US5041362A
Expired / Lapsed
US
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Dry developable resist etch chemistry
Assignee: Texas Instruments Inc
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Filing: 1989-07-06
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Granted: 1991-08-20
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Expires: 2009-07-06
Abstract
Abstract A photoresist layer (16) is selectively exposed to ultraviolet radiation (22). The exposed regions (23) are silylated with a silicon-liberating compound such as HMDS to create silylated regions (29). A plasma (32) is formed from a compound including at least one central atom and hydrogen. This plasma is used to differentially etch the non-protected regions (30) of the photoresist while forming a hard mask (42) from the silylated regions (29). Formation of filaments (38) on the developed photoresist sidewalls is avoided because of the low mass of the hydrogen ions and the volatility of any hydrides produced from materials sputtered from the substrate. Any filaments which are formed are easily cleaned up with conventional chemistry.
Inventors
- 👤 Monte A. Douglas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 18:21
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/26; G03F7/265; G03F7/36
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
157 words
A process for applying a pattern to a workpiece used un fabricating an integrated circuit, comprising the steps of: depositing an organic photoresist resolution layer on the workpiece; projecting a pattern image onto the resolution layer with a light source to which the resolution layer is sensitive to create at least one exposed portion of the resolution layer and at least one unexposed portion of the resolution layer; reacting the exposed portion of the resolution layer to a silylating agent to create a silylated region; forming a plasma which includes a hydrogen-liberating source and introducing said plasma into the reactor; and differentially etching the unexposed portion of the resolution layer with said hydrogen-liberating source in said plasma faster than the masked region until the surface of the workpiece is reached, said plasma including at least one inorganic atom for reacting with silicon form said silylated region to form a mask region of an etch resistant silicon compound.
Claim 2
Dependent Claim
157 words
A process for applying a pattern to a workpiece used un fabricating an integrated circuit, comprising the steps of: depositing an organic photoresist resolution layer on the workpiece; projecting a pattern image onto the resolution layer with a light source to which the resolution layer is sensitive to create at least one exposed portion of the resolution layer and at least one unexposed portion of the resolution layer; reacting the exposed portion of the resolution layer to a silylating agent to create a silylated region; forming a plasma which includes a hydrogen-liberating source and introducing said plasma into the reactor; and differentially etching the unexposed portion of the resolution layer with said hydrogen-liberating source in said plasma faster than the masked region until the surface of the workpiece is reached, said plasma including at least one inorganic atom for reacting with silicon form said silylated region to form a mask region of an etch resistant silicon compound.
Claim 3
Dependent Claim
25 words
The process of claim 1, wherein the step of depositing an organic photoresist resolution layer comprises the step of depositing a layer of Novolak-based photoresist.
Claim 4
Dependent Claim
25 words
The process of claim 1, wherein the step of exposing the resolution layer to the silylating agent comprises exposing the resolution layer to hexamethyldisilazane (HMDS).
Claim 5
Dependent Claim
13 words
The process of claim 1, wherein said hydrogen-liberating source is formed from ammonia.
Claim 6
Dependent Claim
13 words
The process of claim 1, wherein said hydrogen-liberating source is formed from hydrazine.
Claim 7
Dependent Claim
25 words
The process of claim 1, wherein the hydrogen-liberating source is selected from the group consisting of hydrides of carbon, boron, phosphorus, oxygen, nitrogen and sulfur.
Claim 8
Dependent Claim
30 words
The process of claim 1, and further comprising the step of: forming the plasma from a compound having at least one inorganic central atom and at least one hydrogen atom.
Claim 9
Dependent Claim
21 words
The process of claim 1, and further comprising the step of: separately introducing a source of inorganic atoms into the reactor.
Claim 10
Dependent Claim
22 words
The process of claim 8, wherein the hydrogen-liberating source consists essentially of hydrogen, the source of inorganic atoms consisting essentially of nitrogen.
Claim 11
Independent Claim
164 words
A method for patterning an integrated circuit workpiece surface, comprising the steps of: forming organic photoresist layers on the integrated circuit workpiece surface; selectively exposing the outer surface of said photoresist layer to a light source to which the photoresist layer is sensitive to create a pattern image on said outside surface of said photoresist layer comprising exposed portions and nonexposed portions; exposing said outside surface of said photoresist layer to hexamethyldisilazane to incorporate silicon into the exposed portions of said outside surface thereby forming silylated regions; forming a plasma from a source including hydrogen and at least one central atom; reacting the central atoms in the plasma with the silylated regions to create etch resistant portions containing compounds having silicon central atom bonds as said nonexposed portions are etched; and anisotropically etching the outside surface with hydrogen form the plasma, said unexposed portions of said outside surface and said etch resistant portion being etched at a rate ratio of about at least 3:1.
Claim 12
Independent Claim
164 words
A method for patterning an integrated circuit workpiece surface, comprising the steps of: forming organic photoresist layers on the integrated circuit workpiece surface; selectively exposing the outer surface of said photoresist layer to a light source to which the photoresist layer is sensitive to create a pattern image on said outside surface of said photoresist layer comprising exposed portions and nonexposed portions; exposing said outside surface of said photoresist layer to hexamethyldisilazane to incorporate silicon into the exposed portions of said outside surface thereby forming silylated regions; forming a plasma from a source including hydrogen and at least one central atom; reacting the central atoms in the plasma with the silylated regions to create etch resistant portions containing compounds having silicon central atom bonds as said nonexposed portions are etched; and anisotropically etching the outside surface with hydrogen form the plasma, said unexposed portions of said outside surface and said etch resistant portion being etched at a rate ratio of about at least 3:1.
Claim 13
Dependent Claim
15 words
The process of claim 10, wherein said source used to form said plasma is ammonia.
Claim 14
Dependent Claim
29 words
The process of claim 10, wherein said source used to form said plasma is selected from the group consisting of hydrides of boron, carbon, oxygen, phosphorus, sulfur and nitrogen.
Claim 15
Dependent Claim
113 words
In a process for fabricating an integrated circuit, a method for selectively etching a selectively exposed and silylated photoresist layer, comprising the steps of: forming an etchant plasma from a source selected from the group consisting of ammonia and hydrozene thereby forming a compound including hydrogen and at least one central atom; forming etch resistant mask from the silylated portions of the photoresist layer by reacting central atoms of the plasma with silicon atoms in the silylated portions; and differentially etching the etch resistant mask and unexposed, unsilylated portions of the photoresist surface with hydrogen from the plasma at a favorable etch rate ratio between the etch resistant mask and the unexposed portions.
Claim 16
Dependent Claim
113 words
In a process for fabricating an integrated circuit, a method for selectively etching a selectively exposed and silylated photoresist layer, comprising the steps of: forming an etchant plasma from a source selected from the group consisting of ammonia and hydrozene thereby forming a compound including hydrogen and at least one central atom; forming etch resistant mask from the silylated portions of the photoresist layer by reacting central atoms of the plasma with silicon atoms in the silylated portions; and differentially etching the etch resistant mask and unexposed, unsilylated portions of the photoresist surface with hydrogen from the plasma at a favorable etch rate ratio between the etch resistant mask and the unexposed portions.
Claim 17
Dependent Claim
14 words
The process of claim 13, wherein said compound forming the etchant plasma is ammonia.
Claim 18
Dependent Claim
93 words
A process for dry-developing a resist layer, comprising the steps of: forming a silylating region on preselected portions of an outer surface of the resist layer; forming a plasma from a source containing hydrogen and at least one central atom for reacting with silicon from said silylated regions to form at etch resistant mask during an etching step; and differentially etching portions of the resist layer not covered by the etch resistant mask with hydrogen species from the plasma such that said uncovered portions are etched away faster than the etch resistant mask.
Claim 19
Dependent Claim
93 words
A process for dry-developing a resist layer, comprising the steps of: forming a silylating region on preselected portions of an outer surface of the resist layer; forming a plasma from a source containing hydrogen and at least one central atom for reacting with silicon from said silylated regions to form at etch resistant mask during an etching step; and differentially etching portions of the resist layer not covered by the etch resistant mask with hydrogen species from the plasma such that said uncovered portions are etched away faster than the etch resistant mask.
Claim 20
Dependent Claim
37 words
The process of claim 15, wherein the hydrogen of said source is from a material selected from the group consisting of molecular hydrogen and a subgroup of compounds each having hydrogen and at least one central atom.
Claim 21
Dependent Claim
84 words
The process of claim 15, and further comprising the step of: selecting the resist layer to be a photoresist; selectively exposing portions of the photoresist to at least one light wavelength to which the photoresist is sensitive; reacting the exposed resist portions to a first inorganic compound; incorporating the atomic species into the exposed resist portions in response to said step of reacting to form said silylated regions; and forming the hard mask by bonding central atoms from the plasma to said atomic species.
Claim 22
Dependent Claim
35 words
The process of claim 17 wherein said first compound is selected from the group consisting of silicon-liberating compounds, semiconductor hydrides, semiconductor halides, metal hydrides, metal halides, metal carbonyls, organometallic compounds, boron halides and boron hydrides.
Claim 23
Dependent Claim
26 words
The process of claim 17, wherein said source is selected from the group consisting of the hydrides of boron, carbon, nitrogen, oxygen, phosphorus, sulphur and silicon.
Claim 24
Dependent Claim
33 words
The method of claim 10 wherein said step of forming a plasma includes the steps of: introducing a hydrogen-liberating source into the reactor; separately introducing a source of inorganic atoms into the reactor.
Claim 25
Dependent Claim
10 words
The method of claim 17, wherein said plasma includes ammonia.
Claim 26
Dependent Claim
10 words
The method of claim 17, wherein said plasma includes hydrozene.
Claim 27
Dependent Claim
155 words
A process for applying a pattern to a workpiece used in fabricating an integrated circuit, comprising the steps of: depositing an organic photoresist resolution layer on the workpiece; projecting a pattern image onto the resolution layer with a light source to which the resolution layer is sensitive to create at least one exposed portion of the resolution layer and at least one unexposed portion of the resolution layer; reacting the exposed portion of the resolution layer to a silylating agent to create a silylated region; introducing a hydrogen-liberating source into the reactor; separately introducing a source of inorganic atoms into the reactor; forming a plasma from the hydrogen-liberating source and the source of inorganic atoms; reacting said inorganic atoms with silicon form said silylated region to form a masked region; differentially etching the unexposed portion of resolution layer with said hydrogen-liberating source faster than the masked region until the surface of the workpiece is reached.
Claim 28
Dependent Claim
155 words
A process for applying a pattern to a workpiece used in fabricating an integrated circuit, comprising the steps of: depositing an organic photoresist resolution layer on the workpiece; projecting a pattern image onto the resolution layer with a light source to which the resolution layer is sensitive to create at least one exposed portion of the resolution layer and at least one unexposed portion of the resolution layer; reacting the exposed portion of the resolution layer to a silylating agent to create a silylated region; introducing a hydrogen-liberating source into the reactor; separately introducing a source of inorganic atoms into the reactor; forming a plasma from the hydrogen-liberating source and the source of inorganic atoms; reacting said inorganic atoms with silicon form said silylated region to form a masked region; differentially etching the unexposed portion of resolution layer with said hydrogen-liberating source faster than the masked region until the surface of the workpiece is reached.
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1994-08-19 | 1995-02-18 | 1995-08-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-08-19 | 1999-02-18 | 1999-08-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-08-19 | 2003-02-18 | 2003-08-20 | $7700.00 | Window Closed / Lapsed |