US5108562A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electrolytic method for forming vias and through holes in copper-invar-copper core structures
Assignee: International Business Machines Corp
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Filing: 1991-02-06
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Granted: 1992-04-28
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Expires: 2011-02-06
Abstract
Abstract Disclosed is a method of fabricating a microelectronic package having least one layer formed of a Cu-Invar-Cu core encapsulated between a pair of dielectric films. The package is intended to carry surface circuitization on an external surface, with internal circuitization from the surface circuitization passing through the core. The method includes contacting the copper within the Cu-Invar-Cu core with a copper etching aqueous solution of a strong base and a strong oxidizing acid, while maintaining the copper anodic. This electrolytically converts the copper to soluble copper oxides. In a separate step the Invar of the Cu-Invar-Cu core is electrolytically etched with an Invar etching aqueous solution of sodium chloride. This step is carried out under conditions to electrolytically form soluble iron and nickel chlorides while passivating the copper.
Inventors
- 👤 Peter J. Duke
- 👤 Leann G. Keim
- 👤 Krystyna W. Semkow
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 05:08
CPC Classifications
C; C25; C25F; C25F3/00; C25F3/02; C25F3/12; H; H05; H05K; H05K3/00; H05K3/44; H10; H10W; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/6875; H10W99/00; H05K2201/00; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0338; H05K2201/06; H05K2201/068; H05K2203/00; H05K2203/03; H05K2203/0323; H05K2203/0361; H05K2203/11; H05K2203/1184; H05K3/02; H05K3/06; H05K3/061; H05K3/062; H05K3/067; H05K3/07
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
105 words
A method of fabricating a microelectronic package, said package adapted to carry surface circuitization on an external surface thereof and comprising at least one Cu-Invar-Cu core with internal circuitization from said surface circuitization passing therethrough, said method comprising: a. contacting copper of said Cu-Invar-Cu core with a copper etching aqueous solution of a strong base and a strong oxidizing acid and maintaining said copper anodic to electrolytically form soluble copper oxide; and b. contacting Invar of said Cu-Invar-Cu core with an Invar etching aqueous solution, of sodium chloride and maintaining said Invar anodic to electrolytically form soluble iron and nickel chlorides while passivating said copper.
Claim 2
Independent Claim
105 words
A method of fabricating a microelectronic package, said package adapted to carry surface circuitization on an external surface thereof and comprising at least one Cu-Invar-Cu core with internal circuitization from said surface circuitization passing therethrough, said method comprising: a. contacting copper of said Cu-Invar-Cu core with a copper etching aqueous solution of a strong base and a strong oxidizing acid and maintaining said copper anodic to electrolytically form soluble copper oxide; and b. contacting Invar of said Cu-Invar-Cu core with an Invar etching aqueous solution, of sodium chloride and maintaining said Invar anodic to electrolytically form soluble iron and nickel chlorides while passivating said copper.
Claim 3
Dependent Claim
33 words
The method of claim 1 wherein said strong base is an alkali metal hydroxide and said strong oxidizing acid is chosen from the group consisting of oxygen acids of phosphorous, nitrogen, and sulfur.
Claim 4
Dependent Claim
20 words
The method of claim 2 wherein said alkali metal hydroxide is sodium hydroxide, and said oxidizing acid is nitric acid.
Claim 5
Dependent Claim
19 words
The method of claim 3 wherein the copper etching solution is at least about 0.5 molar in sodium nitrate.
Claim 6
Dependent Claim
30 words
The method of claim 4 wherein the copper etching solution is an acidic solution and further contains an excess of NO 31 3 ion with respect to Na + ion.
Claim 7
Dependent Claim
22 words
The method of claim 1 wherein said Invar etching aqueous sodium chloride solution is at least about 0.5 molar in sodium chloride.
Claim 8
Dependent Claim
43 words
The method of claim 1 comprising first etching the copper in the copper etching solution to form soluble copper oxides, and thereafter etching the Invar in the Invar etching sodium chloride solution to form soluble iron and nickel chlorides while passivating the copper.
Claim 9
Dependent Claim
22 words
The method of claim 7 maintaining the copper anodic in the copper etching solution at a potential to form soluble copper oxides.
Claim 10
Dependent Claim
27 words
The method of claim 7 maintaining the copper anodic in the copper etching solution at a voltage of less then 1.5 volts versus a Saturated Calomel Electrode.
Claim 11
Dependent Claim
34 words
The method of claim 7 comprising thereafter maintaining the copper and Invar anodic in the Invar etching chloride at a potential sufficient to form soluble chlorides of iron and nickel while passivating the copper.
Claim 12
Dependent Claim
41 words
The method of claim 7 comprising thereafter maintaining the copper and Invar anodic in the sodium chloride at a potential greater then 0.5 volts versus a Saturated Calomel Electrode to form soluble chlorides of iron and nickel while passivating the copper.
Claim 13
Dependent Claim
37 words
The method of claim 1 comprising first etching the Cu-Invar-Cu in the sodium chloride solution to form soluble iron and nickel chlorides and partially etching the copper, and thereafter etching the copper in the copper etching solution.
Claim 14
Dependent Claim
39 words
The method of claim 12 comprising first etching the Cu-Invar-Cu in aqueous sodium chloride at a potential of at least about 0.3 volts versus a Saturated Calomel Electrode, and thereafter etching the copper in the aqueous copper etching solution.
References Cited (Backward Citations)
US4543153A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-04-28 | 1995-10-28 | 1996-04-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-04-28 | 1999-10-28 | 2000-04-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-04-28 | 2003-10-28 | 2004-04-28 | $7700.00 | Window Closed / Lapsed |