US5086269A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Burn-in process and apparatus
Assignee: Avago Technologies International Sales Pte Ltd
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Filing: 1991-03-08
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Granted: 1992-02-04
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Expires: 2011-03-08
Abstract
Abstract An integrated circuit chip 12 is temporarily associated with a plenum 16 having a fluid chamber 88 in which a heat transfer fluid 46 is circulated in order to heat or cool the chip 12 at a predetermined temperature sufficient to complete a burn-in screening of said chip.
Inventors
- 👤 Laszlo Nobi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 12:27
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; H; H05; H05K; H05K7/00; H05K7/20
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
173 words
A method for performing a burn-in screening procedure upon an integrated circuit chip, said method comprising: (1) temporarily associating the chip with a chip connector having electrical connections suitable for electrically interconnecting a chip being screened with a PC test board having: (a) electrical connections and test equipment means for sending electrical signals to and receiving electrical signals from a chip subjected to burn-in screening, (b) means for electrically and physically attaching the chip connector to the PC test board and (c) an opening through which a raised head portion of a plenum projects and is thereby positioned in heat-transfer-proximity with the chip being screened; (2) employing the chip connector to place the chip in heat-transfer-proximity with the plenum; (3) heating the plenum by circulating a heat transfer fluid through a fluid chamber in said plenum; (4) electrically testing the chip after it attains a predetermined heated state sufficient to burn-in screen said chip; and (5) disassociating the chip from the heat provided by the heated fluid after the chip is burn-in screened.
Claim 2
Independent Claim
173 words
A method for performing a burn-in screening procedure upon an integrated circuit chip, said method comprising: (1) temporarily associating the chip with a chip connector having electrical connections suitable for electrically interconnecting a chip being screened with a PC test board having: (a) electrical connections and test equipment means for sending electrical signals to and receiving electrical signals from a chip subjected to burn-in screening, (b) means for electrically and physically attaching the chip connector to the PC test board and (c) an opening through which a raised head portion of a plenum projects and is thereby positioned in heat-transfer-proximity with the chip being screened; (2) employing the chip connector to place the chip in heat-transfer-proximity with the plenum; (3) heating the plenum by circulating a heat transfer fluid through a fluid chamber in said plenum; (4) electrically testing the chip after it attains a predetermined heated state sufficient to burn-in screen said chip; and (5) disassociating the chip from the heat provided by the heated fluid after the chip is burn-in screened.
Claim 3
Dependent Claim
35 words
The method of claim 1 wherein the chip is exposed to a temperature of from about 125° C. to about 150° C. for a time period of from about 6 hours to about 48 hours.
Claim 4
Dependent Claim
35 words
The method of claim 1 wherein the heat transfer fluid circulated in the fluid chamber of the plenum to conduct the burn-in screening procedure is a fluorinated hydrocarbon having a boiling point above 150° C.
Claim 5
Dependent Claim
16 words
The method of claim 1 which further comprises heating the chip in an atmosphere of helium.
Claim 6
Dependent Claim
67 words
The method of claim 1 which further comprises circulating the heat transfer fluid through the fluid chamber via a closed loop piping system which directs the heat transfer fluid into the plenum, circulates said fluid within the fluid chamber, removes the heat transfer fluid from the plenum once heat is transferred from the heated fluid to the plenum and returns the heat transfer fluid to a tank.
Claim 7
Dependent Claim
49 words
The method of claim 1 which further comprises circulating the heat transfer fluid through the fluid chamber via a closed loop piping system having a concentric pipe section comprised of an inner pipe for receiving the heat transfer fluid and an outer pipe for removing said heat transfer fluid.
Claim 8
Dependent Claim
59 words
The method of claim 1 which further comprises associating the chip with the plenum by temporarily mounting the chip in a chip connector having an aperture for receiving the raised head portion of the plenum which extends through the test board and into said aperture and thereby placing the chip in heat transfer proximity with the raised head portion.
Claim 9
Independent Claim
210 words
An apparatus for performing a burn-in screening procedure upon a chip, said apparatus comprising: (1) a chip connector having a lid, a box-like configuration and electrical connections suitable for electrically interconnecting a chip being screened with a PC test board; (2) a PC test board having: (a) appropriate connections and test equipment for sending electrical signals to and receiving electrical signals from a chip subjected to burn-in screening, (b) means for attaching the PC test board to the chip connector, and (c) an opening through which a raised head portion of a plenum projects and is thereby positioned in heat-transfer-proximity with the chip; (3) biasing means in said lid of the box-like chip connector for placing the chip in heat-transfer-proximity with the raised head portion of the plenum; (4) a plenum having a fluid chamber through which a heat transfer fluid is circulated under pressure provided by a pump means; (5) piping means for circulating the heat transfer fluid from a tank and into and out of the fluid chamber; (6) pumping means for pumping the heat transfer fluid from the tank and through a heat transfer fluid circulation system; and (7) a heat transfer fluid circulation system which includes a tank for storing and heating the heat transfer fluid.
Claim 10
Independent Claim
210 words
An apparatus for performing a burn-in screening procedure upon a chip, said apparatus comprising: (1) a chip connector having a lid, a box-like configuration and electrical connections suitable for electrically interconnecting a chip being screened with a PC test board; (2) a PC test board having: (a) appropriate connections and test equipment for sending electrical signals to and receiving electrical signals from a chip subjected to burn-in screening, (b) means for attaching the PC test board to the chip connector, and (c) an opening through which a raised head portion of a plenum projects and is thereby positioned in heat-transfer-proximity with the chip; (3) biasing means in said lid of the box-like chip connector for placing the chip in heat-transfer-proximity with the raised head portion of the plenum; (4) a plenum having a fluid chamber through which a heat transfer fluid is circulated under pressure provided by a pump means; (5) piping means for circulating the heat transfer fluid from a tank and into and out of the fluid chamber; (6) pumping means for pumping the heat transfer fluid from the tank and through a heat transfer fluid circulation system; and (7) a heat transfer fluid circulation system which includes a tank for storing and heating the heat transfer fluid.
Claim 11
Dependent Claim
40 words
The apparatus of claim 8 wherein the piping means includes a concentric pipe system having an inner pipe for introducing the heat transfer fluid into and an outer pipe for removing said fluid from the fluid chamber of the plenum.
Claim 12
Dependent Claim
53 words
The apparatus of claim 8 wherein the box-like chip connector is comprised of a lid and a base hinged together and wherein a spring-biased plunger is provided within said lid so as to be positioned in direct alignment with the chip and thereby force the chip into heat transfer contact with the plenum.
Claim 13
Dependent Claim
35 words
The apparatus of claim 8 wherein the plenum further comprises a transfer surface having a size at least as large as the chip so that said chip will be uniformly heated throughout the burn-in screening.
Claim 14
Dependent Claim
24 words
The apparatus of claim 8 wherein the heat transfer fluid has a boiling point greater than the temperature employed to burn-in screen said chip.
Claim 15
Dependent Claim
20 words
The apparatus of claim 8 wherein said heat transfer fluid has a relatively constant viscosity at a variety of temperatures.
Claim 16
Dependent Claim
28 words
The apparatus of claim 8 wherein said heat transfer fluid also serves as a heat sink to remove heat from the plenum if a predetermined temperature is exceeded.
Claim 17
Dependent Claim
34 words
The apparatus of claim 8 which further comprises heat exchangers provided to remove heat from the heat transfer fluid in order to maintain the temperature at a level sufficient to burn-in screen said chip.
Claim 18
Dependent Claim
31 words
The apparatus of claim 8 which further comprises a temperature control module and a system computer to monitor and control the temperature at a level sufficient to burn-in screen said chip.
Claim 19
Dependent Claim
22 words
The apparatus of claim 8 which further comprises a gaseous atmosphere that serves as an interface between said chip and said plenum.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-02-03 | 1995-08-05 | 1996-02-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-02-03 | 1999-08-05 | 2000-02-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-02-03 | 2003-08-05 | 2004-02-04 | $7700.00 | Window Closed / Lapsed |