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US5105665A Expired / Lapsed US ⏱️ 0.0 years remaining

Sensors

Assignee: Mobrey Group Ltd
•
Filing: 1990-08-14
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Granted: 1992-04-21
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Expires: 2010-08-14
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Abstract

Abstract In a micromachined silicon pressure sensor comprising a resonantly vibratable beam supported on a diaphragm, the beam is indirectly excited into resonant vibration by directing an optical excitation signal at the beam resonant frequency onto a part of the sensor other than the beam, preferably the diaphragm. Preferably, the optical excitation signal is of a wavelength to which the sensor is fairly transparent, and is directed through the beam and diaphragm to be absorbed by a suitable coating on the underside of the diaphragm. The optical excitation signal produces local heating, and the resulting expansions and contractions at the beam resonant frequency propagate through the sensor structure to excite the beam into resonant vibration. Another optical signal is used to detect the frequency of vibration of the beam, and a positive feedback loop maintains the frequency of the excitation signal equal to the detected beam vibration frequency. In a modification, the indirect excitation is achieved by forming resistors or piezoelectric devices in a part of the sensor other than the beam, so that the expansions and contractions mentioned above can be excited electrically rather than optically.

Inventors

  • 👤 Philip Parsons
  • 👤 Jolyon P. Willson
  • 👤 Eric Metcalf

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 21:26
CPC Classifications
G; G01; G01D; G01D3/00; G01D3/028; G01D3/036; G01L; G01L9/00; G01L9/0001; G01L9/0008; G01L9/0019; G01L9/002; G01L9/0022; G01L9/0023; Y; Y10; Y10S; Y10S73/00; Y10S73/01

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 107 words
A sensor system for sensing measurand, the system comprising: a sensor comprising a unitary semiconductor structure having a resonantly vibratable element formed as part thereof, such that application of the measurand to the structure affects the resonant frequency of the vibratable element; and means for applying an optical excitation signal to the sensor to excite resonant vibration of said element; wherein said excitation signal applying means is arranged to apply said optical excitation signal to a region of the structure other than said element, whereby to create in said region vibration-inducing stresses which propagate through said structure to said element to excite said element into resonant vibration.
Claim 2
Dependent Claim 107 words
A sensor system for sensing measurand, the system comprising: a sensor comprising a unitary semiconductor structure having a resonantly vibratable element formed as part thereof, such that application of the measurand to the structure affects the resonant frequency of the vibratable element; and means for applying an optical excitation signal to the sensor to excite resonant vibration of said element; wherein said excitation signal applying means is arranged to apply said optical excitation signal to a region of the structure other than said element, whereby to create in said region vibration-inducing stresses which propagate through said structure to said element to excite said element into resonant vibration.
Claim 3
Dependent Claim 22 words
A sensor system as claimed in claim 1, wherein said region is provided with a coating for absorbing said optical excitation signal.
Claim 4
Dependent Claim 21 words
A sensor system as claimed in claim 2, wherein said coating is of a metal selected from aluminum, chromium and gold.
Claim 5
Dependent Claim 19 words
A sensor system as claimed in claim 2, wherein said coating is of a material exhibiting surface piezoelectric effect.
Claim 6
Dependent Claim 14 words
A sensor system as claimed in claim 4, wherein said material is zinc oxide.
Claim 7
Dependent Claim 18 words
A sensor system as claimed in claim 1, wherein said semiconductor structure is made from single crystal silicon.
Claim 8
Dependent Claim 51 words
A sensor system as claimed in claim 1, wherein the semiconductor structure includes a diaphragm, and said element comprises a beam arranged to have the tension therein varied by flexing of the diaphragm in response to changes in pressure applied to the diaphragm, whereby the sensor serves as a pressure sensor.
Claim 9
Dependent Claim 21 words
A sensor system as claimed in claim 7, wherein said region of the structure is on one surface of the diaphragm.
Claim 10
Dependent Claim 21 words
A sensor system as claimed in claim 7, wherein said region of the structure is adjacent one end of the beam.
Claim 11
Dependent Claim 118 words
A sensor system for sensing a measurand, the system comprising: a sensor comprising a unitary semiconductor structure having a resonantly vibratable element formed as part thereof, such that application of the measurand to the structure affects the resonant frequency of the vibratable element; and means for applying an electrical excitation signal to the sensor to excite resonant vibration of said element; wherein said sensor includes a resistor formed in a region of the structure other than said element, and said excitation signal applying means is arranged to supply said electrical excitation signal to said resistor, whereby to create in said region vibration-inducing stresses which propagate through said structure to said element to excite said element into resonant vibration.
Claim 12
Dependent Claim 118 words
A sensor system for sensing a measurand, the system comprising: a sensor comprising a unitary semiconductor structure having a resonantly vibratable element formed as part thereof, such that application of the measurand to the structure affects the resonant frequency of the vibratable element; and means for applying an electrical excitation signal to the sensor to excite resonant vibration of said element; wherein said sensor includes a resistor formed in a region of the structure other than said element, and said excitation signal applying means is arranged to supply said electrical excitation signal to said resistor, whereby to create in said region vibration-inducing stresses which propagate through said structure to said element to excite said element into resonant vibration.
Claim 13
Dependent Claim 15 words
A sensor system as claimed in claim 10, wherein said resistor is a piezoelectric resistor.
Claim 14
Dependent Claim 18 words
A sensor system as claimed in claim 10, wherein said semiconductor structure is made from single crystal silicon.
Claim 15
Dependent Claim 51 words
A sensor system as claimed in claim 10, wherein the semiconductor structure includes a diaphragm, and said element comprises a beam arranged to have the tension therein varied by flexing of the diaphragm in response to changes in pressure applied to the diaphragm, whereby the sensor serves as a pressure sensor.
Claim 16
Dependent Claim 21 words
A sensor system as claimed in claim 13, wherein said region of the structure is on one surface of the diaphragm.
Claim 17
Dependent Claim 21 words
A sensor system as claimed in claim 13, wherein said region of the structure is adjacent one end of the beam.

References Cited (Backward Citations)

US4229979A Cited
US4764244A Cited
GB2185106A Cited
JPS6427929A Cited
GB2208931A Cited
GB2218809A Cited
US4972076A Cited
US4945773A Cited
GB2229816A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-04-21 1995-10-21 1996-04-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-04-21 1999-10-21 2000-04-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-04-21 2003-10-21 2004-04-21 $7700.00 Window Closed / Lapsed

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