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US5047828A Expired / Lapsed US ⏱️ 0.0 years remaining

PNP type lateral transistor with minimal substrate operation interference

Assignee: Newport Fab LLC
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Filing: 1987-06-24
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Granted: 1991-09-10
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Expires: 2007-06-24
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Abstract

Abstract The invention provides a unique sub-micron dimensioned PNP-type transistor wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Slots made in the substrate permit angle evaporation of etch-resist to protect the active region while it is disconnected form the substrate by etching therebeneath via the slots. Substrate oxidation supports the active regions while orthogonal slots are provided permitting access to opposed sides of the active regions for doping N+ which is driven in from one side only while P or P+ is introduced and driven in from both sides, thereby providing a P+ N+N, P+ emitter, base, collector transistor active region to which electrical connections are applied using conventional techniques, providing almost complete reduction of the parasitic capacitances and resistances because of the total oxide isolation of the active regions from the substrate.

Inventors

  • 👤 Sidney I. Soclof

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 19:30
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/10; H10W10/17; H10D; H10D10/00; H10D10/311; H10D84/00; H10D84/01; H10D84/0112; H10D84/02; H10D84/03; H10D84/038; H10P; H10P30/00; H10P30/20; H10P30/222; H10W10/01; H10W10/011; H10W10/014; H10W10/0148; H10D86/00; H10D86/201

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 175 words
An array of sub-micron dimensioned PNP-type lateral transistors formed in a substrate doped N-type, each comprising in combination: spaced apart slots in the substrate through selected sides of which N+-type doping is received into the adjacent substrate and driven in followed by P or P+ doping driven in through opposed sides; said spaced apart slots comprising spaced apart pairs of slots orthogonally related to further pairs of slots with each pair of slots and each further pair of slots bounding a portion of the substrate comprising a region between said opposed sides; said slots filled with field oxide and surrounding each said region where a transistor will be formed; said P+ doping on the inner sides of said spaced apart slots within said regions comprising an emitter and a collector electrode area; said N+ doping and the N substrate in said region between the P+ doping comprising a graded base electrode area; electrical contacts on each P+ electrode area and on the graded N+N electrode area; and, each contact measuring down to 0.7 micron across.
Claim 2
Dependent Claim 175 words
An array of sub-micron dimensioned PNP-type lateral transistors formed in a substrate doped N-type, each comprising in combination: spaced apart slots in the substrate through selected sides of which N+-type doping is received into the adjacent substrate and driven in followed by P or P+ doping driven in through opposed sides; said spaced apart slots comprising spaced apart pairs of slots orthogonally related to further pairs of slots with each pair of slots and each further pair of slots bounding a portion of the substrate comprising a region between said opposed sides; said slots filled with field oxide and surrounding each said region where a transistor will be formed; said P+ doping on the inner sides of said spaced apart slots within said regions comprising an emitter and a collector electrode area; said N+ doping and the N substrate in said region between the P+ doping comprising a graded base electrode area; electrical contacts on each P+ electrode area and on the graded N+N electrode area; and, each contact measuring down to 0.7 micron across.
Claim 3
Dependent Claim 27 words
The transistor of claim 1, wherein: said region is substantially rectangular having a length of 5d and a width of 3d wherein d is approximately 1 micrometer.
Claim 4
Dependent Claim 16 words
The transistor of claim 1 wherein said region is isolated by substrate oxidation from the substrate.
Claim 5
Dependent Claim 121 words
A sub-micron dimensioned PNP-type lateral transistor formed in a N-type substrate, comprising in combination: a transistor region isolated from the substrate by substrate oxide filling orthogonally related slots around the region and completely underlying the region; said region comprising an emitter P electrode, a graded base N+ N electrode, and a collector P electrode; said region doped from a first side through a first slot prior to filling said slot with oxide by N+ doping driven in followed by P doping driven in; said region doped from a side opposite said first side by P doping driven in; and, an electrical contact on each P+ electrode and on the graded base N+N electrode measuring down to 0.7 micron across each contact.
Claim 6
Dependent Claim 121 words
A sub-micron dimensioned PNP-type lateral transistor formed in a N-type substrate, comprising in combination: a transistor region isolated from the substrate by substrate oxide filling orthogonally related slots around the region and completely underlying the region; said region comprising an emitter P electrode, a graded base N+ N electrode, and a collector P electrode; said region doped from a first side through a first slot prior to filling said slot with oxide by N+ doping driven in followed by P doping driven in; said region doped from a side opposite said first side by P doping driven in; and, an electrical contact on each P+ electrode and on the graded base N+N electrode measuring down to 0.7 micron across each contact.
Claim 7
Dependent Claim 43 words
The transistor of claim 4, wherein: the N+ doping is supplied by one of phosphorus and arsenic ions angle implanted relative to said first side and the P doping is supplied by boron angle implanted through said first side and said opposite side.

References Cited (Backward Citations)

US4519849A Cited
US4692270A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-09-09 1995-03-11 1995-09-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-09-09 1999-03-11 1999-09-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-09-09 2003-03-11 2003-09-10 $7700.00 Window Closed / Lapsed

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