18
Dependent Claim
14 words
A method according to claim 1 wherein said third conductive layer is refractory metal.
Claim 19
Dependent Claim
17 words
A method according to claim 1 wherein said third conductive layer is layered refractory metal and polysilicon.
Claim 20
Dependent Claim
17 words
A method according to claim 1 wherein said underlying channel stop region is formed using boron doping.
Claim 21
Dependent Claim
76 words
A method according to claim 1 wherein part of said insulating region is not removed and said third conductive layer is not formed and patterned and in which wordline trenches are formed in said insulating oxide region to the upper conducting surfaces of said control gates, a metal layer is deposited on said insulating oxide region and in said trenches, and a part of said metal layer is removed to form metal wordlines in said trenches.
Claim 22
Dependent Claim
51 words
A method according to claim 1 wherein an oxide layer is deposited after said removal of a part of said insulating oxide region, wordline trenches are formed in said oxide layer, said third conductive layer is metal, and a part of said third conductive layer is removed to form said wordlines.
References Cited (Backward Citations)
US4258466A
Cited
US4493057A
Cited
US4697330A
Cited
US4545852A
Cited
US4652897A
Cited
US4833514A
Cited
US4849369A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-06-09 | 1995-12-09 | 1996-06-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-06-09 | 1999-12-09 | 2000-06-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-06-09 | 2003-12-09 | 2004-06-09 | $7700.00 | Window Closed / Lapsed |