US5088002A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Ceramic electronic component and method of fabricating the same
Assignee: Murata Manufacturing Co Ltd
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Filing: 1991-03-26
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Granted: 1992-02-11
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Expires: 2011-03-26
Abstract
Abstract A ceramic electronic component having a structure in which thin film electrodes made of a Ni-Al system alloy or a Ni-Cr-Al system alloy are formed so as to make contact with a functional ceramic thin film.
Inventors
- 👤 Toshio Ogawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 12:00
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/005; H01G4/008; Y; Y10; Y10T; Y10T29/00; Y10T29/43; Y10T29/435
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
37 words
A ceramic electronic component, comprising: a ceramic thin film; and thin film electrodes made of a Ni-Al system alloy or a Ni-Cr-Al system alloy which are formed so as to make contact with the ceramic thin film.
Claim 2
Dependent Claim
37 words
A ceramic electronic component, comprising: a ceramic thin film; and thin film electrodes made of a Ni-Al system alloy or a Ni-Cr-Al system alloy which are formed so as to make contact with the ceramic thin film.
Claim 3
Dependent Claim
31 words
The ceramic electronic component according to claim 1, wherein said Ni-Al system alloy has composition containing 2.5 to 8% by weight of aluminum: the remainder being nickel or a trace element.
Claim 4
Dependent Claim
39 words
The ceramic electronic component according to claim 1, wherein said Ni-Cr-Al system alloy has composition containing 8 to 25% by weight of chromium and 2.5 to 8% by weight of aluminum: the remainder being nickel and a trace element.
Claim 5
Dependent Claim
49 words
In a nonvolatile RAM comprising a ferroelectric capacitor in which electrodes are formed on both major surfaces of a ferroelectric ceramic thin film, the nonvolatile RAM being characterized in that said electrodes are formed of a thin film made of a Ni-Al system alloy or a Ni-Cr-Al system alloy.
Claim 6
Dependent Claim
49 words
In a nonvolatile RAM comprising a ferroelectric capacitor in which electrodes are formed on both major surfaces of a ferroelectric ceramic thin film, the nonvolatile RAM being characterized in that said electrodes are formed of a thin film made of a Ni-Al system alloy or a Ni-Cr-Al system alloy.
Claim 7
Dependent Claim
30 words
The nonvolatile RAM according to claim 4, wherein said Ni-Al system alloy has composition containing 2.5 to 8% by weight of aluminum: the remainder being nickel and a trace element.
Claim 8
Dependent Claim
38 words
The nonvolatile RAM according to claim 4, wherein said Ni-Cr-Al system alloy has composition containing 8 to 25% by weight of chromium and 2.5 to 8% by weight of aluminum: the remainder being nickel and a trace element.
Claim 9
Independent Claim
72 words
A method of fabricating a ceramic electronic component, comprising the steps of; forming on a substrate a thin film made of a Ni-Al system alloy or a Ni-Cr-Al system alloy; heating said thin film made of the Ni-Al system alloy or the Ni-Cr-Al system alloy in an oxidation atmosphere; and forming a ceramic thin film on said thin film made of the Ni-Al system alloy or the Ni-Cr-Al system alloy after heating.
Claim 10
Independent Claim
72 words
A method of fabricating a ceramic electronic component, comprising the steps of; forming on a substrate a thin film made of a Ni-Al system alloy or a Ni-Cr-Al system alloy; heating said thin film made of the Ni-Al system alloy or the Ni-Cr-Al system alloy in an oxidation atmosphere; and forming a ceramic thin film on said thin film made of the Ni-Al system alloy or the Ni-Cr-Al system alloy after heating.
Claim 11
Dependent Claim
29 words
The method according to claim 7, wherein said Ni-Al system alloy has composition containing 2.5 to 8% by weight of aluminum: the remainder being nickel and a trace element.
Claim 12
Dependent Claim
37 words
The method according to claim 7, wherein said Ni-Cr-Al system alloy has composition containing 8 to 25% by weight of chromium and 2.5 to 8% by weight of aluminum: the remainder being nickel and a trace element.
References Cited (Backward Citations)
US3721870A
Cited
US4241378A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-02-10 | 1995-08-12 | 1996-02-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-02-10 | 1999-08-12 | 2000-02-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-02-10 | 2003-08-12 | 2004-02-11 | $7700.00 | Window Closed / Lapsed |