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US5052816A Expired / Lapsed US ⏱️ 0.0 years remaining

Junction inspection method and apparatus for electronic parts

Assignee: Denyo Co Ltd
•
Filing: 1989-08-29
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Granted: 1991-10-01
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Expires: 2009-08-29
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Abstract

Abstract A plurality of lead wires such as those from an IC (an integrated circuit) is irradiated by a fan beam at same time. Infrared rays radiated from the portion which is irradiated by the fan beam and the periphery of the portion are detected so as to catch a thermogram exhibiting the temperature distribution. The thermogram is processed by image processing so as to produce a temperature distribution image. This image is visually compared with a standard temperature distribution-pattern on a display apparatus to judge whether soldering on those lead wires is defective or not.

Inventors

  • 👤 Minoru Nakamura
  • 👤 Yasuhiro Oshiro

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 14:55
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/72

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 158 words
An apparatus for inspecting soldered junctions of an electronic part having a plurality of terminals to be measured said apparatus comprising: (a) a heating station which includes: generating means for generating a heat energy fan beam directed toward the soldered junctions to be inspected; and irradiating means, having an adjusting means for adjusting the width of the fan beam from said generating means, for irradiating the soldered junctions with the fan beam; (b) a photographing station which includes: detecting means for detecting infrared rays radiated from the soldered junctions after irradiation by the fan beam at said heating station so as to produce a signal representing the condition of the soldered junctions; and image processing means for processing the signal from the detecting means so as to make up data to be used for displaying the condition of the soldered junctions; and (c) transferring means for transferring the electronic part between the heating station and the photographing station.
Claim 2
Independent Claim 158 words
An apparatus for inspecting soldered junctions of an electronic part having a plurality of terminals to be measured said apparatus comprising: (a) a heating station which includes: generating means for generating a heat energy fan beam directed toward the soldered junctions to be inspected; and irradiating means, having an adjusting means for adjusting the width of the fan beam from said generating means, for irradiating the soldered junctions with the fan beam; (b) a photographing station which includes: detecting means for detecting infrared rays radiated from the soldered junctions after irradiation by the fan beam at said heating station so as to produce a signal representing the condition of the soldered junctions; and image processing means for processing the signal from the detecting means so as to make up data to be used for displaying the condition of the soldered junctions; and (c) transferring means for transferring the electronic part between the heating station and the photographing station.
Claim 3
Dependent Claim 23 words
The apparatus of claim 1, wherein said adjusting means has means for varying the distance from said adjusting means to the soldered junctions.
Claim 4
Dependent Claim 19 words
The apparatus of claim 1, wherein said adjusting means has means for varying the angle of the fan beam.

References Cited (Backward Citations)

US3413474A Cited
US4647220A Cited
US4854724A Cited
US4818118A Cited
JPS62126339A Cited
US4792683A Cited
JPS63305238A Cited
US4941256A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-09-30 1995-04-01 1995-10-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-09-30 1999-04-01 1999-10-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-09-30 2003-04-01 2003-10-01 $7700.00 Window Closed / Lapsed

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