Capacitance probe for measuring a width of a clearance between parts

Claim 2

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having at least one opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: a first layer of high lubricity, electrically insulative material manually peelably adhered to the outer surface of said guard electrode, the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of said slot or clearance.

Claim 3

A capacitance probe according to claim 1, wherein said probe comprises a further thin, flat guard electrode fixedly adhered to the outer surface of the other of said layers of dielectric material, said further guard electrode also having at least one opening through its thickness opposite said probe electrode to define a further active area of the probe, further comprising a second layer of high lubricity, electrically insulative material manually peelably adhered to the outer surface of said further guard electrode.

Claim 4

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of said probe electrode but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables the probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity.

Claim 5

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of said probe electrode but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables the probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity.

Claim 6

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having at least one opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing the probe and electrically connecting said electrodes to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said a slot or clearance.

Claim 7

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having at least one opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing the probe and electrically connecting said electrodes to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said a slot or clearance.

Claim 8

A capacitance probe according to claim 2, wherein the improvement further comprises said portion of the probe having opposite side edges extended beyond said flat side and a lower edge extended between said opposite side edges, said opposite side edges being tapered toward said lower edge in the direction away from said carrier block, said tapered opposite side edges facilitating movement of said portion of the probe into and along said slot or clearance.

Claim 9

A capacitance probe according to claim 4, wherein said attachment means comprises a plurality of electrically conductive screws piercing the probe and threaded into said carrier block, there being at least one of said screws separately electrically engaging said probe electrode and at least one of said screws separately electrically engaging said guard electrode.

Claim 10

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.

Claim 11

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.

Claim 12

A capacitance probe according to claim 7, wherein said portion of the probe comprises opposite side edges extended beyond said flat side and a lower edge extended between said opposite side edges, said opposite side edges being tapered toward said lower edge in the direction away from said carrier block, said tapered opposite side edges facilitating movement of said portion of the probe into and along said slot or clearance.

Claim 13

A capacitance probe according to claim 7, wherein said attachment means comprises a plurality of electrically conductive screws piercing the probe and threaded into said carrier block, there being at least one of said screws separately electrically engaging each of said probe electrode and said guard electrode.

Claim 14

A capacitance probe according to claim 7, wherein said probe comprises a further thin, flat guard electrode fixedly adhered to the outer surface of the other of said layers of dielectric material, said further guard electrode also having at least one opening through its thickness opposite said probe electrode to define a further active area of the probe, further comprising a second layer of high lubricity, electrically insulative material manually peelably adhered to the outer surface of said further guard electrode.

Claim 15

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: at least a second, thin flat probe electrode having front and back sides, one of said first and second layers of dielectric material being fixedly adhered to either the front or back side of said second probe electrode; a third layer of dielectric material fixedly adhered to the other of said front or back side of said second probe electrode; and at least a second, thin flat guard electrode fixedly adhered to the outer surface of said third layer, said probe electrodes being positioned opposite each other in the probe, whereby any tendency of the probe electrodes to bow may be minimized by adhering them to said layers so that any bowing will occur in offsetting directions.

Claim 16

In a capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, the probe being of the type including at least one thin, flat probe electrode having front and back sides, a first layer of dielectric material fixedly adhered to said front side, a second layer of dielectric material fixedly adhered to said back side, and a thin, flat guard electrode fixedly adhered to the outer surface of at least one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe, the improvement comprising: at least a second, thin flat probe electrode having front and back sides, one of said first and second layers of dielectric material being fixedly adhered to either the front or back side of said second probe electrode; a third layer of dielectric material fixedly adhered to the other of said front or back side of said second probe electrode; and at least a second, thin flat guard electrode fixedly adhered to the outer surface of said third layer, said probe electrodes being positioned opposite each other in the probe, whereby any tendency of the probe electrodes to bow may be minimized by adhering them to said layers so that any bowing will occur in offsetting directions.

Claim 17

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity.

Claim 18

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations, whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity.

Claim 19

A capacitance probe according to claim 12, wherein said probe comprises a further thin, flat guard electrode fixedly adhered to the outer surface of the other of said layers of dielectric material, said further guard electrode also having at least one opening through its thickness opposite said probe electrode to define a further active area of the probe, further comprising a second layer of high lubricity, electrically insulative material manually peelably adhered to the outer surface of said further guard electrode.

Claim 20

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.

Claim 21

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a first layer of high lubricity material manually peelably adhered to the outer surface of said guard electrode; the thickness of said manually peelable layer being selectable to produce in the probe a total nominal thickness to optimally position the probe for accurate measurement of the width of such a slot or clearance; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.

Claim 22

A capacitance probe according to claim 14, wherein said probe comprises a further thin, flat guard electrode fixedly adhered to the outer surface of the other of said layers of dielectric material, said further guard electrode also having at least one opening through its thickness opposite said probe electrode to define a further active area of the probe, further comprising a second layer of high lubricity, electrically insulative material manually peelably adhered to the outer surface of said further guard electrode.

Claim 23

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations; whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.

Claim 24

A capacitance probe for measuring the width of a slot or other clearance between electrically conductive parts, comprising: at least one thin, flat probe electrode having front and back sides; a first layer of dielectric material fixedly adhered to said front side; a second layer of dielectric material fixedly adhered to said back side; a thin, flat guard electrode fixedly adhered to the outer surface of one of said layers of dielectric material, said guard electrode having an opening through its thickness opposite said probe electrode to define the active area of the probe; a plurality of perforations through the thickness of said guard electrode to define said active area, said perforations being located opposite said probe electrode; whereby due to the presence of said perforations, the area of said probe electrode must be larger to expose a given active area of the probe but maintain substantially the same active area and sensitivity as a probe not having said plurality of perforations; whereby said larger area of said probe electrode enables said probe to measure the width of such a slot or clearance over an enlarged area of the length or depth or both of such a slot or clearance than would be achievable with a probe not having said plurality of perforations but having substantially the same active area and sensitivity; an electrically conductive carrier block for the probe, said block having a substantially flat side for attachment of the probe; and electrically conductive attachment means piercing the probe through said probe electrode at a total of at least one point and through said guard electrode at a total of at least one point for securing and electrically connecting the probe to said flat side with the portion of the probe comprising said active area extending beyond the perimeter of said flat side to permit insertion of said portion of the probe into said slot or clearance.