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US5077266A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming weak-link josephson junction, and superconducting device employing the junction

Assignee: Hitachi Ltd
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Filing: 1989-09-11
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Granted: 1991-12-31
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Expires: 2009-09-11
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Abstract

Abstract A weak-link Josephson junction is of the type employing a thin film of an oxide superconductor, in which a crystal grain boundary produced reflecting an artificial crystal defect is utilized as the weak-link junction. The crystal grain boundary is formed concretely by a method in which atoms of different species are deposited on the predetermined part of the surface of a substrate, the predetermined part of the surface of a substrate is disturbed, or parts of different crystal face orientations are formed at the surface of a substrate, whereupon the superconducting thin film is epitaxially grown on the substrate, or by a method in which the predetermined part of the superconducting thin film, epitaxially grown on a substrate, is diffused with atoms of different species hampering a superconductivity, or the predetermined part of the superconducting thin film is disturbed, whereupon the superconducting thin film is annealed.

Inventors

  • 👤 Kazumasa Takagi
  • 👤 Tokuumi Fukazawa
  • 👤 Yoshimi Kawanami
  • 👤 Yuuichi Madokoro
  • 👤 Katsuki Miyauchi
  • 👤 Toshiyuki Aida
  • 👤 Yukio Honda
  • 👤 Masaaki Futamoto
  • 👤 Masahiko Hiratani

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 16:50
CPC Classifications
H; H10; H10N; H10N60/00; H10N60/01; H10N60/0912; H10N60/0941; Y; Y10; Y10S; Y10S505/00; Y10S505/70; Y10S505/701; Y10S505/702; Y10S505/725; Y10S505/729

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 94 words
A method of forming a weak-link Josephson junction comprising the steps of: irradiating a substrate with a substance, thereby processing said substrate so as either to deposit said substance in the form of a line on a surface of said substrate or to damage the surface of said substrate in the form of a line by virtue of said substance, and epitaxially growing a thin film of an oxide superconductor on the processed substrate, thereby forming a crystal grain boundary on said line, said crystal grain boundary being used as a weak-link Josephson junction.
Claim 2
Independent Claim 94 words
A method of forming a weak-link Josephson junction comprising the steps of: irradiating a substrate with a substance, thereby processing said substrate so as either to deposit said substance in the form of a line on a surface of said substrate or to damage the surface of said substrate in the form of a line by virtue of said substance, and epitaxially growing a thin film of an oxide superconductor on the processed substrate, thereby forming a crystal grain boundary on said line, said crystal grain boundary being used as a weak-link Josephson junction.
Claim 3
Dependent Claim 27 words
A method of forming a weak-link Josephson junction as defined in claim 1, wherein said step of irradiating said substrate is performed by a focused ion beam.
Claim 4
Dependent Claim 32 words
A method of forming a weak-link Josephson junction as defined in claim 2, wherein said focused ion beam affords a dose within a range of 5×10 11 -5×10 18 /cm 2 .
Claim 5
Independent Claim 101 words
A method of forming a weak-link Josephson junction comprising the steps of: irradiating a thin film of an oxide superconductor, epitaxially grown on a substrate, with a substance for lowering a critical current density, thereby processing said thin film so as either to diffuse said substance in the form of a line within the thin oxide-superconductor film or to damage the oxide-superconductor thin film in the form of a line by virtue of said substance, and annealing the processed oxide-superconductor film, thereby forming a crystal grain boundary on said line, said crystal grain boundary being utilized as a weak-link Josephson junction.
Claim 6
Independent Claim 101 words
A method of forming a weak-link Josephson junction comprising the steps of: irradiating a thin film of an oxide superconductor, epitaxially grown on a substrate, with a substance for lowering a critical current density, thereby processing said thin film so as either to diffuse said substance in the form of a line within the thin oxide-superconductor film or to damage the oxide-superconductor thin film in the form of a line by virtue of said substance, and annealing the processed oxide-superconductor film, thereby forming a crystal grain boundary on said line, said crystal grain boundary being utilized as a weak-link Josephson junction.
Claim 7
Dependent Claim 26 words
A method of forming a weak-link Josephson junction as defined in claim 4, wherein the irradiation with said substance is performed by a focused ion beam.
Claim 8
Dependent Claim 32 words
A method of forming a weak-link Josephson junction as defined in claim 5, wherein said focused ion beam affords a dose within a range of 5×10 11 -5×10 18 /cm 2 .
Claim 9
Independent Claim 64 words
A method of forming a weak-link Josephson junction comprising the steps of: forming a substrate with sections having different crystal face orientations; epitaxially growing a thin film of an oxide superconductor on said substrate on which sections different in crystal face orientation are provided, thereby forming a crystal grain boundary between said sections, said crystal grain boundary being used as a weak-link Josephson junction.
Claim 10
Independent Claim 64 words
A method of forming a weak-link Josephson junction comprising the steps of: forming a substrate with sections having different crystal face orientations; epitaxially growing a thin film of an oxide superconductor on said substrate on which sections different in crystal face orientation are provided, thereby forming a crystal grain boundary between said sections, said crystal grain boundary being used as a weak-link Josephson junction.
Claim 11
Independent Claim 61 words
A method of forming a weak-link Josephson junction device comprising the steps of: providing a substrate; irradiating the substrate with a substance so as to form an irradiated region in the substrate; and epitaxially growing an oxide superconductor film on the irradiated region so that the oxide superconducting film has a boundary which has a microcrystal region on the irradiated region.
Claim 12
Independent Claim 61 words
A method of forming a weak-link Josephson junction device comprising the steps of: providing a substrate; irradiating the substrate with a substance so as to form an irradiated region in the substrate; and epitaxially growing an oxide superconductor film on the irradiated region so that the oxide superconducting film has a boundary which has a microcrystal region on the irradiated region.
Claim 13
Dependent Claim 14 words
The method as set forth in claim 8 wherein the substrate is a crystal.
Claim 14
Dependent Claim 17 words
The method as set forth in claim 9 wherein the irradiated region is a crystalline defect region.
Claim 15
Dependent Claim 16 words
The method as set forth in claim 8 wherein the irradiated region is a deposited region.
Claim 16
Dependent Claim 21 words
The method as set forth in claim 8 wherein the substance is atoms of different species from the oxide superconducting film.
Claim 17
Dependent Claim 18 words
The method as set forth in claim 8 further comprising the step of annealing the oxide superconducting film.
Claim 18
Dependent Claim 19 words
The method as set forth in claim 13 wherein said step of annealing is performed in an oxygen atmosphere.
Claim 19
Dependent Claim 21 words
The method as set forth in claim 2 wherein the focused ion beam is accelerated by not larger than 30 kV.
Claim 20
Dependent Claim 13 words
The method as set forth in claim 1 wherein the substrate comprises gallium.

References Cited (Backward Citations)

US4316785A Cited
US4366494A Cited
EP0325765A1 Cited
JPH01182949A Cited
JPH01202876A Cited
EP0329603A2 Cited
US4940693A Cited
US4962316A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-12-30 1995-07-01 1995-12-31 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-12-30 1999-07-01 1999-12-31 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-12-30 2003-07-01 2003-12-31 $7700.00 Window Closed / Lapsed

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