← Back to Patent Explorer
US5079112A Expired / Lapsed US ⏱️ 0.0 years remaining

Device manufacture involving lithographic processing

Assignee: Nokia Bell Labs
•
Filing: 1989-08-07
•
Granted: 1992-01-07
•
Expires: 2009-08-07
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Fabrication of devices of micron and submicron minimum feature size is accomplished by lithographic processing involving a back focal plane filter. A particularly important fabrication approach depends upon mask patterns which produce images based on descrimination as between scattered and unscattered radiation.

Inventors

  • 👤 Steven D. Berger
  • 👤 John M. Gibson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 10:48
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/30; H01J37/317; H01J37/3174; B; B82; B82Y; B82Y10/00; B82Y40/00; G; G03; G03F; G03F1/00; G03F1/20; G03F7/00; G03F7/20; G03F7/2037; G03F7/2039; G03F7/70; G03F7/70216; H01J2237/00; H01J2237/30; H01J2237/317; H01J2237/3175; H01J2237/31777; H01J2237/31791; Y; Y10; Y10S; Y10S430/00; Y10S430/167; Y10S430/168

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 188 words
Method for device fabrication comprising at least one lithographic delineation step comprising projection of patterned radiation on an imaging material by means of a lens system to produce a pattern image, in which a mask is illuminated by radiation to result in transmission of said patterned radiation, characterized in that the transmission path of said patterned radiation includes a "back focal plane filter" defined as positioned on the back focal plane or some equivalent conjugate plane of such lens system, said filter including two types of filter regions, one of which, is relatively transparent to said patterned radiation, and defines the pass portion of said filter, said filter serving to block transmission of a part of said patterned radiation dependent upon degree of scatter as imposed by said mask, in which the said mask includes two types of mask regions which produce different degrees of scattering on illuminating radiation so that said patterned radiation is pattern-defined by such degrees of scattering, in which the said radiation consists essentially of accelerated electrons, in which the electrons are accelerated to within a range of from 50 to about 200 kV.
Claim 2
Dependent Claim 188 words
Method for device fabrication comprising at least one lithographic delineation step comprising projection of patterned radiation on an imaging material by means of a lens system to produce a pattern image, in which a mask is illuminated by radiation to result in transmission of said patterned radiation, characterized in that the transmission path of said patterned radiation includes a "back focal plane filter" defined as positioned on the back focal plane or some equivalent conjugate plane of such lens system, said filter including two types of filter regions, one of which, is relatively transparent to said patterned radiation, and defines the pass portion of said filter, said filter serving to block transmission of a part of said patterned radiation dependent upon degree of scatter as imposed by said mask, in which the said mask includes two types of mask regions which produce different degrees of scattering on illuminating radiation so that said patterned radiation is pattern-defined by such degrees of scattering, in which the said radiation consists essentially of accelerated electrons, in which the electrons are accelerated to within a range of from 50 to about 200 kV.
Claim 3
Dependent Claim 171 words
Method for device fabrication comprising at least one lithographic delineation step comprising projection of patterned radiation on an imaging material by means of a lens system to produce a pattern image, in which a mask is illuminated by radiation to result in transmission of said patterned radiation, characterized in that the transmission path of said patterned radiation includes a "back focal plane filter" defined as positioned on the back focal plane or some equivalent conjugate plane of such lens system, said filter including two types of filter regions, one of which, is relatively transparent to said patterned radiation, and defines the pass portion of said filter, said filter serving to block transmission of a part of said patterned radiation dependent upon degree of scatter as imposed by said mask, in which the said mask includes two types of mask regions which produce different degrees of scattering on illuminating radiation so that said patterned radiation is pattern-defined by such degrees of scattering, in which the said radiation consists essentially of electromagnetic radiation.
Claim 4
Dependent Claim 171 words
Method for device fabrication comprising at least one lithographic delineation step comprising projection of patterned radiation on an imaging material by means of a lens system to produce a pattern image, in which a mask is illuminated by radiation to result in transmission of said patterned radiation, characterized in that the transmission path of said patterned radiation includes a "back focal plane filter" defined as positioned on the back focal plane or some equivalent conjugate plane of such lens system, said filter including two types of filter regions, one of which, is relatively transparent to said patterned radiation, and defines the pass portion of said filter, said filter serving to block transmission of a part of said patterned radiation dependent upon degree of scatter as imposed by said mask, in which the said mask includes two types of mask regions which produce different degrees of scattering on illuminating radiation so that said patterned radiation is pattern-defined by such degrees of scattering, in which the said radiation consists essentially of electromagnetic radiation.
Claim 5
Dependent Claim 15 words
Method of claim 2 in which the said electromagnetic radiation is in the X-ray spectrum.

References Cited (Backward Citations)

US3105761A Cited
US3630598A Cited
US3748468A Cited
US3862843A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-01-06 1995-07-08 1996-01-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-01-06 1999-07-08 2000-01-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-01-06 2003-07-08 2004-01-07 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag