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US5041302A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming thin film by physical vapor deposition

Assignee: Chyunichi Sangyo Co Ltd
•
Filing: 1990-03-02
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Granted: 1991-08-20
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Expires: 2010-03-02
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Abstract

Abstract In method of forming a thin film by physical vapor deposition wherein a thin film material is evaporated in a vacuum thereby vapor particles deposit to a surface of a substrate and the thin film is formed, an electrode is arranged near the substrate with good conductivity and low voltage is applied between the substrate and the electrode thereby charges are induced on a growth step of the thin film being formed by the vapor particle group on the surface of the substrate, and the ionized vapor particles of the thin film material introduced in a space between the substrate and the electrode are continuously attracted and made adhere to the growth step inducing charges at low speed because of the low voltage so that the thin film is formed. Charges are induced on the growth step of the thin film by applying low voltage and the ionized vapor particles of the thin film material are subjected to the attraction of the growth step on the substrate, thereby the particles are directed to the growth step and collide with the substrate at low speed and continuously adhere to the growth step. Consequently, the thin film formed on the substrate becomes single crystal or the crystal state close to single crystal so that excellent semiconductor device or the like can be obtained.

Inventors

  • 👤 Hiroshi Koide

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 12:59
CPC Classifications
C; C30; C30B; C30B29/00; C30B29/02; C30B29/06; C23; C23C; C23C14/00; C23C14/22; C23C14/24; C23C14/32; C30B23/00; C30B23/02

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 127 words
A method for forming a thin film having the properties of a single crystal by physical vapor deposition wherein a thin film material is evaporated in a vacuum to form vapor particles which are deposited onto the surface of a substrate, comprising: arranging an electrode near the substrate, said substrate having good electrical conductivity; applying low voltage between the substrate and the electrode so as to induce charges on the surface of the substrate to form a thin film; whereby ionized vapor particles of the thin film material are introduced into a space between the substrate and the electrode, and said particles are continuously attracted and made to adhere to the surface of the substrate and thereby form a film having the properties of a single crystal.
Claim 2
Independent Claim 127 words
A method for forming a thin film having the properties of a single crystal by physical vapor deposition wherein a thin film material is evaporated in a vacuum to form vapor particles which are deposited onto the surface of a substrate, comprising: arranging an electrode near the substrate, said substrate having good electrical conductivity; applying low voltage between the substrate and the electrode so as to induce charges on the surface of the substrate to form a thin film; whereby ionized vapor particles of the thin film material are introduced into a space between the substrate and the electrode, and said particles are continuously attracted and made to adhere to the surface of the substrate and thereby form a film having the properties of a single crystal.
Claim 3
Dependent Claim 16 words
The method according to claim 1 wherein the low voltage is less than one thousand volts.
Claim 4
Dependent Claim 24 words
The method according to claim 1 wherein the voltage is in the range of from 55 V/cm 2 to about 60 V/cm 2 .
Claim 5
Dependent Claim 19 words
The method according to claim 1 wherein insulation material is heated whereby a substrate holding electric conductivity is formed.
Claim 6
Dependent Claim 21 words
The method according to claim 1 wherein insulation material is heated, whereby a thin film material holding electric conductivity is formed.
Claim 7
Dependent Claim 14 words
The method according to claim 1 wherein the thin film material is a metal.
Claim 8
Dependent Claim 14 words
The method according to claim 1 wherein the thin film material is a semiconductor.

References Cited (Backward Citations)

US4451501A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-08-19 1995-02-18 1995-08-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-08-19 1999-02-18 1999-08-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-08-19 2003-02-18 2003-08-20 $7700.00 Window Closed / Lapsed

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